{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,2]],"date-time":"2025-03-02T05:43:01Z","timestamp":1740894181302,"version":"3.38.0"},"reference-count":20,"publisher":"SAGE Publications","issue":"4","license":[{"start":{"date-parts":[[2019,11,7]],"date-time":"2019-11-07T00:00:00Z","timestamp":1573084800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"funder":[{"DOI":"10.13039\/100014132","name":"european metrology programme for innovation and research","doi-asserted-by":"publisher","award":["17IND06 Future Grid II project"],"award-info":[{"award-number":["17IND06 Future Grid II project"]}],"id":[{"id":"10.13039\/100014132","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["journals.sagepub.com"],"crossmark-restriction":true},"short-container-title":["Transactions of the Institute of Measurement and Control"],"published-print":{"date-parts":[[2020,2]]},"abstract":"<jats:p> In many engineering applications the phase angle of a signal is a key parameter. Especially when measuring small angles, the measurement accuracy is of a vital importance. Often, the absolute phase error of a digitizer, which is defined as the phase displacement between the digitized output and the input analog waveform and which represents a systematic measurement error, is neglected. Therefore, in this paper, a new measurement technique for the evaluation of this absolute phase error is discussed, along with a deep theoretical analysis on the uncertainty sources and how to handle them. The measurement technique is validated through a high accuracy experimental setup. Experimental tests demonstrate that even high accuracy digitizers can show non-linear behavior in the absolute phase errors. <\/jats:p>","DOI":"10.1177\/0142331219879836","type":"journal-article","created":{"date-parts":[[2019,11,7]],"date-time":"2019-11-07T09:31:24Z","timestamp":1573119084000},"page":"749-758","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":4,"title":["Uncertainty evaluation on the absolute phase error of digitizers"],"prefix":"10.1177","volume":"42","author":[{"given":"Antonio Delle","family":"Femine","sequence":"first","affiliation":[{"name":"Department of Engineering, University of Campania \u2018Luigi Vanvitelli\u2019, Italy"}]},{"given":"Daniele","family":"Gallo","sequence":"additional","affiliation":[{"name":"Department of Engineering, University of Campania \u2018Luigi Vanvitelli\u2019, Italy"}]},{"given":"Carmine","family":"Landi","sequence":"additional","affiliation":[{"name":"Department of Engineering, University of Campania \u2018Luigi Vanvitelli\u2019, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1311-9791","authenticated-orcid":false,"given":"Mario","family":"Luiso","sequence":"additional","affiliation":[{"name":"Department of Engineering, University of Campania \u2018Luigi Vanvitelli\u2019, Italy"}]}],"member":"179","published-online":{"date-parts":[[2019,11,7]]},"reference":[{"key":"bibr1-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2108553"},{"key":"bibr2-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540656"},{"key":"bibr3-0142331219879836","first-page":"1","volume-title":"2018 IEEE 9th International Workshop on Applied Measurements for Power Systems (AMPS)","author":"Collin AJ","year":"2018"},{"key":"bibr4-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2724299"},{"key":"bibr5-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1065\/5\/052033"},{"key":"bibr6-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/AMPS.2018.8494897"},{"key":"bibr7-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2888919"},{"key":"bibr8-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1065\/5\/052042"},{"key":"bibr9-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2004.843420"},{"key":"bibr10-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2653518"},{"key":"bibr11-0142331219879836","first-page":"1","volume-title":"IEEE 2016 Conference on Precision Electromagnetic Measurements (CPEM 2016)","author":"Houtzager E","year":"2016"},{"key":"bibr12-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2000.851024"},{"key":"bibr13-0142331219879836","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2852940"},{"key":"bibr14-0142331219879836","doi-asserted-by":"crossref","unstructured":"Mohns E, et al. 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