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Usually, the power converters are subjected to a high failure frequency rate and lead to a power system shut down. These faults, generally, start with thermal overstress, leading to IGBT wear-out over time. In the considered application, the power electronic converters are supplied by a generator. The unbalance IGBT degradation has been artificially created through high amplitude thermal overstress utilizing a DC at the gate. The proposed prognosis approach is based on the computation of the time-domain features to extract the degradation behavior of the IGBT device. Then, the Gaussian process regression technique is applied to the remaining useful life estimation. Prognostic results in three IGBT cases illustrate the effectiveness of the proposed prognostic approach, leading to an effective prognostic procedure for IGBT faults in power electronic converters.<\/jats:p>","DOI":"10.1177\/0142331220920470","type":"journal-article","created":{"date-parts":[[2020,6,4]],"date-time":"2020-06-04T10:44:09Z","timestamp":1591267449000},"page":"2507-2518","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":15,"title":["Remaining useful lifetime prediction of thermally aged power insulated gate bipolar transistor based on Gaussian process regression"],"prefix":"10.1177","volume":"42","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7462-8111","authenticated-orcid":false,"given":"Adla","family":"Ismail","sequence":"first","affiliation":[{"name":"ENSIT \u2013 Laboratory of Signal Image and Energy Mastery (SIME), Universit\u00e9 de Tunis, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3419-8583","authenticated-orcid":false,"given":"Lotfi","family":"Saidi","sequence":"additional","affiliation":[{"name":"ENSIT \u2013 Laboratory of Signal Image and Energy Mastery (SIME), Universit\u00e9 de Tunis, Tunisia"},{"name":"ESSTHS \u2013 Departement of Electronics and Computer Engineering, University of Sousse, Tunisia"},{"name":"University of Brest, UMR CNRS 6027 IRDL, Brest, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mounir","family":"Sayadi","sequence":"additional","affiliation":[{"name":"ENSIT \u2013 Laboratory of Signal Image and Energy Mastery (SIME), Universit\u00e9 de Tunis, Tunisia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed","family":"Benbouzid","sequence":"additional","affiliation":[{"name":"ENSIT \u2013 Laboratory of Signal Image and Energy Mastery (SIME), Universit\u00e9 de Tunis, Tunisia"},{"name":"Shanghai Maritime University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[2020,6,4]]},"reference":[{"key":"bibr1-0142331220920470","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2753722"},{"key":"bibr2-0142331220920470","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2009.06.031"},{"key":"bibr3-0142331220920470","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2275978"},{"key":"bibr4-0142331220920470","first-page":"1","volume-title":"Annual Conference of the Prognostics and Health Management Society","author":"Celaya J","year":"2011"},{"key":"bibr5-0142331220920470","unstructured":"Celaya J, Wysocki P, Goebel K (2009) IGBT Accelerated Aging Data Set, NASA Ames Prognostics Data Repository. 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