{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T16:05:02Z","timestamp":1777910702477,"version":"3.51.4"},"reference-count":31,"publisher":"SAGE Publications","issue":"16","license":[{"start":{"date-parts":[[2021,9,3]],"date-time":"2021-09-03T00:00:00Z","timestamp":1630627200000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51837011"],"award-info":[{"award-number":["51837011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61903127"],"award-info":[{"award-number":["61903127"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2020M673664"],"award-info":[{"award-number":["2020M673664"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017664","name":"henan province foundation for university key teacher","doi-asserted-by":"publisher","award":["2020GGJS061"],"award-info":[{"award-number":["2020GGJS061"]}],"id":[{"id":"10.13039\/501100017664","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific and Technological Innovation Program for Universities in Henan Province of China","award":["21HASTIT018"],"award-info":[{"award-number":["21HASTIT018"]}]}],"content-domain":{"domain":["journals.sagepub.com"],"crossmark-restriction":true},"short-container-title":["Transactions of the Institute of Measurement and Control"],"published-print":{"date-parts":[[2021,12]]},"abstract":"<jats:p>Electrical impedance tomography (EIT) is a potential and promising tomographic technique. Based on a reconstruction strategy, conductivity distribution can be imaged by processing boundary measurements. It should be noticed that the process of image reconstruction involves the solution of a nonlinear ill-posed inverse problem. To tackle this problem, a novel two-stage image reconstruction strategy is proposed in this work. It combines the advantages of total generalized variation regularization method and tight wavelet approach. The solution of the proposed method is acquired by employing alternating minimization algorithm and spilt Bregman algorithm. In the numerical simulation, reconstruction of five models is studied. Aside from the visual observation, we have also validated the proposed method with quantitative comparison. Meanwhile, the impact of noise on the reconstruction is considered. Furthermore, the proposed method is evaluated by phantom experimental data. The simulation and experimental results have demonstrated the superior performance of the proposed method in visualizing conductivity distribution.<\/jats:p>","DOI":"10.1177\/01423312211043045","type":"journal-article","created":{"date-parts":[[2021,9,3]],"date-time":"2021-09-03T03:09:16Z","timestamp":1630638556000},"page":"3625-3632","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":2,"title":["A two-stage image reconstruction strategy for electrical impedance tomography"],"prefix":"10.1177","volume":"43","author":[{"given":"Yanyan","family":"Shi","sequence":"first","affiliation":[{"name":"School of Biomedical Engineering, Fourth Military Medical University, China"},{"name":"Henan Key Laboratory of Optoelectronic Sensing Integrated Application, College of Electronic and Electrical Engineering, Henan Normal University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaolong","family":"Kong","sequence":"additional","affiliation":[{"name":"Henan Key Laboratory of Optoelectronic Sensing Integrated Application, College of Electronic and Electrical Engineering, Henan Normal University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4230-1365","authenticated-orcid":false,"given":"Meng","family":"Wang","sequence":"additional","affiliation":[{"name":"Henan Key Laboratory of Optoelectronic Sensing Integrated Application, College of Electronic and Electrical Engineering, Henan Normal University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Feng","family":"Fu","sequence":"additional","affiliation":[{"name":"School of Biomedical Engineering, Fourth Military Medical University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yajun","family":"Lou","sequence":"additional","affiliation":[{"name":"Henan Key Laboratory of Optoelectronic Sensing Integrated Application, College of Electronic and Electrical Engineering, Henan Normal University, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[2021,9,3]]},"reference":[{"key":"bibr1-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/42.491418"},{"key":"bibr2-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5267"},{"key":"bibr3-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1016\/j.camwa.2017.05.004"},{"key":"bibr4-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2828303"},{"key":"bibr5-01423312211043045","author":"Hauptmann A","year":"2017","journal-title":"arXiv:"},{"key":"bibr6-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1007\/s00211-017-0920-8"},{"key":"bibr7-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/20\/1\/015503"},{"key":"bibr8-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2762741"},{"key":"bibr9-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1177\/0142331219845037"},{"key":"bibr10-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2928022"},{"key":"bibr11-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1002\/ima.22122"},{"key":"bibr12-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2965202"},{"key":"bibr13-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2816739"},{"issue":"3","key":"bibr14-01423312211043045","first-page":"402","volume":"14","author":"Ma G","year":"2020","journal-title":"IEEE Transactions on Biomedical Circuits and Systems"},{"key":"bibr15-01423312211043045","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2020017"},{"key":"bibr16-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1016\/j.bspc.2019.101706"},{"key":"bibr17-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2545301"},{"key":"bibr18-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107326"},{"key":"bibr19-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2900031"},{"key":"bibr20-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2954722"},{"issue":"6","key":"bibr21-01423312211043045","first-page":"1","volume":"55","author":"Sebastien M","year":"2019","journal-title":"IEEE Transactions on Magnetics"},{"key":"bibr22-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2938640"},{"issue":"21","key":"bibr23-01423312211043045","doi-asserted-by":"crossref","first-page":"9850","DOI":"10.1109\/JSEN.2019.2926232","volume":"19","author":"Shi YY","year":"2019","journal-title":"IEEE Sensors Journal"},{"key":"bibr24-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2017.2778288"},{"key":"bibr25-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/25\/12\/123011"},{"key":"bibr26-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/42.700740"},{"key":"bibr27-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1177\/0142331218812563"},{"key":"bibr28-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aae8ff"},{"key":"bibr29-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2017.2719122"},{"key":"bibr30-01423312211043045","doi-asserted-by":"publisher","DOI":"10.18494\/SAM.2020.2952"},{"key":"bibr31-01423312211043045","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2018.2890410"}],"container-title":["Transactions of the Institute of Measurement and Control"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/01423312211043045","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/full-xml\/10.1177\/01423312211043045","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/01423312211043045","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T15:04:07Z","timestamp":1777647847000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/01423312211043045"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,3]]},"references-count":31,"journal-issue":{"issue":"16","published-print":{"date-parts":[[2021,12]]}},"alternative-id":["10.1177\/01423312211043045"],"URL":"https:\/\/doi.org\/10.1177\/01423312211043045","relation":{},"ISSN":["0142-3312","1477-0369"],"issn-type":[{"value":"0142-3312","type":"print"},{"value":"1477-0369","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,9,3]]}}}