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First, to compensate for the system uncertainties, neural network (NN) is employed to approximate the unknown nonlinear dynamic function. Subsequently, to address the challenges of disturbance compensation and unmeasured joint angular velocity, a nonlinear NN-based extended state observer (NN-based ESO) is introduced. The NN-based ESO facilitates accurate disturbance estimation and compensation, while also enabling simultaneous estimation of the joint angular velocity. Through the integration of these techniques, the closed-loop system\u2019s stability is proven using the direct Lyapunov method, demonstrating remarkable tracking performance within finite time. Simulation results validate the effectiveness of the NFTSMC with the NN-based ESO, showcasing superior performance compared to alternative control strategies.<\/jats:p>","DOI":"10.1177\/01423312241297389","type":"journal-article","created":{"date-parts":[[2024,12,13]],"date-time":"2024-12-13T05:16:49Z","timestamp":1734067009000},"page":"690-700","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":1,"title":["Adaptive robust non-singular fast terminal sliding mode control for a two-link robotic manipulator with NN-based ESO"],"prefix":"10.1177","volume":"48","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-3550-3528","authenticated-orcid":false,"given":"Lei","family":"Zhou","sequence":"first","affiliation":[{"name":"School of Electronic and Information Engineering, University of Science and Technology Liaoning, China"}]},{"given":"Dong","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Electronic and Information Engineering, University of Science and Technology Liaoning, China"}]},{"given":"Weitian","family":"He","sequence":"additional","affiliation":[{"name":"School of Control Science and Engineering, Shandong University, China"}]}],"member":"179","published-online":{"date-parts":[[2024,12,13]]},"reference":[{"key":"e_1_3_2_2_1","doi-asserted-by":"publisher","DOI":"10.1177\/01423312231184513"},{"key":"e_1_3_2_3_1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3215985"},{"key":"e_1_3_2_4_1","doi-asserted-by":"publisher","DOI":"10.1177\/01423312241242845"},{"key":"e_1_3_2_5_1","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2015.2489500"},{"key":"e_1_3_2_6_1","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3260874"},{"key":"e_1_3_2_7_1","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2019.2931810"},{"key":"e_1_3_2_8_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2010.2050484"},{"key":"e_1_3_2_9_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechatronics.2021.102671"},{"key":"e_1_3_2_10_1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2954550"},{"key":"e_1_3_2_11_1","doi-asserted-by":"publisher","DOI":"10.1177\/0142331220983637"},{"key":"e_1_3_2_12_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2020.2975232"},{"key":"e_1_3_2_13_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2022.3164739"},{"key":"e_1_3_2_14_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3075697"},{"key":"e_1_3_2_15_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2020.04.038"},{"key":"e_1_3_2_16_1","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2015.2453138"},{"key":"e_1_3_2_17_1","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2006.875993"},{"key":"e_1_3_2_18_1","doi-asserted-by":"publisher","DOI":"10.1177\/01423312221093152"},{"key":"e_1_3_2_19_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3034712"},{"key":"e_1_3_2_20_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3071261"},{"key":"e_1_3_2_21_1","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3003550"},{"key":"e_1_3_2_22_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3166597"},{"key":"e_1_3_2_23_1","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.2990442"},{"key":"e_1_3_2_24_1","doi-asserted-by":"publisher","DOI":"10.1109\/SAFEPROCESS58597.2023.10295853"},{"key":"e_1_3_2_25_1","doi-asserted-by":"publisher","DOI":"10.1177\/0142331219832954"},{"key":"e_1_3_2_26_1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2997383"},{"key":"e_1_3_2_27_1","doi-asserted-by":"publisher","DOI":"10.1109\/ICISCE.2015.139"},{"key":"e_1_3_2_28_1","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-024-09305-4"},{"key":"e_1_3_2_29_1","first-page":"1","volume-title":"2021 IEEE 30th international symposium on industrial electronics (ISIE)","author":"Sun Y","year":"2024","unstructured":"Sun Y, Sun G, Zhong X, et al. 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