{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T19:26:14Z","timestamp":1777490774740,"version":"3.51.4"},"reference-count":28,"publisher":"SAGE Publications","issue":"2","license":[{"start":{"date-parts":[[2005,6,1]],"date-time":"2005-06-01T00:00:00Z","timestamp":1117584000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Concurrent Engineering"],"published-print":{"date-parts":[[2005,6]]},"abstract":"<jats:p>Many companies report that they can attain a competitive product development advantage from strategic relationships with key suppliers, but even the successful relationships are not without their challenges. Industry has expressed a need for robust concurrent product development (CPD) practices to include supplier issues. Unfortunately, most of the practices currently available provide little to quantitatively analyze the product development process and to identify risk as a direct result of supplier interactions. This study develops metrics that characterize product development project risk that results from supplier interactions by using the concepts of degree of design customization (DoDC) and coupling ratio (CR). A correlation analysis based on HP LaserJet development projects demonstrates that the proposed metrics for DoDC and CR are good indicators of the likelihood of product development efficiency. Furthermore, there was enough evidence to use the interaction term, the CR multiplied by the DoDC, as a risk index. An important implication of using the coupling assessment as part of the project risk assessment is that the same process can address both project and product risks.<\/jats:p>","DOI":"10.1177\/1063293x05053792","type":"journal-article","created":{"date-parts":[[2005,5,18]],"date-time":"2005-05-18T10:49:30Z","timestamp":1116413370000},"page":"85-94","source":"Crossref","is-referenced-by-count":6,"title":["The Development of Project Risk Metrics for Robust Concurrent Product                 Development (CPD) across the Supply Chain"],"prefix":"10.1177","volume":"13","author":[{"suffix":"Jr.","given":"Marcos","family":"Esterman","sequence":"first","affiliation":[{"name":"Industrial and Systems Engineering, Kate Gleason College of Engineering,\r                        81 Lomb Memorial Drive, Rochester, NY 14623-5603, USA,"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kosuke","family":"Ishii","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, Stanford University, Stanford, CA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"179","published-online":{"date-parts":[[2005,6,1]]},"reference":[{"key":"atypb1","volume-title":"DETC \u201999: ASME Design Engineering Technical Conferences","author":"Esterman, M."},{"key":"atypb2","volume-title":"DETC \u201901: ASME 2001 Design Engineering Technical Conferences and Computers and Information in Engineering Conference","author":"Esterman, M."},{"key":"atypb3","volume-title":"Product Design and Development","author":"Ulrich, K.T.","year":"1995"},{"key":"atypb4","unstructured":"CII\n                 (1989). Management of Project Risks and Uncertainties, \n                    Construction Industry Institute Cost\/Schedule Controls Task\n                    Force: Austin, TX\n                , p. 37."},{"key":"atypb5","unstructured":"Kmenta, S. (2000). Project FMEA, Personal Communication."},{"key":"atypb6","volume-title":"Proceedings of the 1999 ASME Design Engineering Technical Conferences","author":"Kmenta, S."},{"key":"atypb7","volume-title":"Construction Project Management","author":"Gould, F.E.","year":"2000"},{"key":"atypb8","first-page":"31","volume":"42","author":"Tenah, K.A.","year":"2000","journal-title":"Cost Engineering"},{"key":"atypb9","first-page":"30","volume":"43","author":"Tenah, K.A.","year":"2001","journal-title":"Cost Engineering"},{"key":"atypb10","volume-title":"Annual Quality Congress Transactions","author":"Gould, R.A."},{"key":"atypb11","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-9364(1995)121:2(230)"},{"key":"atypb12","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-9364(1997)123:1(34)"},{"issue":"7","key":"atypb13","first-page":"24","volume":"43","author":"Dey, P.K.","year":"2001","journal-title":"Cost Engineering"},{"key":"atypb14","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0733-9364(1999)125:3(161)"},{"key":"atypb15","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0742-597X(1999)15:2(54)"},{"key":"atypb16","volume-title":"American Society of Mechanical Engineers, Design Engineering Division (Publication) DE","author":"Krishnan, V.","year":"1993"},{"key":"atypb17","volume-title":"ASME Design Engineering Technical Conferences","author":"Martin, M.V."},{"key":"atypb18","volume-title":"2000 ASME Design Engineering Technical Conferences","author":"Martin, M.V."},{"key":"atypb19","volume-title":"American Society of Mechanical Engineers, Design Engineering Division (Publication) DE","author":"Nukala, M.V.","year":"1995"},{"key":"atypb20","volume-title":"American Society of Mechanical Engineers, Design Engineering Division (Publication) DE","author":"Smith, R.P.","year":"1992"},{"key":"atypb21","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.43.3.276"},{"key":"atypb22","volume-title":"Proceedings of DETC \u201999: 1999 ASME Design Engineering Technical Conferences","author":"Mori, T."},{"key":"atypb23","volume-title":"Concurrent Engineering Fundamentals","author":"Prasad, B.","year":"1996"},{"key":"atypb24","volume-title":"Mechanical Engineering","author":"Hinckley, C.M.","year":"1993"},{"key":"atypb25","volume-title":"Mechanical Engineering","author":"Kmenta, S.","year":"2000"},{"key":"atypb26","volume-title":"Mechanical Engineering","author":"Sarbacker, S.D.","year":"1998"},{"key":"atypb27","doi-asserted-by":"publisher","DOI":"10.1016\/0923-4748(93)90059-R"},{"key":"atypb28","doi-asserted-by":"publisher","DOI":"10.1016\/0048-7333(94)00775-3"}],"container-title":["Concurrent Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/1063293X05053792","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/1063293X05053792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,28]],"date-time":"2026-04-28T14:47:58Z","timestamp":1777387678000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1177\/1063293X05053792"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2005,6]]},"references-count":28,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2005,6]]}},"alternative-id":["10.1177\/1063293X05053792"],"URL":"https:\/\/doi.org\/10.1177\/1063293x05053792","relation":{},"ISSN":["1063-293X","1531-2003"],"issn-type":[{"value":"1063-293X","type":"print"},{"value":"1531-2003","type":"electronic"}],"subject":[],"published":{"date-parts":[[2005,6]]}}}