{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,7]],"date-time":"2025-11-07T09:26:04Z","timestamp":1762507564107,"version":"3.40.5"},"reference-count":32,"publisher":"SAGE Publications","issue":"11","license":[{"start":{"date-parts":[[2018,11,1]],"date-time":"2018-11-01T00:00:00Z","timestamp":1541030400000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573041"],"award-info":[{"award-number":["61573041"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573043"],"award-info":[{"award-number":["61573043"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["71671009"],"award-info":[{"award-number":["71671009"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["journals.sagepub.com"],"crossmark-restriction":true},"short-container-title":["International Journal of Distributed Sensor Networks"],"published-print":{"date-parts":[[2018,11]]},"abstract":"<jats:p> With the widespread application of wireless multimedia sensor networks, the issue of network reliability has attracted more and more attention. In this article, a new reliability evaluation method of wireless multimedia sensor network is proposed. The failure is regarded as a percolation process, and the percolation threshold is taken as the failure indicator in this method. Accordingly, instantaneous availability model of wireless multimedia sensor network is established combining percolation theory and Markov process on the basis of reliability characteristics analysis. By Laplace transformation, the analytic solution is worked out, and one numerical example is given to verify the model comparing with existing studies. Finally, numerical simulation analyses are used to show the impact of different parameters on instantaneous availability, and the ways to suppress fluctuations are obtained by comparing with fluctuation images. <\/jats:p>","DOI":"10.1177\/1550147718810692","type":"journal-article","created":{"date-parts":[[2018,11,3]],"date-time":"2018-11-03T10:13:56Z","timestamp":1541240036000},"page":"155014771881069","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":12,"title":["Reliability evaluation of wireless multimedia sensor networks based on instantaneous availability"],"prefix":"10.1177","volume":"14","author":[{"given":"Yi","family":"Yang","sequence":"first","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, P.R. China"},{"name":"Department of Electrical and Computer Engineering, The University of British Columbia, Vancouver, BC, Canada"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1229-7123","authenticated-orcid":false,"given":"Sixin","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, P.R. China"}]},{"given":"Wei","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, P.R. China"}]},{"given":"Kunlun","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University, Beijing, P.R. China"}]}],"member":"179","published-online":{"date-parts":[[2018,11,3]]},"reference":[{"key":"bibr1-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2758798"},{"key":"bibr2-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2016.2576026"},{"key":"bibr3-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/395752."},{"key":"bibr4-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/MWC.2016.1400052WC"},{"key":"bibr5-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2769086"},{"key":"bibr6-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2017.07.016"},{"key":"bibr7-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2011.2158001"},{"key":"bibr8-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1007\/s00530-015-0476-3"},{"key":"bibr9-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/MNET.2016.7474341"},{"key":"bibr10-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2018.1700632"},{"key":"bibr11-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1209\/0295-5075\/116\/50001"},{"key":"bibr12-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.05.021"},{"key":"bibr13-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1142\/S0129183118500043"},{"key":"bibr14-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2012.09.012"},{"key":"bibr15-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.08.004"},{"issue":"12","key":"bibr16-1550147718810692","first-page":"2651","volume":"35","author":"Huang N","year":"2013","journal-title":"Syst Eng Electr"},{"key":"bibr17-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1088\/1367-2630\/17\/6\/063025"},{"key":"bibr18-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-015-1994-2"},{"key":"bibr19-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2016.02.003"},{"key":"bibr20-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1097\/00004770-200404000-00011"},{"key":"bibr21-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2806386"},{"key":"bibr22-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1139\/tcsme-2016-0057"},{"key":"bibr23-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/S0032-3861(03)00539-1"},{"key":"bibr24-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1038\/nature08932"},{"key":"bibr25-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1209\/epl\/i2002-00601-y"},{"key":"bibr26-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1007\/s10955-014-1125-5"},{"issue":"1","key":"bibr27-1550147718810692","first-page":"205","volume":"258","author":"Wang M","journal-title":"Discret Mathemat"},{"key":"bibr28-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2013.02.066"},{"key":"bibr29-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.1419185112"},{"key":"bibr30-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1142\/S0129183116500820"},{"key":"bibr31-1550147718810692","unstructured":"Cao J, Cheng K. Introduction to reliability mathematics. Beijing, China: Higher Education Press, 2006, pp.182\u2013244."},{"key":"bibr32-1550147718810692","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2016.11.096"}],"container-title":["International Journal of Distributed Sensor Networks"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/1550147718810692","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/journals.sagepub.com\/doi\/full-xml\/10.1177\/1550147718810692","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/journals.sagepub.com\/doi\/pdf\/10.1177\/1550147718810692","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,12,7]],"date-time":"2020-12-07T04:28:45Z","timestamp":1607315325000},"score":1,"resource":{"primary":{"URL":"http:\/\/journals.sagepub.com\/doi\/10.1177\/1550147718810692"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,11]]},"references-count":32,"journal-issue":{"issue":"11","published-print":{"date-parts":[[2018,11]]}},"alternative-id":["10.1177\/1550147718810692"],"URL":"https:\/\/doi.org\/10.1177\/1550147718810692","relation":{},"ISSN":["1550-1477","1550-1477"],"issn-type":[{"type":"print","value":"1550-1477"},{"type":"electronic","value":"1550-1477"}],"subject":[],"published":{"date-parts":[[2018,11]]}}}