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The proposed approach is identified as two procedures. First, the weight is determined based on the distance of evidence. Then, the obtained weight value in the first step is modified by making advantage of Deng entropy function. Our proposed method can efficiently cope with high conflicting evidences with better performance of convergence. A numerical example is provided to demonstrate that the proposed method is reasonable and efficient in the end.<\/jats:p>","DOI":"10.1177\/155014773218784","type":"journal-article","created":{"date-parts":[[2016,7,26]],"date-time":"2016-07-26T02:03:38Z","timestamp":1469498618000},"page":"3218784","update-policy":"https:\/\/doi.org\/10.1177\/sage-journals-update-policy","source":"Crossref","is-referenced-by-count":48,"title":["Weighted Evidence Combination Based on Distance of Evidence and Entropy Function"],"prefix":"10.1177","volume":"12","author":[{"given":"Jianwei","family":"Wang","sequence":"first","affiliation":[{"name":"School of Computer and Information Science, Southwest University, Chongqing 400715, China"},{"name":"School of HanHong, Southwest University, Chongqing 400715, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Fuyuan","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Computer and Information Science, Southwest University, Chongqing 400715, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinyang","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Computer and Information Science, Southwest University, Chongqing 400715, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Liguo","family":"Fei","sequence":"additional","affiliation":[{"name":"School of Computer and Information Science, Southwest University, Chongqing 400715, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yong","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Computer and Information Science, Southwest University, Chongqing 400715, China"},{"name":"Institute of Integrated Automation, School of Electronic and Information Engineering, Xi'an Jiaotong University, Xian, Shaanxi 710049, China"},{"name":"Big Data Decision Institute, Jinan University, Guangzhou, Guangdong 510632, China"},{"name":"School of Engineering, Vanderbilt University, Nashville, TN 37235, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"179","published-online":{"date-parts":[[2016,7,25]]},"reference":[{"key":"B1-155014773218784","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177698950"},{"key":"B2-155014773218784","doi-asserted-by":"publisher","DOI":"10.1515\/9780691214696"},{"key":"B3-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/0020-0255(87)90007-7"},{"key":"B4-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/s0305-0483(99)00033-x"},{"key":"B5-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2012.08.002"},{"key":"B6-155014773218784","doi-asserted-by":"publisher","DOI":"10.15837\/ijccc.2015.3.1656"},{"key":"B7-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2015.11.011"},{"key":"B8-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2013.07.018"},{"key":"B9-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.01.031"},{"key":"B10-155014773218784","doi-asserted-by":"publisher","DOI":"10.1177\/1687814016644579"},{"key":"B11-155014773218784","doi-asserted-by":"publisher","DOI":"10.1111\/risa.12347"},{"issue":"3","key":"B12-155014773218784","first-page":"227","volume":"11","author":"Deng Y.","year":"2015","journal-title":"International Journal of Unconventional Computing"},{"key":"B13-155014773218784","doi-asserted-by":"publisher","DOI":"10.1155\/2015\/212794"},{"key":"B14-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2015.06.062"},{"issue":"4","key":"B15-155014773218784","doi-asserted-by":"crossref","first-page":"753","DOI":"10.23919\/CJE.2014.10851927","volume":"23","author":"Xu X.","year":"2014","journal-title":"Chinese Journal of Electronics"},{"key":"B16-155014773218784","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipl.2015.07.015"},{"key":"B17-155014773218784","doi-asserted-by":"publisher","DOI":"10.1155\/2013\/972641"},{"key":"B18-155014773218784","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/931235"},{"issue":"2","key":"B19-155014773218784","volume":"7","author":"Zadeh L. 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