{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,18]],"date-time":"2025-10-18T14:55:24Z","timestamp":1760799324115,"version":"3.38.0"},"reference-count":16,"publisher":"SAGE Publications","issue":"1","license":[{"start":{"date-parts":[[2008,1,1]],"date-time":"2008-01-01T00:00:00Z","timestamp":1199145600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/journals.sagepub.com\/page\/policies\/text-and-data-mining-license"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Surface Engineering"],"published-print":{"date-parts":[[2008,1]]},"abstract":"<jats:p> The adhesion of Yarrowia lipolytic a to teflonlike thin films deposited by plasma on polycarbonate substrates was investigated through a series of tests in order to develop a substrate for strong and selective adhesion of Yarrowia lipolytica cells. Teflonlike thin films were prepared using atmospheric pressure surface barrier discharge with mixtures of octafluorocyclobutane (C<jats:sub>4<\/jats:sub>F<jats:sub>8<\/jats:sub>) and nitrogen as plasma gas. A variety of plasma gas feedrates and different deposition times were studied. The films were characterised by Fourier transform infrared and contact angle measurements using the sessile drop technique. Total surface energy and its components were calculated using the acid base theory. Attachment of the yeast cells was assessed by optical and scanning electron microscopy. The optimal deposition conditions for cell adhesion were determined using standard adhesion tests. <\/jats:p>","DOI":"10.1179\/174329408x271444","type":"journal-article","created":{"date-parts":[[2008,3,29]],"date-time":"2008-03-29T22:22:00Z","timestamp":1206829320000},"page":"23-27","source":"Crossref","is-referenced-by-count":17,"title":["Deposition of <i>Yarrowia lipolytica<\/i> on plasma prepared teflonlike thin films"],"prefix":"10.1177","volume":"24","author":[{"given":"M.","family":"Lehock\u00fd","sequence":"first","affiliation":[{"name":"CICECO, Department of Chemistry, University of Aveiro, Campus Santiago, P 3810193, Portugal"},{"name":"Tomas Bata University in Zl\u00edn, Zl\u00edn, 760 01, Czech Republic"}]},{"given":"P. F. F.","family":"Amaral","sequence":"additional","affiliation":[{"name":"CICECO, Department of Chemistry, University of Aveiro, Campus Santiago, P 3810193, Portugal"},{"name":"Biochemical Engineering Department, Federal University of Rio de Janeiro\/School of Chemistry (UFRJ\/EQ), Cidade Universit\u00e1ria, P 21949590 Rio de Janeiro, Brazil"}]},{"given":"P.","family":"S\u0165ahel","sequence":"additional","affiliation":[{"name":"Department of Physical Electronic, Faculty of Science, Masaryk University, Kotl\u00e1\u0159sk\u00e1 2, Brno, CZ 61137, Czech Republic"}]},{"given":"M. A. Z.","family":"Coelho","sequence":"additional","affiliation":[{"name":"Biochemical Engineering Department, Federal University of Rio de Janeiro\/School of Chemistry (UFRJ\/EQ), Cidade Universit\u00e1ria, P 21949590 Rio de Janeiro, Brazil"}]},{"given":"A. M.","family":"Barros-Timmons","sequence":"additional","affiliation":[{"name":"CICECO, Department of Chemistry, University of Aveiro, Campus Santiago, P 3810193, Portugal"}]},{"given":"J. A. P.","family":"Coutinho","sequence":"additional","affiliation":[{"name":"CICECO, Department of Chemistry, University of Aveiro, Campus Santiago, P 3810193, Portugal"}]}],"member":"179","published-online":{"date-parts":[[2008,1,1]]},"reference":[{"key":"bibr1-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/0963-9969(96)00015-4"},{"key":"bibr2-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/S0927-7757(03)00242-5"},{"key":"bibr3-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1002\/jctb.1677"},{"key":"bibr4-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/j.jbiotec.2004.09.014"},{"key":"bibr5-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/j.biortech.2004.04.009"},{"key":"bibr6-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/j.resmic.2004.04.006"},{"key":"bibr7-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/S0927-7765(02)00005-X"},{"key":"bibr8-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1007\/s002530000348"},{"key":"bibr9-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1002\/yea.1405"},{"key":"bibr10-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-577X(97)00074-8"},{"key":"bibr11-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2006.12.085"},{"key":"bibr12-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcis.2004.12.036"},{"key":"bibr13-174329408X271444","unstructured":"Good R. J.: in \u2018Contact angle, wettability and adhesion\u2019, (ed. Mittal K. L.), 3\u201336; 1993, Utrecht, VSP."},{"volume-title":"\u2018Surface energy evaluation of plasma treated materials by contact angle measurement\u2019","year":"2004","author":"Burgikov\u00e1 V.","key":"bibr14-174329408X271444"},{"key":"bibr15-174329408X271444","doi-asserted-by":"publisher","DOI":"10.1128\/aem.42.2.375-377.1981"},{"key":"bibr16-174329408X271444","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/MSF.426-432.2533"}],"container-title":["Surface Engineering"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1179\/174329408X271444","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/journals.sagepub.com\/doi\/pdf\/10.1179\/174329408X271444","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,3,11]],"date-time":"2025-03-11T05:25:20Z","timestamp":1741670720000},"score":1,"resource":{"primary":{"URL":"https:\/\/journals.sagepub.com\/doi\/10.1179\/174329408X271444"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,1]]},"references-count":16,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2008,1]]}},"alternative-id":["10.1179\/174329408X271444"],"URL":"https:\/\/doi.org\/10.1179\/174329408x271444","relation":{},"ISSN":["0267-0844","1743-2944"],"issn-type":[{"type":"print","value":"0267-0844"},{"type":"electronic","value":"1743-2944"}],"subject":[],"published":{"date-parts":[[2008,1]]}}}