{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,29]],"date-time":"2022-03-29T10:38:08Z","timestamp":1648550288328},"reference-count":51,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2012,5,10]],"date-time":"2012-05-10T00:00:00Z","timestamp":1336608000000},"content-version":"unspecified","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/2.0"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["J Image Video Proc"],"published-print":{"date-parts":[[2012,12]]},"DOI":"10.1186\/1687-5281-2012-8","type":"journal-article","created":{"date-parts":[[2012,5,10]],"date-time":"2012-05-10T10:30:13Z","timestamp":1336645813000},"source":"Crossref","is-referenced-by-count":3,"title":["A framework for measuring sharpness in natural images captured by digital cameras based on reference image and local areas"],"prefix":"10.1186","volume":"2012","author":[{"given":"Mikko","family":"Nuutinen","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Olli","family":"Orenius","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Timo","family":"S\u00e4\u00e4m\u00e4nen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pirkko","family":"Oittinen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2012,5,10]]},"reference":[{"issue":"11","key":"31_CR1","doi-asserted-by":"publisher","first-page":"3441","DOI":"10.1109\/TIP.2006.881959","volume":"15","author":"HR Sheikh","year":"2006","unstructured":"Sheikh HR, Sabir M, Bovik AC: A statistical evaluation of recent full reference image quality assessment algorithms. IEEE Trans Image Process 2006, 15(11):3441-3452.","journal-title":"IEEE Trans Image Process"},{"key":"31_CR2","volume-title":"Proceedings of International Broadcasting Conference","author":"J Lubin","year":"1997","unstructured":"Lubin J: A human vision system model for objective picture quality measurements. In Proceedings of International Broadcasting Conference. Amsterdam, Netherlands; 1997."},{"issue":"4","key":"31_CR3","doi-asserted-by":"publisher","first-page":"600","DOI":"10.1109\/TIP.2003.819861","volume":"13","author":"Z Wang","year":"2004","unstructured":"Wang Z, Bovik AC, Sheikh HR, Simoncelli EP: Image quality assessment: from error visibility to structural similarity. IEEE Trans Image Process 2004, 13(4):600-612. 10.1109\/TIP.2003.819861","journal-title":"IEEE Trans Image Process"},{"issue":"12","key":"31_CR4","doi-asserted-by":"publisher","first-page":"2117","DOI":"10.1109\/TIP.2005.859389","volume":"14","author":"HR Sheikh","year":"2005","unstructured":"Sheikh HR, Bovik AC, Veciana G: An information fidelity criterion for image quality assessment using natural scene statistics. IEEE Trans Image Process 2005, 14(12):2117-2128.","journal-title":"IEEE Trans Image Process"},{"key":"31_CR5","first-page":"377","volume-title":"Proceedings of IEEE International Conference on Image Processing","author":"C-L Yang","year":"2008","unstructured":"Yang C-L, Gao W-R, Po L-M: Discrete wavelet transform-based structural similarity for image quality assessment. In Proceedings of IEEE International Conference on Image Processing. San Diego, CA, USA, 12-15 October 2008; 2008:377-380."},{"key":"31_CR6","first-page":"6840","volume-title":"Proceedings of World Congress on Intelligent Control and Automation","author":"WY Yang","year":"2008","unstructured":"Yang WY, Wu L, Fan Y, Wang Z: A method of image quality assessment based on region of interest. In Proceedings of World Congress on Intelligent Control and Automation. Chongqing, China, 25-27 June 2008; 2008:6840-6843."},{"key":"31_CR7","first-page":"47","volume-title":"Proceedings of Computer Vision and Pattern Recognition Workshop","author":"B Geary","year":"2010","unstructured":"Geary B, Grecos C: Image quality assessment using a rotated gaussian discrimination function. In Proceedings of Computer Vision and Pattern Recognition Workshop. San Francisco, CA, USA, 13-18 June 2010; 2010:47-52."},{"key":"31_CR8","doi-asserted-by":"publisher","first-page":"517","DOI":"10.1016\/j.image.2010.03.004","volume":"25","author":"C Li","year":"2010","unstructured":"Li C, Bovik AC: Content-partitioned structural similarity index for image quality assessment. Signal Process: Image Commun 2010, 25: 517-526. 10.1016\/j.image.2010.03.004","journal-title":"Signal Process: Image Commun"},{"issue":"3","key":"31_CR9","doi-asserted-by":"publisher","first-page":"030503","DOI":"10.2352\/J.ImagingSci.Technol.2010.54.3.030503","volume":"54","author":"Y Tong","year":"2010","unstructured":"Tong Y, Konik H, Cheikh FA, Tremeau A: Full reference image quality assessment based on saliency map analysis. J Imag Sci Technol 2010, 54(3):030503. 10.2352\/J.ImagingSci.Technol.2010.54.3.030503","journal-title":"J Imag Sci Technol"},{"issue":"2","key":"31_CR10","doi-asserted-by":"publisher","first-page":"193","DOI":"10.1109\/JSTSP.2009.2015374","volume":"3","author":"AK Moorthy","year":"2009","unstructured":"Moorthy AK, Bovik AC: Visual importance pooling for image quality assessment. IEEE J Sel Topics Signal Process 2009, 3(2):193-201.","journal-title":"IEEE J Sel Topics Signal Process"},{"issue":"1","key":"31_CR11","doi-asserted-by":"publisher","first-page":"011005","DOI":"10.1117\/1.3267097","volume":"19","author":"U Engelke","year":"2010","unstructured":"Engelke U, Zepernick H-J: Framework for optimal region of interest-based quality assessment in wireless imaging. J Electron Imag 2010, 19(1):011005. 10.1117\/1.3267097","journal-title":"J Electron Imag"},{"key":"31_CR12","doi-asserted-by":"publisher","first-page":"547","DOI":"10.1016\/j.image.2010.05.006","volume":"25","author":"OL Meur","year":"2010","unstructured":"Meur OL, Ninassi A, Callet PL, Barba D: Over visual attention for free-viewing and quality assessment tasks. Impact of the regions of interest on a video quality metric. Signal Process: Image Commun 2010, 25: 547-558. 10.1016\/j.image.2010.05.006","journal-title":"Signal Process: Image Commun"},{"issue":"5","key":"31_CR13","doi-asserted-by":"publisher","first-page":"513","DOI":"10.1109\/LSP.2010.2043888","volume":"17","author":"AK Moorthy","year":"2010","unstructured":"Moorthy AK, Bovik AC: A two-step framework for constructing blind image quality indices. IEEE Signal Process Lett 2010, 17(5):513-516.","journal-title":"IEEE Signal Process Lett"},{"key":"31_CR14","volume-title":"Computational visual quality of digitally printed images","author":"T Eerola","year":"2010","unstructured":"Eerola T: Computational visual quality of digitally printed images. Dissertation, Lappeenranta University of Technology; 2010."},{"key":"31_CR15","doi-asserted-by":"publisher","first-page":"696","DOI":"10.1007\/978-3-540-88458-3_63","volume-title":"Advanced Concepts for Intelligent Vision Systems, ACIVS 2008","author":"L Cui","year":"2008","unstructured":"Cui L, Allen AR: An image quality metric based on a colour appearance model. In Advanced Concepts for Intelligent Vision Systems, ACIVS 2008. Volume 5259. Edited by: J Blanc-Talon, S Bourennane, W Philips, D Popescu, P Schenders. Springer, Heidelberg; 2008:696. France, 20-24 October 2008. Lecture Notes in Computer Science 10.1007\/978-3-540-88458-3_63"},{"issue":"3","key":"31_CR16","doi-asserted-by":"publisher","first-page":"Article 16","DOI":"10.1145\/1773965.1773967","volume":"7","author":"J Radun","year":"2010","unstructured":"Radun J, Leisti T, Virtanen T, H\u00e4kkinen J, Vuori T, Nyman G: Evaluating the multivariate visual quality performance of image-processing components. ACM Trans Appl Percept 2010, 7(3):Article 16.","journal-title":"ACM Trans Appl Percept"},{"key":"31_CR17","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009","author":"T Leisti","year":"2009","unstructured":"Leisti T, Radun J, Virtanen T, Halonen R, Nyman G: Subjective experience of image quality: attributes, definitions and decision making of subjective image quality. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009. San Jose, CA, USA, 18-22 January 2009; 2009. 7242, 72420D"},{"key":"31_CR18","first-page":"149","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2005","author":"Z Wang","year":"2005","unstructured":"Wang Z, Simoncelli EP: Reduced-reference image quality assessment using a wavelet-domain natural image statistic model. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2005. Volume 5666. San Jose, CA, USA, 17 January 2005; 2005:149-159."},{"issue":"2","key":"31_CR19","doi-asserted-by":"publisher","first-page":"202","DOI":"10.1109\/JSTSP.2009.2014497","volume":"3","author":"Q Li","year":"2009","unstructured":"Li Q, Wang Z: Reduced-reference image quality assessment using divisive normalization-based image representation. IEEE J Sel Topics Signal Process 2009, 3(2):202-211.","journal-title":"IEEE J Sel Topics Signal Process"},{"key":"31_CR20","volume-title":"Photography-Electronic still-picture cameras-Resolution measurements","author":"ISO 12233:2000(E)","year":"2000","unstructured":"ISO 12233:2000(E). Photography-Electronic still-picture cameras-Resolution measurements 2000."},{"key":"31_CR21","volume-title":"Photography-Electronic still-picture cameras-Noise measurements","author":"ISO 15739:2003(E)","year":"2003","unstructured":"ISO 15739:2003(E). Photography-Electronic still-picture cameras-Noise measurements 2003."},{"key":"31_CR22","volume-title":"Graphic technology and photography-Colour characterization of digital still cameras (DSCs)-Part 1: Stimuli, metrology and test procedures","author":"ISO 17321-1:2006(E)","year":"2006","unstructured":"ISO 17321-1:2006(E). Graphic technology and p-tography-Colour characterization of digital still cameras (DSCs)-Part 1: Stimuli, metrology and test procedures 2006."},{"key":"31_CR23","volume-title":"Photography-Electronic still-picture cameras-Methods for measuring opto-electronic conversion functions (OECFs)","author":"ISO 14524:1999(E)","year":"1999","unstructured":"ISO 14524:1999(E). Photography-Electronic still-picture cameras-Methods for measuring opto-electronic conversion functions (OECFs) 1999."},{"key":"31_CR24","first-page":"195","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2006","author":"N Koren","year":"2006","unstructured":"Koren N: The Imatest program: comparing cameras with different amount of sharpening. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2006. Volume 6069. San Jose, CA, USA, 23 January 2006; 2006:195-203."},{"key":"31_CR25","first-page":"383","volume-title":"Proceedings of IS&T 50th Annual Conference","author":"Y Okano","year":"1997","unstructured":"Okano Y: MTF Analysis and its measurements for digital still camera. In Proceedings of IS&T 50th Annual Conference. Volume 50. Cambridge, MA, May 1997; 1997:383-387."},{"key":"31_CR26","first-page":"65020N","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2007","author":"CM Loebich","year":"2007","unstructured":"Loebich CM, Wueller D, Klingen B, Jaeger A: Digital camera resolution measurement using sinusoidal siemens stars. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2007. Volume 6502. San Jose, CA, USA, 28 January 2007; 2007:65020N."},{"key":"31_CR27","first-page":"72500I","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009","author":"U Artmann","year":"2009","unstructured":"Artmann U, Wueller D: Interaction of image noise, spatial resolution, and low contrast fine detail preservation in digital image processing. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009. Volume 7250. San Jose, CA, USA, 18-22 January 2009; 2009:72500I."},{"key":"31_CR28","first-page":"27500H","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009","author":"F Cao","year":"2009","unstructured":"Cao F, Guichard F, Hornung H: Measuring texture sharpness of a digital camera. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009. Volume 7250. San Jose, CA, USA, 18-22 January 2009; 2009:27500H."},{"issue":"2","key":"31_CR29","doi-asserted-by":"publisher","first-page":"163","DOI":"10.1016\/j.image.2003.08.003","volume":"19","author":"P Marziliano","year":"2004","unstructured":"Marziliano P, Dufaux F, Winkler S, Ebrahimi T: Perceptual blur and ringing metrics: application to JPEG2000. Signal Process: Image Commun 2004, 19(2):163-172. 10.1016\/j.image.2003.08.003","journal-title":"Signal Process: Image Commun"},{"issue":"4","key":"31_CR30","doi-asserted-by":"publisher","first-page":"717","DOI":"10.1109\/TIP.2008.2011760","volume":"18","author":"R Ferzli","year":"2009","unstructured":"Ferzli R, Karam LJ: A no-reference objective image sharpness metric based on the notion of just noticeable blur (JNB). IEEE Trans Image Process 2009, 18(4):717-728.","journal-title":"IEEE Trans Image Process"},{"issue":"9","key":"31_CR31","doi-asserted-by":"publisher","first-page":"2678","DOI":"10.1109\/TIP.2011.2131660","volume":"20","author":"ND Narvekar","year":"2011","unstructured":"Narvekar ND, Karam LJ: A no-reference image blur metric based on the cumulative probability of blur detection (CPBD). IEEE Trans Image Process 2011, 20(9):2678-2683.","journal-title":"IEEE Trans Image Process"},{"key":"31_CR32","first-page":"4369","volume-title":"Proceedings of IEEE International Conference on Image Processing","author":"L Liang","year":"2009","unstructured":"Liang L, Chen J, Ma S, Zhao D, Gao W: A no-reference perceptual blur metric using histogram of gradient profile sharpness. In Proceedings of IEEE International Conference on Image Processing. Cairo, Egypt, 7-10 November 2009; 2009:4369-4372."},{"key":"31_CR33","first-page":"53","volume-title":"Proceedings of IEEE International Conference on Image Processing","author":"J Caviedes","year":"2002","unstructured":"Caviedes J, Gurbuz S: No-reference sharpness metric based on local edge Kurtosis. In Proceedings of IEEE International Conference on Image Processing. Rochester, New York, USA, 22-25 September 2002; 2002:53-56."},{"key":"31_CR34","first-page":"64","volume-title":"Proceedings of First International Workshop on Quality of Multimedia Experience","author":"X Zhu","year":"2009","unstructured":"Zhu X, Milanfar P: A no-reference sharpness metric sensitive to blur and noise. In Proceedings of First International Workshop on Quality of Multimedia Experience. San Diego, CA, USA, 29-31 July 2009; 2009:64-69."},{"key":"31_CR35","first-page":"70","volume-title":"Proceedings of First International Workshop on Quality of Multimedia Experience","author":"M-J Chen","year":"2009","unstructured":"Chen M-J, Bovik AC: No-reference image blur assessment using multiscale gradient. In Proceedings of First International Workshop on Quality of Multimedia Experience. San Diego, CA, USA, 29-31 July 2009; 2009:70-74."},{"key":"31_CR36","first-page":"840","volume-title":"Proceedings of Signal Processing, ICSP 2008","author":"C-Y Wee","year":"2008","unstructured":"Wee C-Y, Paramesram R: Image sharpness measure using eigenvalues. In Proceedings of Signal Processing, ICSP 2008. Beijing, China, 26-29 October 2008; 2008:840-843."},{"issue":"11","key":"31_CR37","doi-asserted-by":"publisher","first-page":"1918","DOI":"10.1109\/TIP.2005.854492","volume":"14","author":"HR Sheikh","year":"2005","unstructured":"Sheikh HR, Bovik AC, Cormack L: No-reference quality assessment using natural scene statistics: JPEG2000. IEEE Trans Image Process 2005, 14(11):1918-1927.","journal-title":"IEEE Trans Image Process"},{"key":"31_CR38","first-page":"74984H","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009","author":"F-Y Zhang","year":"2009","unstructured":"Zhang F-Y, Sun T, Tu YF, Qin Q-Q: Reduced reference image quality assessment based on wavelet domain singular value decomposition. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009. Volume 7498. San Jose, CA, USA, 18-22 January 2009; 2009:74984H."},{"key":"31_CR39","first-page":"1","volume-title":"Proceedings of Second International Workshop on Quality of Multimedia Experience","author":"W Xue","year":"2010","unstructured":"Xue W, Mou X: Reduced reference image quality assessment based on weibull statistics. In Proceedings of Second International Workshop on Quality of Multimedia Experience. Trondheim, Norway, 21-23 June 2010; 2010:1-6."},{"issue":"18","key":"31_CR40","doi-asserted-by":"publisher","first-page":"937","DOI":"10.1049\/el.2009.1210","volume":"45","author":"G Cheng","year":"2009","unstructured":"Cheng G, Cheng L: Reduced reference image quality assessment based on dual derivative priors. IEEE Electron Lett 2009, 45(18):937-939. 10.1049\/el.2009.1210","journal-title":"IEEE Electron Lett"},{"key":"31_CR41","first-page":"78670M","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009","author":"M Nuutinen","year":"2010","unstructured":"Nuutinen M, Orenius O, S\u00e4\u00e4m\u00e4nen T, Oittinen P: Reference image method for measuring quality of photographs produced by digital cameras. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009. Volume 7867. San Jose, CA, USA, 17-21 January 2010; 2010:78670M."},{"issue":"2","key":"31_CR42","doi-asserted-by":"publisher","first-page":"91","DOI":"10.1023\/B:VISI.0000029664.99615.94","volume":"60","author":"DG Lowe","year":"2004","unstructured":"Lowe DG: Distinctive image features from scale-invariant keypoints. Int J Comput Vis 2004, 60(2):91-110.","journal-title":"Int J Comput Vis"},{"key":"31_CR43","unstructured":"Vedaldi A, Fulkerson B: VLFeat: an open and portable library of computer vision algorithms.[\n                    http:\/\/www.vlfeat.org\n                    \n                  ]"},{"key":"31_CR44","unstructured":"CPIQ Phase 1 v.1.10. Camera Phone Image Quality-Phase 1-Fundamentals and review of considered test methods International Imaging Industry Association (I3A); 2007."},{"key":"31_CR45","first-page":"221","volume-title":"Proceedings of IS&T Image Processing, Image Quality, Image Capture, Systems Conference, PICS","author":"RK Segur","year":"2000","unstructured":"Segur RK: Using photographic space to improve the evaluation of consumer cameras. In Proceedings of IS&T Image Processing, Image Quality, Image Capture, Systems Conference, PICS. Volume 3. Portland, USA, March 2000; 2000:221-224."},{"key":"31_CR46","unstructured":"Ferzli R, Karam LJ: JNB Sharpness Metric Software.[\n                    http:\/\/ivulab.asu.edu\/Quality\/JNBM\n                    \n                  ]"},{"key":"31_CR47","unstructured":"Narvekar ND, Karam LJ: CPBD Sharpness Metric Software.[\n                    http:\/\/ivulab.asu.edu\/Quality\/CPBD\n                    \n                  ]"},{"key":"31_CR48","unstructured":"Reduced-reference image quality assessment[\n                    http:\/\/www.cns.nyu.edu\/~zwang\/files\/research\/rriqa\/index.html\n                    \n                  ]"},{"key":"31_CR49","first-page":"61960L","volume-title":"Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009","author":"A Tervonen","year":"2006","unstructured":"Tervonen A, Nivala I, Ryytty P, Saari H, Ojanen H, Viinikanoja J: Integrated measurement system for miniature camera modules. In Proceedings of IS&T\/SPIE International Symposium on Electronic Imaging 2009. Volume 6196. San Jose, CA, USA, 15-19 January 2006; 2006:61960L."},{"key":"31_CR50","unstructured":"VQEG, Final Report from the Video Quality Expert Group on the Validation of Objective Models of Video Quality Assessment 2000."},{"key":"31_CR51","unstructured":"Sheikh HR, Wang Z, Cormack L, Bovik AC: LIVE image quality assessment database release 2.[\n                    http:\/\/live.ece.utexas.edu\/research\/quality\n                    \n                  ]"}],"container-title":["EURASIP Journal on Image and Video Processing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1186\/1687-5281-2012-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/article\/10.1186\/1687-5281-2012-8\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"http:\/\/link.springer.com\/content\/pdf\/10.1186\/1687-5281-2012-8.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,4,30]],"date-time":"2017-04-30T21:17:18Z","timestamp":1493587038000},"score":1,"resource":{"primary":{"URL":"https:\/\/jivp-eurasipjournals.springeropen.com\/articles\/10.1186\/1687-5281-2012-8"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,5,10]]},"references-count":51,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2012,12]]}},"alternative-id":["31"],"URL":"https:\/\/doi.org\/10.1186\/1687-5281-2012-8","relation":{},"ISSN":["1687-5281"],"issn-type":[{"value":"1687-5281","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,5,10]]},"article-number":"8"}}