{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,25]],"date-time":"2026-07-25T02:49:34Z","timestamp":1784947774669,"version":"3.55.0"},"reference-count":24,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2023,7,27]],"date-time":"2023-07-27T00:00:00Z","timestamp":1690416000000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"},{"start":{"date-parts":[[2023,7,27]],"date-time":"2023-07-27T00:00:00Z","timestamp":1690416000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0"}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Cloud Comp"],"abstract":"<jats:title>Abstract<\/jats:title><jats:p>The Industrial Internet of Things (IIoT) enables the improvement of the productivity and intelligent level of factory. The procedure of product quality inspection has generally adopted machine intelligence algorithms instead of manual operation to improve efficiency. In this paper, we propose a product quality inspection system scheme based on software-defined edge intelligent controller (SD-EIC). By adopting the software definition and resource virtualization technologies, the hardware platform of SD-EIC is designed to support the real-time control tasks and non-real-time edge computing tasks at the same time. To this end, we propose the scheme and architecture of product quality inspection system based on SD-EIC. Multiple virtual controllers and virtual edge computing nodes are constructed on a set of SD-EIC hardware platform to realize the integrated deployment of the real-time control for terminal devices and the AI model reasoning of product defect recognition algorithm based on machine vision respectively. In addition, the management and control scheme of product quality inspection system based on industrial information model is proposed. By constructing the semantic-based digital twin information model of terminal device, the flexible adjustment and parameter configuration of terminal device are realized to meet the demands of flexible production and manufacturing. The proposed product quality inspection system solution can effectively improve the utilization of hardware resources and the efficiency of product quality inspection, and reduce the overall deployment cost of the system. It can flexibly adapt to product diversity and different industrial scenarios.<\/jats:p>","DOI":"10.1186\/s13677-023-00487-7","type":"journal-article","created":{"date-parts":[[2023,7,27]],"date-time":"2023-07-27T11:02:19Z","timestamp":1690455739000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":9,"title":["The product quality inspection scheme based on software-defined edge intelligent controller in industrial internet of things"],"prefix":"10.1186","volume":"12","author":[{"given":"Pengfei","family":"Hu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chunming","family":"He","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiming","family":"Zhu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tianhui","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2023,7,27]]},"reference":[{"key":"487_CR1","doi-asserted-by":"publisher","unstructured":"Xu H, Yu W, Griffith D, Golmie N (2018) A survey on industrial internet of things: A cyber-physical systems perspective. IEEE Access 6:78,238\u201378,259. https:\/\/doi.org\/10.1109\/ACCESS.2018.2884906","DOI":"10.1109\/ACCESS.2018.2884906"},{"key":"487_CR2","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-9609-1","author":"T Qiu","year":"2022","unstructured":"Qiu T, Chen N, Zhang S (2022) Robustness Optimization for IoT Topology. Springer. https:\/\/doi.org\/10.1007\/978-981-16-9609-1","journal-title":"Springer"},{"key":"487_CR3","doi-asserted-by":"publisher","unstructured":"Bajic B, Rikalovic A, Suzic N, Piuri V (2021) Industry 4.0 implementation challenges and opportunities: A managerial perspective. IEEE Syst J 15(1):546\u2013559. https:\/\/doi.org\/10.1109\/JSYST.2020.3023041","DOI":"10.1109\/JSYST.2020.3023041"},{"issue":"5","key":"487_CR4","doi-asserted-by":"publisher","first-page":"2271","DOI":"10.1109\/TII.2017.2759178","volume":"14","author":"F Tao","year":"2018","unstructured":"Tao F, Cheng J, Qi Q (2018) Iihub: An industrial internet-of-things hub toward smart manufacturing based on cyber-physical system. IEEE Trans Ind Inform 14(5):2271\u20132280. https:\/\/doi.org\/10.1109\/TII.2017.2759178","journal-title":"IEEE Trans Ind Inform"},{"key":"487_CR5","doi-asserted-by":"publisher","first-page":"6378","DOI":"10.3390\/app11146378","volume":"11","author":"H Ha","year":"2021","unstructured":"Ha H, Jeong J (2021) Cnn-based defect inspection for injection molding using edge computing and industrial IoT systems. Appl Sci 11:6378. https:\/\/doi.org\/10.3390\/app11146378","journal-title":"Appl Sci"},{"key":"487_CR6","doi-asserted-by":"publisher","unstructured":"Jiang W, Ning X, Xu Y (2018) Review on big data fusion methods of quality inspection for consumer goods. In: 2018 5th IEEE International Conference on Cyber Security and Cloud Computing (CSCloud)\/2018 4th IEEE International Conference on Edge Computing and Scalable Cloud (EdgeCom), pp 95\u2013102. https:\/\/doi.org\/10.1109\/CSCloud\/EdgeCom.2018.00025","DOI":"10.1109\/CSCloud\/EdgeCom.2018.00025"},{"key":"487_CR7","doi-asserted-by":"crossref","unstructured":"Wu Y, Wang J, Chen YQ (2021) An efficient defect detection system for printed circuit boards with edge-cloud fusion computing. In: 2021 3rd International Conference on Industrial Artificial Intelligence. Shenyang, IAI 2021. pp 1\u20136","DOI":"10.1109\/IAI53119.2021.9619300"},{"key":"487_CR8","doi-asserted-by":"publisher","unstructured":"Hu P, He C, Zhu Y (2022) The scheme and system architecture of product quality inspection based on software-defined edge intelligent controller (SD-EIC) in industrial internet of things. In: 2022 IEEE International Conference on Smart Internet of Things (SmartIoT), pp 58\u201364. https:\/\/doi.org\/10.1109\/SmartIoT55134.2022.00019","DOI":"10.1109\/SmartIoT55134.2022.00019"},{"key":"487_CR9","doi-asserted-by":"crossref","unstructured":"Rong G, Xu Y, Tong X, Fan H (2021) An edge-cloud collaborative computing platform for building aiot applications efficiently. J Cloud Comput 10(1):1\u201314","DOI":"10.1186\/s13677-021-00250-w"},{"key":"487_CR10","doi-asserted-by":"crossref","unstructured":"Almutairi J, Aldossary M (2021) A novel approach for IoT tasks offloading in edge-cloud environments. J Cloud Comput 10(1):1\u201319","DOI":"10.1186\/s13677-021-00243-9"},{"issue":"5","key":"487_CR11","doi-asserted-by":"publisher","first-page":"637","DOI":"10.1109\/JIOT.2016.2579198","volume":"3","author":"W Shi","year":"2016","unstructured":"Shi W, Cao J, Zhang Q, Li Y, Xu L (2016) Edge computing: Vision and challenges. IEEE Internet Things J 3(5):637\u2013646. https:\/\/doi.org\/10.1109\/JIOT.2016.2579198","journal-title":"IEEE Internet Things J"},{"key":"487_CR12","doi-asserted-by":"crossref","unstructured":"Hu P, He C, Sun Y (2022) Software-defined industrial internet of things (SD-IIoT) oriented for industry 4.0. In: Advances in Artificial Intelligence and Security. Springer, Qinghai, p 575\u2013584","DOI":"10.1007\/978-3-031-06761-7_46"},{"issue":"6","key":"487_CR13","doi-asserted-by":"publisher","first-page":"1266","DOI":"10.1109\/TIM.2018.2795178","volume":"67","author":"S Mei","year":"2018","unstructured":"Mei S, Yang H, Yin Z (2018) An unsupervised-learning-based approach for automated defect inspection on textured surfaces. IEEE Trans Instrum Meas 67(6):1266\u20131277. https:\/\/doi.org\/10.1109\/TIM.2018.2795178","journal-title":"IEEE Trans Instrum Meas"},{"issue":"10","key":"487_CR14","doi-asserted-by":"publisher","first-page":"4665","DOI":"10.1109\/TII.2018.2842821","volume":"14","author":"L Li","year":"2018","unstructured":"Li L, Ota K, Dong M (2018) Deep learning for smart industry: Efficient manufacture inspection system with fog computing. IEEE Trans Ind Inform 14(10):4665\u20134673. https:\/\/doi.org\/10.1109\/TII.2018.2842821","journal-title":"IEEE Trans Ind Inform"},{"key":"487_CR15","doi-asserted-by":"publisher","unstructured":"Jacqueline S, Jochen B, Thorbj\u00f6rn B, Gunter B, Jochen D, (2020) Predictive model-based quality inspection using machine learning and edge cloud computing. Adv Eng Inform 45:101101. https:\/\/doi.org\/10.1016\/j.aei.2020.101101","DOI":"10.1016\/j.aei.2020.101101"},{"key":"487_CR16","doi-asserted-by":"crossref","unstructured":"Mei H (2017) Understanding \u201csoftware-defined\u201d from an OS perspective: technical challenges and research issues. Sci China (Inf Sci) 60(12):271\u2013273","DOI":"10.1007\/s11432-017-9240-4"},{"key":"487_CR17","doi-asserted-by":"crossref","unstructured":"Hu P, He C (2020) Edge computing-based solution and framework for software-defined industrial intelligent control in industrial internet of things. In: Cyberspace Data and Intelligence, and Cyber-Living, Syndrome, and Health. Springer, Beijing, p 142\u2013153","DOI":"10.1007\/978-981-33-4336-8_12"},{"issue":"7","key":"487_CR18","doi-asserted-by":"publisher","first-page":"5934","DOI":"10.1109\/JIOT.2019.2954528","volume":"7","author":"P Hu","year":"2020","unstructured":"Hu P, Chen W, He C, Li Y, Ning H (2020) Software-defined edge computing (SDEC): Principle, open IoT system architecture, applications, and challenges. IEEE Internet Things J 7(7):5934\u20135945. https:\/\/doi.org\/10.1109\/JIOT.2019.2954528","journal-title":"IEEE Internet Things J"},{"issue":"6","key":"487_CR19","doi-asserted-by":"publisher","first-page":"2644","DOI":"10.1109\/TNET.2022.3178408","volume":"30","author":"T Qiu","year":"2022","unstructured":"Qiu T, Zhang L, Chen N, Zhang S, Liu W, Wu DO (2022) Born this way: A self-organizing evolution scheme with motif for internet of things robustness. IEEE\/ACM Trans Netw 30(6):2644\u20132657. https:\/\/doi.org\/10.1109\/TNET.2022.3178408","journal-title":"IEEE\/ACM Trans Netw"},{"issue":"1","key":"487_CR20","doi-asserted-by":"publisher","first-page":"368","DOI":"10.1109\/TNET.2021.3113916","volume":"30","author":"N Chen","year":"2022","unstructured":"Chen N, Qiu T, Lu Z, Wu DO (2022) An adaptive robustness evolution algorithm with self-competition and its 3d deployment for internet of things. IEEE\/ACM Trans Networking 30(1):368\u2013381. https:\/\/doi.org\/10.1109\/TNET.2021.3113916","journal-title":"IEEE\/ACM Trans Networking"},{"key":"487_CR21","doi-asserted-by":"publisher","unstructured":"Schmied S, Gro?mann D, Mathias SG, Klaus\u00a0Mueller R (2020) An approach for an industrial information model management. In: 2020 IEEE Conference on Industrial Cyberphysical Systems (ICPS), vol\u00a01, pp 402\u2013405. https:\/\/doi.org\/10.1109\/ICPS48405.2020.9274751","DOI":"10.1109\/ICPS48405.2020.9274751"},{"key":"487_CR22","doi-asserted-by":"publisher","unstructured":"Li Y, Cheng T, Pan L (2021) Research and application of information model of industrial robot welding system based on opc ua. In: 2021 IEEE 2nd International Conference on Big Data, Artificial Intelligence and Internet of Things Engineering (ICBAIE), pp 1084\u20131087. https:\/\/doi.org\/10.1109\/ICBAIE52039.2021.9389867","DOI":"10.1109\/ICBAIE52039.2021.9389867"},{"issue":"2","key":"487_CR23","doi-asserted-by":"publisher","first-page":"2583","DOI":"10.1109\/JIOT.2018.2872028","volume":"6","author":"P Hu","year":"2019","unstructured":"Hu P, Ning H, Chen L, Daneshmand M (2019) An open internet of things system architecture based on software-defined device. IEEE Internet Things J 6(2):2583\u20132592. https:\/\/doi.org\/10.1109\/JIOT.2018.2872028","journal-title":"IEEE Internet Things J"},{"key":"487_CR24","doi-asserted-by":"publisher","unstructured":"Wan J, Tang S, Shu Z, Li D, Wang S, Imran M, Vasilakos AV (2016) Software-defined industrial internet of things in the context of industry 4.0. IEEE Sensors J 16(20):7373\u20137380. https:\/\/doi.org\/10.1109\/JSEN.2016.2565621","DOI":"10.1109\/JSEN.2016.2565621"}],"container-title":["Journal of Cloud Computing"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1186\/s13677-023-00487-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1186\/s13677-023-00487-7\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1186\/s13677-023-00487-7.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,27]],"date-time":"2023-07-27T11:05:29Z","timestamp":1690455929000},"score":1,"resource":{"primary":{"URL":"https:\/\/journalofcloudcomputing.springeropen.com\/articles\/10.1186\/s13677-023-00487-7"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,27]]},"references-count":24,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2023,12]]}},"alternative-id":["487"],"URL":"https:\/\/doi.org\/10.1186\/s13677-023-00487-7","relation":{},"ISSN":["2192-113X"],"issn-type":[{"value":"2192-113X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,7,27]]},"assertion":[{"value":"30 December 2022","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"10 July 2023","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"27 July 2023","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The research has consent for ethical approval and consent to participate.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Ethics approval and consent to participate"}},{"value":"The authors declare no competing interests.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Competing interests"}}],"article-number":"113"}}