{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,27]],"date-time":"2025-04-27T04:40:04Z","timestamp":1745728804560,"version":"3.40.4"},"reference-count":31,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2025,4,26]],"date-time":"2025-04-26T00:00:00Z","timestamp":1745625600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0"},{"start":{"date-parts":[[2025,4,26]],"date-time":"2025-04-26T00:00:00Z","timestamp":1745625600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0"}],"funder":[{"name":"Fundamental Research Program of Shanxi Province","award":["202303021221061","202303021221061"],"award-info":[{"award-number":["202303021221061","202303021221061"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62472267"],"award-info":[{"award-number":["62472267"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["J Big Data"],"DOI":"10.1186\/s40537-025-01153-2","type":"journal-article","created":{"date-parts":[[2025,4,26]],"date-time":"2025-04-26T16:06:40Z","timestamp":1745683600000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["A software reliability model for open source big data system considering fault introduction and fault removal efficiency"],"prefix":"10.1186","volume":"12","author":[{"given":"Jinyong","family":"Wang","sequence":"first","affiliation":[]},{"given":"Haijun","family":"Geng","sequence":"additional","affiliation":[]},{"given":"Pengda","family":"Li","sequence":"additional","affiliation":[]}],"member":"297","published-online":{"date-parts":[[2025,4,26]]},"reference":[{"key":"1153_CR1","doi-asserted-by":"crossref","unstructured":"Zhou H, Lou JG, Zhang H, et al. An empirical study on quality issues of production big data platform. In: IEEE International Conference on Software Engineering. IEEE, 2015:17\u201326.","DOI":"10.1109\/ICSE.2015.130"},{"key":"1153_CR2","doi-asserted-by":"crossref","unstructured":"Cao R, Gao J. Research on reliability evaluation of big data system. In: 2018 IEEE 3rd International Conference on Cloud Computing and Big Data Analysis (ICCCBDA). IEEE, 2018; pp. 261\u2013265.","DOI":"10.1109\/ICCCBDA.2018.8386523"},{"key":"1153_CR3","doi-asserted-by":"crossref","unstructured":"Tamura Y, Yamada S. Reliability analysis based on three-dimensional stochastic differential equation for big data on cloud computing. In: Proceedings of the IEEE International Conference on Industrial Engineering and Engineering Management, 2014, CDROM (Quality Control & Management III).","DOI":"10.1109\/IEEM.2014.7058761"},{"issue":"7","key":"1153_CR4","doi-asserted-by":"publisher","first-page":"4533","DOI":"10.3390\/e17074533","volume":"17","author":"Y Tamura","year":"2015","unstructured":"Tamura Y, Yamada S. Reliability analysis based on a jump diffusion model with two Wiener processes for cloud computing with big data. Entropy. 2015;17(7):4533\u201346.","journal-title":"Entropy"},{"key":"1153_CR5","doi-asserted-by":"crossref","unstructured":"Tamura Y, Nobukawa Y, Yamada. A method of reliability assessment based on hazard rate by clustering approach for cloud computing with big data. In: 2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM). IEEE, 2015; pp. 732\u2013736.","DOI":"10.1109\/IEEM.2015.7385744"},{"key":"1153_CR6","doi-asserted-by":"crossref","unstructured":"Tamura Y, Yamada S. Comparison of big data analyses for reliable open source software. In: 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM). IEEE, 2016; pp. 1345\u20131349.","DOI":"10.1109\/IEEM.2016.7798097"},{"issue":"02","key":"1153_CR7","doi-asserted-by":"publisher","first-page":"1750009","DOI":"10.1142\/S0218539317500097","volume":"24","author":"Y Tamura","year":"2017","unstructured":"Tamura Y, Takeuchi T, Yamada S. Software reliability and cost analysis considering service user for cloud with big data. Int J Reliab Qual Saf Eng. 2017;24(02):1750009.","journal-title":"Int J Reliab Qual Saf Eng"},{"key":"1153_CR8","doi-asserted-by":"publisher","first-page":"242","DOI":"10.1007\/s13198-019-00777-x","volume":"10","author":"R Kumar","year":"2019","unstructured":"Kumar R, Kumar S, Tiwari SK. A study of software reliability on big data open source software. Int J Syst Assurance Eng Manage. 2019;10:242\u201350.","journal-title":"Int J Syst Assurance Eng Manage"},{"key":"1153_CR9","doi-asserted-by":"crossref","unstructured":"Pradhan V, Kumar A, Dhar J. Modeling multi-release open source software reliability growth process with generalized modified Weibull distribution. In: Evolving software processes: trends and future directions. 2022; pp. 123\u2013133.","DOI":"10.1002\/9781119821779.ch5"},{"issue":"4","key":"1153_CR10","doi-asserted-by":"publisher","first-page":"419","DOI":"10.1007\/s41872-024-00265-7","volume":"13","author":"AK Yadav","year":"2024","unstructured":"Yadav AK, Srivastava S, Pant M. A generalized software reliability prediction model for module based software incorporating testing effort with cost model. Life Cycle Reliabil Saf Eng. 2024;13(4):419\u201336.","journal-title":"Life Cycle Reliabil Saf Eng"},{"issue":"6","key":"1153_CR11","doi-asserted-by":"publisher","first-page":"3137","DOI":"10.1007\/s00180-023-01430-9","volume":"39","author":"U Samal","year":"2024","unstructured":"Samal U, Kumar A. A software reliability model incorporating fault removal efficiency and it\u2019s release policy. Comput Statis. 2024;39(6):3137\u201355.","journal-title":"Comput Statis"},{"issue":"5","key":"1153_CR12","doi-asserted-by":"publisher","first-page":"2429","DOI":"10.1007\/s13198-022-01653-x","volume":"13","author":"V Verma","year":"2022","unstructured":"Verma V, Anand S, Kapur PK, et al. Unified framework to assess software reliability and determine optimal release time in presence of fault reduction factor, error generation and fault removal efficiency. Int J Syst Assurance Eng Manage. 2022;13(5):2429\u201341.","journal-title":"Int J Syst Assurance Eng Manage"},{"issue":"6","key":"1153_CR13","first-page":"1321","volume":"40","author":"U Samal","year":"2024","unstructured":"Samal U, Kumar A. An enhanced software reliability growth model considering dynamic fault removal efficiency and residual error change rate. J Inf Sci Eng. 2024;40(6):1321\u201333.","journal-title":"J Inf Sci Eng"},{"key":"1153_CR14","doi-asserted-by":"crossref","unstructured":"Garg M, Kumar V, Chaudhary K, et al. Uncertain differential equation based software belief reliability growth model (SBRGM) considering software patching. Int J Syst Assurance Eng Manage. 2024; 1\u201314.","DOI":"10.1007\/s13198-023-02225-3"},{"key":"1153_CR15","doi-asserted-by":"publisher","first-page":"95","DOI":"10.1007\/978-3-031-55048-5_7","volume-title":"Reliability engineering for industrial processes: an analytics perspective","author":"U Samal","year":"2024","unstructured":"Samal U, Kumar A. Fault removal efficiency: a key driver in software reliability growth modeling. In: Reliability engineering for industrial processes: an analytics perspective. Springer Nature Switzerland: Cham; 2024. p. 95\u2013106."},{"key":"1153_CR16","doi-asserted-by":"crossref","unstructured":"Singh JNP, Yadav A, Singh O, et al. Environmental factor and change point based modeling for studying reliability of a software system. Int J Syst Assurance Eng Manage. 2024: 1\u201311.","DOI":"10.1007\/s13198-024-02425-5"},{"key":"1153_CR17","doi-asserted-by":"crossref","unstructured":"Samal U, Kumar A. Incorporating human dynamics into software reliability analysis: learning, fatigue, and efficiency considerations. Int J Syst Assurance Eng Manage. 2024; 1\u201310.","DOI":"10.1007\/s13198-024-02368-x"},{"issue":"1","key":"1153_CR18","doi-asserted-by":"publisher","first-page":"321","DOI":"10.1080\/02286203.2023.2201905","volume":"45","author":"MA Haque","year":"2025","unstructured":"Haque MA, Ahmad N. Software reliability modeling under an uncertain testing environment. Int J Model Simul. 2025;45(1):321\u20137.","journal-title":"Int J Model Simul"},{"key":"1153_CR19","doi-asserted-by":"crossref","unstructured":"Samal U. Software reliability growth model considering imperfect debugging and fault removal efficiency. Qual Reliabil Eng Int. 2024;1\u201311.","DOI":"10.1002\/qre.3716"},{"issue":"1","key":"1153_CR20","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1007\/s10479-023-05240-6","volume":"340","author":"S Singhal","year":"2024","unstructured":"Singhal S, Kapur PK, Kumar V, et al. Stochastic debugging based reliability growth models for Open Source Software project. Ann Oper Res. 2024;340(1):531\u201369.","journal-title":"Ann Oper Res"},{"key":"1153_CR21","doi-asserted-by":"publisher","first-page":"206","DOI":"10.1109\/TR.1979.5220566","volume":"R28","author":"AL Goel","year":"1979","unstructured":"Goel AL, Okumoto K. Time-dependent error-detection rate model for software reliability and other performance measures. IEEE Trans Reliab. 1979;R28:206\u201311.","journal-title":"IEEE Trans Reliab"},{"key":"1153_CR22","doi-asserted-by":"publisher","first-page":"475","DOI":"10.1109\/TR.1983.5221735","volume":"32","author":"S Yamada","year":"1983","unstructured":"Yamada S, Ohba M, Osaki S. S-shaped reliability growth modeling for software error detection. IEEE Trans Reliabil. 1983;32:475\u201384.","journal-title":"IEEE Trans Reliabil"},{"key":"1153_CR23","doi-asserted-by":"publisher","first-page":"144","DOI":"10.1007\/978-3-642-45587-2_10","volume-title":"Inflection S-shaped software reliability growth model, stochastic models in reliability theory","author":"M Ohba","year":"1984","unstructured":"Ohba M. Inflection S-shaped software reliability growth model, stochastic models in reliability theory. Berlin: Springer; 1984. p. 144\u201362."},{"issue":"12","key":"1153_CR24","doi-asserted-by":"publisher","first-page":"2241","DOI":"10.1080\/00207729208949452","volume":"23","author":"S Yamada","year":"1992","unstructured":"Yamada S, Tokuno K, Osaki S. Imperfect debugging models with fault introduction rate for software reliability assessment. Int J Syst Sci. 1992;23(12):2241\u201352.","journal-title":"Int J Syst Sci"},{"key":"1153_CR25","doi-asserted-by":"crossref","unstructured":"Samal U, Kumar A. Empowering software reliability: leveraging efficient fault detection and removal efficiency. Qual Eng. 2024: 1\u201312.","DOI":"10.1080\/08982112.2024.2358889"},{"key":"1153_CR26","doi-asserted-by":"crossref","unstructured":"Wang J, Mi X. Open source software reliability model with the decreasing trend of fault detection rate. Comput J. 2018: bxy111.","DOI":"10.1093\/comjnl\/bxy111"},{"issue":"9","key":"1153_CR27","doi-asserted-by":"publisher","first-page":"929","DOI":"10.1016\/j.infsof.2011.04.005","volume":"53","author":"X Li","year":"2011","unstructured":"Li X, Li YF, Xie M, Ng SH. Reliability analysis and optimal version-updating for open source software. Inf Softw Technol. 2011;53(9):929\u201336.","journal-title":"Inf Softw Technol"},{"issue":"1","key":"1153_CR28","doi-asserted-by":"publisher","first-page":"114","DOI":"10.1109\/TSMCA.2003.812597","volume":"33","author":"X Zhang","year":"2003","unstructured":"Zhang X, Teng X, Pham H. Considering fault removal efficiency in software reliability assessment. IEEE Trans Syst Man Cybernet Part A Syst Humans. 2003;33(1):114\u201320.","journal-title":"IEEE Trans Syst Man Cybernet Part A Syst Humans"},{"issue":"2","key":"1153_CR29","doi-asserted-by":"publisher","first-page":"266","DOI":"10.1109\/TR.2010.2048657","volume":"59","author":"K Sharma","year":"2010","unstructured":"Sharma K, Garg R, Nagpal CK, Garg RK. Selection of optimal software reliability growth models using a distance based approach. IEEE Trans Reliab. 2010;59(2):266\u201376.","journal-title":"IEEE Trans Reliab"},{"key":"1153_CR30","doi-asserted-by":"publisher","first-page":"716","DOI":"10.1109\/TAC.1974.1100705","volume":"AC-19","author":"H Akaike","year":"1974","unstructured":"Akaike H. A new look at statistical model identification. IEEE Trans Autom Control. 1974;AC-19:716\u201323.","journal-title":"IEEE Trans Autom Control"},{"issue":"10","key":"1153_CR31","doi-asserted-by":"publisher","first-page":"1481","DOI":"10.1080\/02331934.2013.854787","volume":"63","author":"H Pham","year":"2014","unstructured":"Pham H. A new software reliability model with Vtub-shaped fault-detection rate and the uncertainty of operating environments. Optimization. 2014;63(10):1481\u201390.","journal-title":"Optimization"}],"container-title":["Journal of Big Data"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1186\/s40537-025-01153-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/article\/10.1186\/s40537-025-01153-2\/fulltext.html","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/link.springer.com\/content\/pdf\/10.1186\/s40537-025-01153-2.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,4,27]],"date-time":"2025-04-27T04:01:43Z","timestamp":1745726503000},"score":1,"resource":{"primary":{"URL":"https:\/\/journalofbigdata.springeropen.com\/articles\/10.1186\/s40537-025-01153-2"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,26]]},"references-count":31,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2025,12]]}},"alternative-id":["1153"],"URL":"https:\/\/doi.org\/10.1186\/s40537-025-01153-2","relation":{},"ISSN":["2196-1115"],"issn-type":[{"type":"electronic","value":"2196-1115"}],"subject":[],"published":{"date-parts":[[2025,4,26]]},"assertion":[{"value":"25 November 2024","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"6 April 2025","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"26 April 2025","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"Not applicable.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Ethics approval and consent to participate"}},{"value":"Not applicable.","order":3,"name":"Ethics","group":{"name":"EthicsHeading","label":"Consent for publication"}},{"value":"The authors declare no competing interests.","order":4,"name":"Ethics","group":{"name":"EthicsHeading","label":"Competing interests"}}],"article-number":"106"}}