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It is crucial to guarantee normal operation of charging piles, resulting in the importance of diagnosing charging-pile faults. The existing fault-diagnosis approaches were based on physical fault data like mechanical log data and sensor data streams. However, there are other types of fault data, which cannot be used for diagnosis by these existing approaches. This paper aims to fill this gap and consider 8 types of fault data for diagnosing, at least including physical installation error fault, charging-pile mechanical fault, charging-pile program fault, user personal fault, signal fault (offline), pile compatibility fault, charging platform fault, and other faults. We aim to find out how to combine existing feature-extraction and machine learning techniques to make the better diagnosis by conducting experiments on realistic dataset. 4 word embedding models are investigated for feature extraction of fault data, including N-gram, GloVe, Word2vec, and BERT. Moreover, we classify the word embedding results using 10 machine learning classifiers, including Random Forest (RF), Support Vector Machine, K-Nearest Neighbor, Multilayer Perceptron, Recurrent Neural Network, AdaBoost, Gradient Boosted Decision Tree, Decision Tree, Extra Tree, and VOTE. Compared with original fault record dataset, we utilize paraphrasing-based data augmentation method to improve the classification accuracy up to 10.40%. Our extensive experiment results reveal that RF classifier combining the GloVe embedding model achieves the best accuracy with acceptable training time. In addition, we discuss the interpretability of RF and GloVe.<\/jats:p>","DOI":"10.1186\/s42400-023-00138-z","type":"journal-article","created":{"date-parts":[[2023,4,3]],"date-time":"2023-04-03T23:02:30Z","timestamp":1680562950000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":6,"title":["Exploring best-matched embedding model and classifier for charging-pile fault diagnosis"],"prefix":"10.1186","volume":"6","author":[{"given":"Wen","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jianhua","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaofeng","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ye","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chun","family":"Xiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shuai","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mingcai","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lingfei","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2975-8857","authenticated-orcid":false,"given":"Xiaolin","family":"Chang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"297","published-online":{"date-parts":[[2023,4,4]]},"reference":[{"key":"138_CR1","unstructured":"Bengio Y, Ducharme R, Vincent P (2000) A neural probabilistic language model. 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