{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T19:26:56Z","timestamp":1766086016303},"reference-count":12,"publisher":"Informa UK Limited","issue":"1","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2001,2]]},"DOI":"10.1198\/00401700152404327","type":"journal-article","created":{"date-parts":[[2002,7,27]],"date-time":"2002-07-27T12:38:25Z","timestamp":1027773505000},"page":"56-65","source":"Crossref","is-referenced-by-count":67,"title":["A Semiparametric Approach to the One-Way Layout"],"prefix":"10.1198","volume":"43","author":[{"given":"Konstantinos","family":"Fokianos","sequence":"first","affiliation":[]},{"given":"Benjamin","family":"Kedem","sequence":"additional","affiliation":[]},{"given":"Jing","family":"Qin","sequence":"additional","affiliation":[]},{"given":"David A","family":"Short","sequence":"additional","affiliation":[]}],"member":"301","reference":[{"key":"p_1","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/59.1.19"},{"key":"p_4","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1032181161"},{"key":"p_7","doi-asserted-by":"publisher","DOI":"10.1175\/1520-0450(1998)037<0220:OCI>2.0.CO;2"},{"key":"p_8","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/74.3.495"},{"key":"p_10","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1031594729"},{"key":"p_11","first-page":"149","volume":"20","author":"Neyman J.","year":"1937","journal-title":"Skandinavisk Aktuarietidskrift"},{"key":"p_12","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/66.3.403"},{"key":"p_13","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176325370"},{"key":"p_14","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/84.3.609"},{"key":"p_18","doi-asserted-by":"publisher","DOI":"10.2307\/2346222"},{"key":"p_19","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347622"},{"key":"p_20","doi-asserted-by":"publisher","DOI":"10.2307\/2289465"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/00401700152404327","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,12,18]],"date-time":"2016-12-18T09:17:28Z","timestamp":1482052648000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/00401700152404327"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,2]]},"references-count":12,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2001,2]]}},"alternative-id":["10.1198\/00401700152404327"],"URL":"https:\/\/doi.org\/10.1198\/00401700152404327","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2001,2]]}}}