{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,7]],"date-time":"2026-02-07T22:18:42Z","timestamp":1770502722398,"version":"3.49.0"},"reference-count":25,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2001,5]]},"DOI":"10.1198\/004017001750386314","type":"journal-article","created":{"date-parts":[[2002,7,27]],"date-time":"2002-07-27T12:38:25Z","timestamp":1027773505000},"page":"199-211","source":"Crossref","is-referenced-by-count":47,"title":["A Smooth Nonparametric Approach to Multivariate Process Capability"],"prefix":"10.1198","volume":"43","author":[{"given":"Alan M","family":"Polansky","sequence":"first","affiliation":[]}],"member":"301","reference":[{"key":"p_1","doi-asserted-by":"publisher","DOI":"10.2307\/2685469"},{"key":"p_2","doi-asserted-by":"publisher","DOI":"10.2307\/2685441"},{"key":"p_4","doi-asserted-by":"publisher","DOI":"10.1007\/BF02869528"},{"key":"p_5","doi-asserted-by":"publisher","DOI":"10.1080\/08982119608904669"},{"key":"p_7","first-page":"749","volume":"4","author":"Chen H.","year":"1994","journal-title":"Statistica Sinica"},{"key":"p_9","doi-asserted-by":"crossref","first-page":"133","DOI":"10.1080\/00224065.1998.11979832","volume":"30","author":"Chou Y.-M.","year":"1998","journal-title":"Journal of Quality Technology"},{"key":"p_10","first-page":"95","volume":"22","author":"Clements J. A.","year":"1989","journal-title":"Quality Progress"},{"key":"p_13","doi-asserted-by":"publisher","DOI":"10.2307\/1403500"},{"key":"p_14","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176344552"},{"key":"p_17","doi-asserted-by":"publisher","DOI":"10.1080\/08982119608919049"},{"key":"p_18","doi-asserted-by":"publisher","DOI":"10.1080\/08982119608919036"},{"key":"p_19","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176350933"},{"key":"p_20","doi-asserted-by":"publisher","DOI":"10.1016\/0047-259X(90)90080-2"},{"key":"p_22","doi-asserted-by":"publisher","DOI":"10.1080\/00949657108811865"},{"key":"p_23","doi-asserted-by":"publisher","DOI":"10.1111\/1467-9868.00221"},{"key":"p_24","doi-asserted-by":"publisher","DOI":"10.1080\/03610929108830648"},{"key":"p_26","doi-asserted-by":"publisher","DOI":"10.1007\/BF02481146"},{"key":"p_32","doi-asserted-by":"crossref","first-page":"216","DOI":"10.1080\/00224065.1992.11979403","volume":"24","author":"Pearn W. L.","year":"1992","journal-title":"Journal of Quality Technology"},{"key":"p_33","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-1638(199801\/02)14:1<43::AID-QRE146>3.0.CO;2-K"},{"key":"p_34","doi-asserted-by":"publisher","DOI":"10.1080\/08982119808919237"},{"key":"p_38","doi-asserted-by":"publisher","DOI":"10.1080\/08982119608919047"},{"key":"p_39","first-page":"70","volume":"12","author":"Sultan T. I.","year":"1986","journal-title":"Quality Assurance"},{"key":"p_40","doi-asserted-by":"publisher","DOI":"10.2307\/2289786"},{"key":"p_41","doi-asserted-by":"publisher","DOI":"10.2307\/2290332"},{"key":"p_42","first-page":"97","volume":"9","author":"Wand M. P.","year":"1994","journal-title":"Computational Statistics"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017001750386314","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,5]],"date-time":"2020-03-05T11:39:56Z","timestamp":1583408396000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017001750386314"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2001,5]]},"references-count":25,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2001,5]]}},"alternative-id":["10.1198\/004017001750386314"],"URL":"https:\/\/doi.org\/10.1198\/004017001750386314","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2001,5]]}}}