{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T13:27:48Z","timestamp":1760707668320},"reference-count":2,"publisher":"Informa UK Limited","issue":"1","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2003,2]]},"DOI":"10.1198\/004017002188618653","type":"journal-article","created":{"date-parts":[[2006,5,10]],"date-time":"2006-05-10T23:15:59Z","timestamp":1147302959000},"page":"25-29","source":"Crossref","is-referenced-by-count":11,"title":["Discussion"],"prefix":"10.1198","volume":"45","author":[{"given":"Douglas M","family":"Hawkins","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"301","reference":[{"key":"p_3","doi-asserted-by":"crossref","first-page":"396","DOI":"10.1080\/00224065.1997.11979791","volume":"29","author":"Mason R. L.","year":"1997","journal-title":"Journal of Quality Technology"},{"key":"p_6","doi-asserted-by":"publisher","DOI":"10.2307\/2291724"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017002188618653","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,4,18]],"date-time":"2019-04-18T19:25:08Z","timestamp":1555615508000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017002188618653"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2003,2]]},"references-count":2,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2003,2]]}},"alternative-id":["10.1198\/004017002188618653"],"URL":"https:\/\/doi.org\/10.1198\/004017002188618653","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2003,2]]}}}