{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,6,7]],"date-time":"2023-06-07T02:26:56Z","timestamp":1686104816088},"reference-count":14,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2002,5]]},"DOI":"10.1198\/004017002317375082","type":"journal-article","created":{"date-parts":[[2002,7,27]],"date-time":"2002-07-27T12:38:28Z","timestamp":1027773508000},"page":"134-141","source":"Crossref","is-referenced-by-count":7,"title":["Closed-Loop Disturbance Identification and Controller Tuning for Discrete Manufacturing Processes"],"prefix":"10.1198","volume":"44","author":[{"given":"Enrique","family":"Del Castillo","sequence":"first","affiliation":[]}],"member":"301","reference":[{"key":"p_4","doi-asserted-by":"publisher","DOI":"10.2307\/2348897"},{"key":"p_6","doi-asserted-by":"crossref","first-page":"248","DOI":"10.1080\/00224065.1997.11979767","volume":"29","author":"Box G. E. P.","year":"1997","journal-title":"Journal of Quality Technology"},{"key":"p_7","doi-asserted-by":"publisher","DOI":"10.2307\/1267669"},{"key":"p_8","doi-asserted-by":"publisher","DOI":"10.2307\/1268651"},{"key":"p_9","doi-asserted-by":"publisher","DOI":"10.2307\/1267420"},{"key":"p_10","doi-asserted-by":"crossref","first-page":"184","DOI":"10.1080\/00224065.1997.11979749","volume":"29","author":"Del Castillo E.","year":"1997","journal-title":"Journal of Quality Technology"},{"key":"p_11","first-page":"227","volume":"15","author":"Davis R. A.","year":"1995","journal-title":"Probability and Mathematical Statistics"},{"key":"p_12","doi-asserted-by":"publisher","DOI":"10.1017\/S0266466600006423"},{"key":"p_14","doi-asserted-by":"crossref","first-page":"271","DOI":"10.1080\/00224065.1993.11979473","volume":"25","author":"Ingolfsson A.","year":"1993","journal-title":"Journal of Quality Technology"},{"key":"p_16","doi-asserted-by":"publisher","DOI":"10.1080\/03610919708813375"},{"key":"p_18","doi-asserted-by":"publisher","DOI":"10.1109\/66.350755"},{"key":"p_19","doi-asserted-by":"publisher","DOI":"10.2307\/2290341"},{"key":"p_21","doi-asserted-by":"publisher","DOI":"10.2307\/1391374"},{"key":"p_22","doi-asserted-by":"publisher","DOI":"10.2307\/1271177"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017002317375082","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,5]],"date-time":"2020-03-05T11:39:38Z","timestamp":1583408378000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017002317375082"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,5]]},"references-count":14,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2002,5]]}},"alternative-id":["10.1198\/004017002317375082"],"URL":"https:\/\/doi.org\/10.1198\/004017002317375082","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,5]]}}}