{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T22:07:18Z","timestamp":1774562838851,"version":"3.50.1"},"reference-count":12,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2002,5]]},"DOI":"10.1198\/004017002317375109","type":"journal-article","created":{"date-parts":[[2002,7,27]],"date-time":"2002-07-27T12:38:28Z","timestamp":1027773508000},"page":"152-160","source":"Crossref","is-referenced-by-count":26,"title":["Exact Analysis of Means With Unequal Variances"],"prefix":"10.1198","volume":"44","author":[{"given":"Peter R","family":"Nelson","sequence":"first","affiliation":[]},{"given":"Edward J","family":"Dudewicz","sequence":"additional","affiliation":[]}],"member":"301","reference":[{"key":"p_1","doi-asserted-by":"publisher","DOI":"10.2307\/1267642"},{"key":"p_2","first-page":"40","volume":"43","author":"Bishop T. A.","year":"1981","journal-title":"Sankhy, Series B"},{"issue":"4","key":"p_3","first-page":"14","volume":"3","author":"Craig C. C.","year":"1947","journal-title":"Industrial Quality Control"},{"key":"p_4","doi-asserted-by":"crossref","first-page":"232","DOI":"10.1080\/00224065.1984.11978920","volume":"16","author":"Craig R. J.","year":"1984","journal-title":"Journal of Quality Technology"},{"key":"p_5","author":"Dudewicz E. J.","year":"2002","journal-title":"American Journal of Mathematical and Management Sciences, to appear."},{"key":"p_6","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(91)90057-L"},{"key":"p_8","doi-asserted-by":"publisher","DOI":"10.1007\/BF02285231"},{"key":"p_11","doi-asserted-by":"crossref","first-page":"33","DOI":"10.1080\/00224065.1983.11978839","volume":"15","author":"Nelson P. R.","year":"1983","journal-title":"Journal of Quality Technology"},{"key":"p_12","first-page":"101","volume":"24","author":"Ott E. R.","year":"1967","journal-title":"Industrial Quality Control"},{"key":"p_14","doi-asserted-by":"publisher","DOI":"10.2307\/2280545"},{"key":"p_16","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177731088"},{"key":"p_18","doi-asserted-by":"publisher","DOI":"10.2307\/1271132"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017002317375109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,3,5]],"date-time":"2020-03-05T11:39:40Z","timestamp":1583408380000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017002317375109"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,5]]},"references-count":12,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2002,5]]}},"alternative-id":["10.1198\/004017002317375109"],"URL":"https:\/\/doi.org\/10.1198\/004017002317375109","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,5]]}}}