{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,31]],"date-time":"2025-07-31T00:25:14Z","timestamp":1753921514519,"version":"3.32.0"},"reference-count":12,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2006,5]]},"DOI":"10.1198\/004017005000000526","type":"journal-article","created":{"date-parts":[[2006,4,23]],"date-time":"2006-04-23T22:59:25Z","timestamp":1145833165000},"page":"273-283","source":"Crossref","is-referenced-by-count":18,"title":["SELC: Sequential Elimination of Level Combinations by Means of Modified Genetic Algorithms"],"prefix":"10.1198","volume":"48","author":[{"given":"Abhyuday","family":"Mandal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C. F","family":"Jeff Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kjell","family":"Johnson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"301","reference":[{"key":"p_1","doi-asserted-by":"crossref","first-page":"77","DOI":"10.1111\/j.2517-6161.1996.tb02068.x","volume":"58","author":"Bates R. A.","year":"1996","journal-title":"Journal of the Royal Statistical Society, Ser. B"},{"key":"p_2","doi-asserted-by":"publisher","DOI":"10.2307\/3315687"},{"key":"p_3","doi-asserted-by":"publisher","DOI":"10.2307\/1271501"},{"key":"p_4","first-page":"1","author":"Dixon L. C. W.","year":"1978","journal-title":"L. C. W. Dixon and G. P. Szego, Amsterdam: North Holland, pp."},{"key":"p_6","doi-asserted-by":"publisher","DOI":"10.2307\/2290777"},{"key":"p_7","doi-asserted-by":"publisher","DOI":"10.1198\/000313001317098121"},{"key":"p_9","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1080\/00224065.2003.11980189","volume":"35","author":"Heredia-Langner A.","year":"2003","journal-title":"Journal of Quality Technology"},{"key":"p_11","doi-asserted-by":"crossref","first-page":"263","DOI":"10.1080\/00224065.2004.11980273","volume":"36","author":"Heredia-Langner A.","year":"2004","journal-title":"Journal of Quality Technology"},{"key":"p_15","doi-asserted-by":"publisher","DOI":"10.1137\/0906002"},{"key":"p_16","first-page":"207","author":"Reeves C. L.","year":"1999","journal-title":"L. D. Davis, K. DeJong, M. D. Vose, and L. D. Whitley, New York: Springer-Verlag, pp."},{"key":"p_17","doi-asserted-by":"publisher","DOI":"10.1021\/cen-v081n036.p075"},{"key":"p_20","first-page":"279","author":"Wu C. F. J.","year":"1990","journal-title":"S. Ghosh, New York: Marcel Dekker, pp."}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017005000000526","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,8]],"date-time":"2025-01-08T15:39:42Z","timestamp":1736350782000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017005000000526"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2006,5]]},"references-count":12,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2006,5]]}},"alternative-id":["10.1198\/004017005000000526"],"URL":"https:\/\/doi.org\/10.1198\/004017005000000526","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"type":"print","value":"0040-1706"},{"type":"electronic","value":"1537-2723"}],"subject":[],"published":{"date-parts":[[2006,5]]}}}