{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T08:06:02Z","timestamp":1759133162157},"reference-count":30,"publisher":"Informa UK Limited","issue":"3","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2007,8]]},"DOI":"10.1198\/004017007000000290","type":"journal-article","created":{"date-parts":[[2007,7,19]],"date-time":"2007-07-19T23:07:25Z","timestamp":1184886445000},"page":"318-334","source":"Crossref","is-referenced-by-count":14,"title":["Statistical Aspects of the Analysis of Data Networks"],"prefix":"10.1198","volume":"49","author":[{"given":"Lorraine","family":"Denby","sequence":"first","affiliation":[]},{"given":"James M","family":"Landwehr","sequence":"additional","affiliation":[]},{"given":"Colin L","family":"Mallows","sequence":"additional","affiliation":[]},{"given":"Jean","family":"Meloche","sequence":"additional","affiliation":[]},{"given":"John","family":"Tuck","sequence":"additional","affiliation":[]},{"given":"Bowei","family":"Xi","sequence":"additional","affiliation":[]},{"given":"George","family":"Michailidis","sequence":"additional","affiliation":[]},{"given":"Vijayan N","family":"Nair","sequence":"additional","affiliation":[]}],"member":"301","reference":[{"key":"p_2","first-page":"031","volume":"7","author":"Adhikari A.","year":"2006","journal-title":"U.S. Patent"},{"key":"p_5","first-page":"203","author":"Adler M.","year":"2001","journal-title":"Proceedings of the IEEE Data Compression Conference, Snowbird, UT, pp."},{"key":"p_10","first-page":"628","author":"Bestavros A.","year":"2002","journal-title":"Proceedings of the IEEE Infocom, New York, NY, pp."},{"key":"p_11","doi-asserted-by":"publisher","DOI":"10.1007\/s00357-001-0031-0"},{"key":"p_12","doi-asserted-by":"publisher","DOI":"10.1109\/18.796384"},{"key":"p_13","doi-asserted-by":"publisher","DOI":"10.1214\/088342304000000422"},{"key":"p_14","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2004.831124"},{"key":"p_16","first-page":"13","author":"Claffy K. C.","year":"1993","journal-title":"Proceedings the ACM SIGCOMM, pp."},{"key":"p_18","doi-asserted-by":"publisher","DOI":"10.1198\/1061860032742"},{"key":"p_20","doi-asserted-by":"publisher","DOI":"10.1016\/j.tcs.2005.12.009"},{"key":"p_22","doi-asserted-by":"publisher","DOI":"10.1214\/088342304000000206"},{"key":"p_23","doi-asserted-by":"publisher","DOI":"10.1109\/TNET.2004.838612"},{"key":"p_24","doi-asserted-by":"publisher","DOI":"10.1109\/18.971737"},{"key":"p_25","doi-asserted-by":"publisher","DOI":"10.1109\/TNET.2005.852874"},{"key":"p_29","doi-asserted-by":"publisher","DOI":"10.1198\/004017006000000110"},{"key":"p_30","doi-asserted-by":"publisher","DOI":"10.1198\/004017003000000078"},{"key":"p_32","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2006.00567.x"},{"key":"p_35","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2003.814464"},{"key":"p_36","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.874412"},{"key":"p_37","doi-asserted-by":"publisher","DOI":"10.1109\/TNET.2002.805026"},{"key":"p_41","doi-asserted-by":"publisher","DOI":"10.1109\/90.649563"},{"key":"p_42","doi-asserted-by":"crossref","first-page":"11","DOI":"10.1145\/277858.277865","author":"Paxson V.","year":"1998","journal-title":"Proceedings of the ACM Sigmetrics, Madison, WI, pp."},{"key":"p_44","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2003.814468"},{"key":"p_45","first-page":"16","volume":"32","author":"Solka J. L.","year":"2000","journal-title":"Computing Science and Statistics"},{"key":"p_46","doi-asserted-by":"publisher","DOI":"10.2307\/2669484"},{"key":"p_47","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2003.814520"},{"key":"p_48","doi-asserted-by":"publisher","DOI":"10.2307\/2291416"},{"key":"p_49","doi-asserted-by":"publisher","DOI":"10.1198\/016214506000000366"},{"key":"p_50","first-page":"1775","volume":"2007","author":"Yang L.","year":"2006","journal-title":"Proceedings of Infocom"},{"key":"p_53","first-page":"206","author":"Zhang Y.","year":"2003","journal-title":"Proceedings of the ACM SIGCOMM, Karlsruhe, Germany, pp."}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1198\/004017007000000290","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T09:40:40Z","timestamp":1556703640000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1198\/004017007000000290"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,8]]},"references-count":30,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2007,8]]}},"alternative-id":["10.1198\/004017007000000290"],"URL":"https:\/\/doi.org\/10.1198\/004017007000000290","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2007,8]]}}}