{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,11]],"date-time":"2024-07-11T20:32:04Z","timestamp":1720729924209},"reference-count":0,"publisher":"Instituto Politecnico Nacional\/Centro de Investigacion en Computacion","issue":"4","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["CyS"],"DOI":"10.13053\/cys-24-4-3117","type":"journal-article","created":{"date-parts":[[2020,12,10]],"date-time":"2020-12-10T00:14:53Z","timestamp":1607559293000},"source":"Crossref","is-referenced-by-count":2,"title":["Review of Image Analysis for the Characterization of Vertically Aligned Nanotubes"],"prefix":"10.13053","volume":"24","author":[{"given":"Jes\u00fas","family":"Caro Guti\u00e9rrez","sequence":"first","affiliation":[]},{"given":"Oscar M.","family":"P\u00e9rez Landeros","sequence":"additional","affiliation":[]},{"given":"Felix F.","family":"Gonz\u00e1lez Navarro","sequence":"additional","affiliation":[]},{"given":"Mario A.","family":"Curiel Alvarez","sequence":"additional","affiliation":[]},{"given":"Benjamin","family":"Valdez Salas","sequence":"additional","affiliation":[]},{"given":"Nicola","family":"Radnev Nedev","sequence":"additional","affiliation":[]}],"member":"5402","published-online":{"date-parts":[[2020,12,9]]},"container-title":["Computaci\u00f3n y Sistemas"],"original-title":[],"deposited":{"date-parts":[[2020,12,10]],"date-time":"2020-12-10T00:14:57Z","timestamp":1607559297000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.cys.cic.ipn.mx\/ojs\/index.php\/CyS\/article\/view\/3117"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,9]]},"references-count":0,"journal-issue":{"issue":"4","published-online":{"date-parts":[[2020,12,9]]}},"URL":"https:\/\/doi.org\/10.13053\/cys-24-4-3117","relation":{},"ISSN":["2007-9737","1405-5546"],"issn-type":[{"value":"2007-9737","type":"electronic"},{"value":"1405-5546","type":"print"}],"subject":[],"published":{"date-parts":[[2020,12,9]]}}}