{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,8]],"date-time":"2026-10-08T19:59:54Z","timestamp":1791489594513,"version":"4.3.4"},"reference-count":32,"publisher":"Optica Publishing Group","issue":"29","license":[{"start":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T00:00:00Z","timestamp":1785110400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/doi.org\/10.1364\/OA_License_v2#VOR-OA"},{"start":{"date-parts":[[2026,7,27]],"date-time":"2026-07-27T00:00:00Z","timestamp":1785110400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/opg.optica.org\/policies\/opg-tdm-policy.json"}],"content-domain":{"domain":["opg.optica.org"],"crossmark-restriction":false},"short-container-title":["Appl. Opt."],"published-print":{"date-parts":[[2026,10,10]]},"abstract":"<jats:p>\n                    We report on the reliability study of 264\u00a0nm AlGaN deep-UV\n\t\t\t\t\tlight-emitting diodes (LEDs) under combined thermal and electrical\n\t\t\t\t\tstress. Temperature-dependent electroluminescence demonstrates\n\t\t\t\t\tretention of \u223c20% of the room-temperature intensity at 400\n                    <jats:sup>\u2218<\/jats:sup>\n                    C. Moreover, the external quantum\n\t\t\t\t\tefficiency (EQE) remains invariant up to \u223c250mA at 450\n                    <jats:sup>\u2218<\/jats:sup>\n                    C, evidencing mitigation of carrier\n\t\t\t\t\toverflow, nonradiative recombination, and droop-associated losses.\n\t\t\t\t\tLong-term reliability testing reveals no measurable linewidth\n\t\t\t\t\tbroadening over 5000\u00a0h, indicating negligible defect formation. These\n\t\t\t\t\tresults establish efficient, stable, and highly reliable AlGaN deep-UV\n\t\t\t\t\tLEDs for prolonged operation in harsh environments, such as\n\t\t\t\t\tsterilization and gas sensing.\n                  <\/jats:p>","DOI":"10.1364\/ao.607587","type":"journal-article","created":{"date-parts":[[2026,7,9]],"date-time":"2026-07-09T14:00:10Z","timestamp":1783605610000},"page":"10332","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["High-temperature reliability of AlGaN deep-UV light-emitting diodes for extreme environments"],"prefix":"10.1364","volume":"65","author":[{"given":"Swetha","family":"Velpula","sequence":"first","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0405mnx93","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-7976-0873","authenticated-orcid":true,"given":"Mano Bala Sankar","family":"Muthu","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0405mnx93","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ravi Teja","family":"Velpula","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0405mnx93","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Injamamul Hoque","family":"Emu","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0405mnx93","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tamara Faranaz","family":"Ena","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0405mnx93","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2002-8417","authenticated-orcid":true,"given":"Hoang-duy","family":"Nguyen","sequence":"additional","affiliation":[{"name":"Vietnam Academy of Science and Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1129-9581","authenticated-orcid":true,"given":"Hieu Pham Trung","family":"Nguyen","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0405mnx93","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"285","published-online":{"date-parts":[[2026,7,27]]},"reference":[{"key":"ao-65-29-10332-R1","doi-asserted-by":"publisher","first-page":"233","DOI":"10.1038\/s41566-019-0359-9","type":"journal-article","volume":"13","author":"Kneissl","year":"2019","journal-title":"Nat. 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