{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,5]],"date-time":"2026-10-05T18:54:06Z","timestamp":1791226446223,"version":"4.1.0"},"reference-count":24,"publisher":"Optica Publishing Group","issue":"29","license":[{"start":{"date-parts":[[2026,10,5]],"date-time":"2026-10-05T00:00:00Z","timestamp":1791158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/doi.org\/10.1364\/OA_License_v2#VOR"},{"start":{"date-parts":[[2026,10,5]],"date-time":"2026-10-05T00:00:00Z","timestamp":1791158400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/opg.optica.org\/policies\/opg-tdm-policy.json"}],"content-domain":{"domain":["opg.optica.org"],"crossmark-restriction":false},"short-container-title":["Appl. Opt."],"published-print":{"date-parts":[[2026,10,10]]},"abstract":"<jats:p>\n                    High-repetition-rate nanosecond pulsed lasers produce irradiation effects on CMOS photodetectors through the coupling between single-pulse transient photoelectric responses and multi-pulse thermal accumulation. The evolution from interference to damage under varying power and repetition rate conditions remains insufficiently understood. This study irradiated front-illuminated CMOS photodetectors with a 1064\u00a0nm high-repetition-rate nanosecond pulsed laser at average powers of 1 and 10\u00a0W with repetition rates from 1 to 3\u00a0MHz. A deviant pixel ratio method based on differential images and the 3\n                    <jats:italic>\u03c3<\/jats:italic>\n                    criterion was established to quantify interference evolution and post-irradiation recovery. At 1\u00a0W, the detector sequentially underwent an initial transient response, black sun effect, interference expansion, and global saturation, recovering to near-baseline status after laser cessation. The recovery time extended from 402\u00b167ms at 1\u00a0MHz to 1809\u00b167ms at 3\u00a0MHz. At 10\u00a0W, the detector underwent readout sampling anomaly, saturation crosstalk, and cross-shaped functional damage with irreversible structural damage. The deviant pixel ratio at all repetition rates failed to fall below the single-pixel resolution limit after laser cessation, confirming irreversible functional damage that intensified with repetition rate. These results provide a basis for evaluating interference and damage effects of high-repetition-rate nanosecond pulsed lasers on CMOS photodetectors.\n                  <\/jats:p>","DOI":"10.1364\/ao.611425","type":"journal-article","created":{"date-parts":[[2026,10,5]],"date-time":"2026-10-05T18:27:00Z","timestamp":1791224820000},"page":"10204","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Evolution of interference and damage in a front-illuminated CMOS photodetector under 1064\u2009\u2009nm high-repetition-rate nanosecond pulsed\u00a0laser irradiation"],"prefix":"10.1364","volume":"65","author":[{"given":"Shengqi","family":"Xu","sequence":"first","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xiangjie","family":"Cao","sequence":"additional","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hailong","family":"Yu","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/007mntk44","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4422-7111","authenticated-orcid":true,"given":"Jing","family":"Shen","sequence":"additional","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Canzhao","family":"Wang","sequence":"additional","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bing","family":"Zhang","sequence":"additional","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guangyan","family":"Dong","sequence":"additional","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guang","family":"Feng","sequence":"additional","affiliation":[{"name":"The 27th Research Institute of China Electronics Technology Group Corporation"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2989-0292","authenticated-orcid":true,"given":"Xun","family":"Gao","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/007mntk44","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"285","published-online":{"date-parts":[[2026,10,5]]},"reference":[{"key":"ao-65-29-10204-R1","doi-asserted-by":"publisher","first-page":"1689","DOI":"10.1109\/16.628824","type":"journal-article","volume":"44","author":"Fossum","year":"1997","journal-title":"IEEE Trans. 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All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.","name":"copyright","label":"Copyright"}]}}