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Express"],"published-print":{"date-parts":[[2025,11,3]]},"abstract":"<jats:p>Scattering imaging techniques, demonstrated using time-correlated single-photon counting (TCSPC) systems, have significant industrial applications in areas such as remote sensing, robotic vision, and autonomous driving. This paper presents a multi-channel, high-linearity TCSPC system based on a Xilinx UltraScale (XC7Z100-2FFG9001) field-programmable gate array (FPGA). The proposed TCSPC system achieves a temporal resolution of 10 ps and exhibits differential nonlinearity within the range of [-10, 9.9] ps and integral nonlinearity within [-14, 9.9] ps. To demonstrate the capabilities of the proposed TCSPC system, we conducted confocal imaging experiments to visualise objects obscured by scattering media. We introduce what we believe to be a novel image reconstruction method based on the plug-and-play (PnP) framework, which leverages fast and flexible denoising neural networks: FFDNet for 2D imaging and FastDVDnet for 3D imaging. By integrating the scattering forward model with these denoising networks, we implement a high-performance reconstruction approach that enables high-quality imaging of complex scenes. Both simulations and experiments were conducted to validate the superior performance of our proposed method.<\/jats:p>","DOI":"10.1364\/oe.568299","type":"journal-article","created":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T08:00:08Z","timestamp":1755244808000},"page":"46626","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["Multi-channel high-precision FPGA-embedded time correlated single photon counting systems for optical scattering imaging"],"prefix":"10.1364","volume":"33","author":[{"given":"Chengquan","family":"Pei","sequence":"first","affiliation":[{"id":[{"id":"https:\/\/ror.org\/05s92vm98","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haoyong","family":"Li","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/05s92vm98","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xuekang","family":"Zeng","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/05s92vm98","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yu","family":"Wang","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/00n3w3b69","id-type":"ROR","asserted-by":"publisher"}]},{"name":"Advanced Micro Devices (Shanghai) Co., Ltd."}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Haochang","family":"Chen","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/00n3w3b69","id-type":"ROR","asserted-by":"publisher"}]},{"name":"Fraunhofer U.K. Research Limited"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6401-4263","authenticated-orcid":true,"given":"David Day-Uei","family":"Li","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/00n3w3b69","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"285","published-online":{"date-parts":[[2025,10,27]]},"reference":[{"key":"oe-33-22-46626-R1","doi-asserted-by":"publisher","first-page":"2309","DOI":"10.1364\/OL.32.002309","type":"journal-article","volume":"32","author":"Vellekoop","year":"2007","journal-title":"Opt. 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