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Express"],"published-print":{"date-parts":[[2026,1,12]]},"abstract":"<jats:p>Modern industrial production demands high-precision and efficient full-field functional surface measurements. Multi-wavelength digital holography (MWDH) addresses these measurement needs and has been applied in various measurement scenarios. However, the measurement precision of MWDH for rough surfaces is still evaluated experimentally, lacking a comprehensive theoretical model for guidance. In this work, we propose an MWDH precision model focused on rough surfaces, considering both decorrelation noise and acquisition noise. Besides, the model provides a more meaningful assessment of full-field noise under spatial inhomogeneity scattering from rough surfaces. For the first time, we introduce the concept of coherent stray light noise, which is considered a component of acquisition noise in this study. Experiments performed on a rough surface validate the proposed model. Our model not only enables the assessment of measurement precision in MWDH systems, but also allows for a preliminary determination of the measurability of target objects.<\/jats:p>","DOI":"10.1364\/oe.578509","type":"journal-article","created":{"date-parts":[[2025,12,2]],"date-time":"2025-12-02T07:00:07Z","timestamp":1764658807000},"page":"857","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Modeling the measurement precision of rough surfaces in multi-wavelength digital holography"],"prefix":"10.1364","volume":"34","author":[{"given":"Haiyu","family":"Zhang","sequence":"first","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0220qvk04","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bo","family":"Qian","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0220qvk04","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5441-9737","authenticated-orcid":true,"given":"Hao","family":"Yan","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/0220qvk04","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"285","published-online":{"date-parts":[[2026,1,7]]},"reference":[{"key":"oe-34-1-857-R1","doi-asserted-by":"publisher","first-page":"134","DOI":"10.37188\/lam.2021.015","type":"journal-article","volume":"2","author":"Markus","year":"2021","journal-title":"Light: Advanced Manufacturing"},{"key":"oe-34-1-857-R2","doi-asserted-by":"publisher","first-page":"145","DOI":"10.1038\/s41377-024-01453-x","type":"journal-article","volume":"13","author":"Huang","year":"2024","journal-title":"Light Sci. 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