{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,30]],"date-time":"2026-09-30T16:03:37Z","timestamp":1790784217363,"version":"4.1.0"},"reference-count":54,"publisher":"Optica Publishing Group","issue":"20","license":[{"start":{"date-parts":[[2026,9,30]],"date-time":"2026-09-30T00:00:00Z","timestamp":1790726400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,9,30]],"date-time":"2026-09-30T00:00:00Z","timestamp":1790726400000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/opg.optica.org\/policies\/opg-tdm-policy.json"}],"funder":[{"name":"U.S. National Science Foundation","award":["2052742"],"award-info":[{"award-number":["2052742"]}],"id":[{"id":"https:\/\/ror.org\/021nxhr62","id-type":"ROR","asserted-by":"publisher"}]},{"name":"U.S. National Science Foundation","award":["2125764"],"award-info":[{"award-number":["2125764"]}],"id":[{"id":"https:\/\/ror.org\/021nxhr62","id-type":"ROR","asserted-by":"publisher"}]},{"name":"National Aeronautics and Space Administration","award":["80NSSC23K1198"],"award-info":[{"award-number":["80NSSC23K1198"]}],"id":[{"id":"https:\/\/ror.org\/027ka1x80","id-type":"ROR","asserted-by":"publisher"}]},{"name":"United States Air Force Office of Scientific Research","award":["FA9550-22-1-0471"],"award-info":[{"award-number":["FA9550-22-1-0471"]}],"id":[{"id":"https:\/\/ror.org\/011e9bt93","id-type":"ROR","asserted-by":"publisher"}]}],"content-domain":{"domain":["opg.optica.org"],"crossmark-restriction":false},"short-container-title":["Opt. Express"],"published-print":{"date-parts":[[2026,10,5]]},"abstract":"<jats:p>Photonic integrated circuits have become essential for meeting the growing global demand for high-capacity information processing and transport. Assessing their radiation tolerance is necessary for deploying systems in radiation prone environments \u2013 including in space, high-energy particle accelerators, and defense radiation testing facilities \u2013 where the performance and compactness of photonic integrated circuits are increasingly advantageous. This work investigates the analog and digital radio frequency electro-optic performance of Mach-Zehnder modulators (MZMs) subject to 10-keV X-ray irradiation, which mimics cumulative ionization effects in space flight. Silicon photonic MZMs serve as excellent exemplars since they are interferometric devices comprised of elements common to many integrated photonic circuits. Under standard bias conditions, the irradiated MZMs exhibited significantly reduced bandwidth, a corresponding eye closure and baud rate dependent increases in the estimated error rate. Notably, when MZMs were irradiated with all leads grounded, no radiation sensitivity to the electro-optic response was observed highlighting the importance of testing under standard operating conditions for ground-based radiation testing as well as on-orbit studies. Understanding the radiation induced performance degradation of MZMs and other integrated photonic devices is increasingly important for space and accelerator environments as performance requirements and deployment opportunities increase.<\/jats:p>","DOI":"10.1364\/oe.606720","type":"journal-article","created":{"date-parts":[[2026,9,11]],"date-time":"2026-09-11T04:00:08Z","timestamp":1789099208000},"page":"38083","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Radiation-induced ionization effects and space mission requirements for silicon photonic Mach-Zehnder modulators"],"prefix":"10.1364","volume":"34","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0843-0211","authenticated-orcid":true,"given":"Kellen P.","family":"Arnold","sequence":"first","affiliation":[{"id":[{"id":"https:\/\/ror.org\/02vm5rt34","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Joel B.","family":"Slaby","sequence":"additional","affiliation":[{"name":"Georgia Institute of Technology"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nathaniel J.","family":"Karom","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/02vm5rt34","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Anurag R.","family":"Veluri","sequence":"additional","affiliation":[{"id":[{"id":"https:\/\/ror.org\/02vm5rt34","id-type":"ROR","asserted-by":"publisher"}]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"C. 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Further distribution of this work must maintain attribution to the author(s) and the published article\u2019s title, journal citation, and DOI.","name":"copyright","label":"Copyright"}]}}