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Lett."],"published-print":{"date-parts":[[2026,2,1]]},"abstract":"<jats:p>\n                    1060\n                    <jats:sub>\u2009<\/jats:sub>\n                    nm vertical-cavity surface-emitting lasers (VCSELs) offer low dispersion and transmission loss for optical interconnects, but conventional oxide-confined designs face challenges in thermal accumulation and parasitic effects. We propose a high-speed 1060\n                    <jats:sub>\u2009<\/jats:sub>\n                    nm VCSEL featuring a hybrid confinement structure that integrates a buried tunnel junction (BTJ) with an oxide aperture, along with an optimized 8\n                    <jats:sub>\u2009<\/jats:sub>\n                    nm BTJ position offset. This hybrid architecture enhances current injection, reduces parasitic capacitance, and improves thermal management. The device achieves a \u22123\n                    <jats:sub>\u2009<\/jats:sub>\n                    dB modulation bandwidth of 37.2\n                    <jats:sub>\u2009<\/jats:sub>\n                    GHz, low differential resistance (~65\u202f\u03a9), &gt;50\n                    <jats:sub>\u2009<\/jats:sub>\n                    dB side-mode suppression ratio, and a &gt;10\n                    <jats:sub>\u2009<\/jats:sub>\n                    K reduction in peak temperature via numerical modeling. These results demonstrate a promising approach for next-generation, energy-efficient VCSELs targeting high-speed, short-reach optical communication systems.\n                  <\/jats:p>","DOI":"10.1364\/ol.583230","type":"journal-article","created":{"date-parts":[[2025,12,24]],"date-time":"2025-12-24T13:00:05Z","timestamp":1766581205000},"page":"600","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["High-bandwidth 1060nm VCSEL design with hybrid buried tunnel junction and oxide confinement"],"prefix":"10.1364","volume":"51","author":[{"given":"Wang","family":"Yihua","sequence":"first","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhang","family":"Xuhao","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhao","family":"Feiyun","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tang","family":"Zhiting","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-3740-3213","authenticated-orcid":true,"given":"Ren","family":"Wuyang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3689-1186","authenticated-orcid":true,"given":"Shen","family":"Kai","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wang","family":"Mengke","sequence":"additional","affiliation":[{"name":"National Institute of Measurement and Testing Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8346-9434","authenticated-orcid":true,"given":"Li","family":"Chuang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5133-2775","authenticated-orcid":true,"given":"Ren","family":"Aobo","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0679-6196","authenticated-orcid":true,"given":"Wu","family":"Jiang","sequence":"additional","affiliation":[{"name":"University of Electronic Science and Technology of China"},{"name":"Mozi Laboratory"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"285","published-online":{"date-parts":[[2026,1,23]]},"reference":[{"key":"ol-51-3-600-R1","doi-asserted-by":"publisher","first-page":"1845","DOI":"10.1109\/3.7126","type":"journal-article","volume":"24","author":"Iga","year":"1988","journal-title":"IEEE J. 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All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.","name":"copyright","label":"Copyright"}]}}