{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,3]],"date-time":"2026-09-03T17:21:43Z","timestamp":1788456103810,"version":"build-2803163510"},"reference-count":18,"publisher":"Optica Publishing Group","issue":"18","license":[{"start":{"date-parts":[[2026,9,3]],"date-time":"2026-09-03T00:00:00Z","timestamp":1788393600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/doi.org\/10.1364\/OA_License_v2#VOR"},{"start":{"date-parts":[[2026,9,3]],"date-time":"2026-09-03T00:00:00Z","timestamp":1788393600000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/opg.optica.org\/policies\/opg-tdm-policy.json"}],"funder":[{"name":"Advanced Materials-National Science and Technology Major Project","award":["2024ZD0605200"],"award-info":[{"award-number":["2024ZD0605200"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62304217"],"award-info":[{"award-number":["62304217"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"},{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62450006"],"award-info":[{"award-number":["62450006"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"},{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62127807"],"award-info":[{"award-number":["62127807"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"},{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["U21B2061"],"award-info":[{"award-number":["U21B2061"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"},{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["U25A20490"],"award-info":[{"award-number":["U25A20490"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"},{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62234011"],"award-info":[{"award-number":["62234011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"},{"id":"https:\/\/ror.org\/01h0zpd94","id-type":"ROR","asserted-by":"publisher"}]},{"name":"Strategic Priority Research Program of CAS","award":["XDB1570000"],"award-info":[{"award-number":["XDB1570000"]}]},{"name":"Strategic Priority Research Program of CAS","award":["XDB1570101"],"award-info":[{"award-number":["XDB1570101"]}]},{"name":"The 46th Research Institute of China Electronics Technology Group Corporation","award":["WDZC202446009"],"award-info":[{"award-number":["WDZC202446009"]}]},{"DOI":"10.13039\/501100004739","name":"Youth Innovation Promotion Association of Chinese Academy of Sciences","doi-asserted-by":"crossref","award":["Y2023032"],"award-info":[{"award-number":["Y2023032"]}],"id":[{"id":"10.13039\/501100004739","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100004739","name":"Youth Innovation Promotion Association of Chinese Academy of Sciences","doi-asserted-by":"crossref","award":["2023124"],"award-info":[{"award-number":["2023124"]}],"id":[{"id":"10.13039\/501100004739","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":["opg.optica.org"],"crossmark-restriction":false},"short-container-title":["Opt. Lett."],"published-print":{"date-parts":[[2026,9,15]]},"abstract":"<jats:p>Nonlinear degradation behavior in semiconductor laser diodes (LDs) is critical for understanding the reliability limitations after long-term operation. Here, we have investigated an observed nonlinear power degradation and a subsequent progressive recovery behavior of GaN-based violet LDs during constant-current aging. The aged devices exhibit a pronounced increase in threshold current and reduced optical output, accompanied by a reduced radiative efficiency at low injection levels. Electrical measurements, below-threshold electroluminescence (EL) spectroscopy, and scanning electron microscopy (SEM)\/cathodoluminescence (CL) micrograph analyses reveal that the degradation is highly localized beneath the ridge waveguide, where enhanced defect-assisted recombination and carrier transport nonuniformity occur. Based on these results, a localized defect-assisted transport evolution model is proposed, suggesting that the formation of defect-induced shunt channels may cause carrier leakage and trigger the nonlinear output power degradation, while their dynamic reconstruction may contribute to the subsequent progressive recovery behavior. This discovery provides experimental insight into nonlinear degradation mechanisms in high-power GaN-based violet LDs.<\/jats:p>","DOI":"10.1364\/ol.611775","type":"journal-article","created":{"date-parts":[[2026,8,20]],"date-time":"2026-08-20T13:00:12Z","timestamp":1787230812000},"page":"5068","update-policy":"https:\/\/doi.org\/10.1364\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Investigation of nonlinear power degradation and progressive recovery behavior in GaN-based violet laser diodes"],"prefix":"10.1364","volume":"51","author":[{"given":"Yufei","family":"Hou","sequence":"first","affiliation":[{"name":"Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zongshun","family":"Liu","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jing","family":"Yang","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Feng","family":"Liang","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2572-8615","authenticated-orcid":true,"given":"Yuheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Degang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Chinese Academy of Sciences"},{"name":"University of Chinese Academy of Sciences"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"285","published-online":{"date-parts":[[2026,9,3]]},"reference":[{"key":"ol-51-18-5068-R1","doi-asserted-by":"publisher","first-page":"171105","DOI":"10.1063\/1.3656970","type":"journal-article","volume":"99","author":"Farrell","year":"2011","journal-title":"Appl. Phys. Lett."},{"key":"ol-51-18-5068-R2","doi-asserted-by":"crossref","first-page":"R27","DOI":"10.1088\/0268-1242\/14\/6\/201","type":"journal-article","volume":"14","author":"Nakamura","year":"1999","journal-title":"Semicond. Sci. Technol."},{"key":"ol-51-18-5068-R3","doi-asserted-by":"publisher","first-page":"3206","DOI":"10.1143\/JJAP.40.3206","type":"journal-article","volume":"40","author":"Tojyo","year":"2001","journal-title":"Jpn. J. Appl. Phys."},{"key":"ol-51-18-5068-R4","doi-asserted-by":"publisher","first-page":"1001","DOI":"10.1109\/LPT.2006.873540","type":"journal-article","volume":"18","author":"Ryu","year":"2006","journal-title":"IEEE Photon. Technol. Lett."},{"key":"ol-51-18-5068-R5","doi-asserted-by":"publisher","first-page":"259","DOI":"10.3390\/cryst15030259","type":"journal-article","volume":"15","author":"Onwukaeme","year":"2025","journal-title":"Crystals"},{"key":"ol-51-18-5068-R6","doi-asserted-by":"publisher","first-page":"2400119","DOI":"10.1002\/adpr.202400119","type":"journal-article","volume":"5","author":"Zhang","year":"2024","journal-title":"Adv. Photonics Res."},{"key":"ol-51-18-5068-R7","doi-asserted-by":"publisher","first-page":"222103","DOI":"10.1063\/5.0124480","type":"journal-article","volume":"121","author":"Zhang","year":"2022","journal-title":"Appl. Phys. Lett."},{"key":"ol-51-18-5068-R8","doi-asserted-by":"publisher","first-page":"212102","DOI":"10.1063\/1.5001372","type":"journal-article","volume":"111","author":"Wen","year":"2017","journal-title":"Appl. Phys. Lett."},{"key":"ol-51-18-5068-R9","doi-asserted-by":"publisher","first-page":"223106","DOI":"10.1063\/5.0051126","type":"journal-article","volume":"129","author":"Wang","year":"2021","journal-title":"J. Appl. Phys."},{"key":"ol-51-18-5068-R10","doi-asserted-by":"publisher","first-page":"231909","DOI":"10.1063\/1.2928226","type":"journal-article","volume":"92","author":"Albrecht","year":"2008","journal-title":"Appl. Phys. Lett."},{"key":"ol-51-18-5068-R11","doi-asserted-by":"publisher","first-page":"43","DOI":"10.1557\/S0883769400039075","type":"journal-article","volume":"18","author":"Chu","year":"1993","journal-title":"MRS Bull."},{"key":"ol-51-18-5068-R12","doi-asserted-by":"publisher","first-page":"1","DOI":"10.1016\/j.mser.2015.05.001","type":"journal-article","volume":"94","author":"Polyakov","year":"2015","journal-title":"Mater. Sci. Eng. R Rep."},{"key":"ol-51-18-5068-R13","doi-asserted-by":"publisher","first-page":"1277","DOI":"10.1109\/JSTQE.2004.837735","type":"journal-article","volume":"10","author":"Tomiya","year":"2004","journal-title":"IEEE J. Sel. Top. Quantum Electron."},{"key":"ol-51-18-5068-R14","doi-asserted-by":"publisher","first-page":"1747","DOI":"10.1016\/j.microrel.2011.07.038","type":"journal-article","volume":"51","author":"Trivellin","year":"2011","journal-title":"Microelectron. Reliab."},{"key":"ol-51-18-5068-R15","doi-asserted-by":"publisher","first-page":"356","DOI":"10.1109\/LED.2009.2014570","type":"journal-article","volume":"30","author":"Meneghini","year":"2009","journal-title":"IEEE Electron Device Lett."},{"key":"ol-51-18-5068-R16","doi-asserted-by":"publisher","first-page":"1700132","DOI":"10.1002\/pssr.201700132","type":"journal-article","volume":"11","author":"Mura","year":"2017","journal-title":"Phys. Status Solidi RRL"},{"key":"ol-51-18-5068-R17","doi-asserted-by":"publisher","first-page":"171106","DOI":"10.1063\/5.0216168","type":"journal-article","volume":"125","author":"Huang","year":"2024","journal-title":"Appl. Phys. Lett."},{"key":"ol-51-18-5068-R18","doi-asserted-by":"publisher","first-page":"4959","DOI":"10.1007\/s11664-018-6144-6","type":"journal-article","volume":"47","author":"Tomm","year":"2018","journal-title":"J. Electron. Mater."}],"container-title":["Optics Letters"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/opg.optica.org\/viewmedia.cfm?URI=ol-51-18-5068&seq=0","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,3]],"date-time":"2026-09-03T16:36:15Z","timestamp":1788453375000},"score":1,"resource":{"primary":{"URL":"https:\/\/opg.optica.org\/abstract.cfm?URI=ol-51-18-5068"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9,3]]},"references-count":18,"journal-issue":{"issue":"18","published-online":{"date-parts":[[2026]]},"published-print":{"date-parts":[[2026]]}},"URL":"https:\/\/doi.org\/10.1364\/ol.611775","relation":{},"ISSN":["0146-9592","1539-4794"],"issn-type":[{"value":"0146-9592","type":"print"},{"value":"1539-4794","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,9,3]]},"assertion":[{"value":"Optica Publishing Group","name":"publisher","label":"This article is maintained by"},{"value":"https:\/\/doi.org\/10.1364\/OL.611775","name":"articlelink","label":"Crossref DOI link to publisher maintained version"},{"value":"letter","name":"content_type","label":"Article type"},{"value":"Screened by Similarity Check","name":"cross_check","label":"Similarity check"},{"value":"Yes","order":0,"name":"peer_reviewed","label":"Peer reviewed","group":{"name":"peer_review","label":"Peer review"}},{"value":"Single blind","order":1,"name":"review_process","label":"Review process","group":{"name":"peer_review","label":"Peer review"}},{"value":"21 July 2026","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"20 August 2026","order":1,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"3 September 2026","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}},{"value":"\u00a9 2026 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.","name":"copyright","label":"Copyright"}]}}