{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,24]],"date-time":"2026-02-24T18:32:07Z","timestamp":1771957927567,"version":"3.50.1"},"reference-count":0,"publisher":"Walter de Gruyter GmbH","issue":"4","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,8,28]]},"abstract":"<jats:title>Abstract<\/jats:title>\n               <jats:p>Stochastic computing is an old and\nunconventional computing technique that is finding promising new\napplications in image processing and the handling of complex\nerror-correcting codes. Stochastic\ncircuits offer an alternative to conventional digital circuits because of\ntheir extremely small size and inherent noise tolerance.\nThey are also well-suited to meeting the requirements\nof emerging nanoscale technologies where\nnon-deterministic behavior due to manufacturing defects\nand soft errors cannot be ignored. Error analysis of\nstochastic circuits, however, has\nreceived little attention and remains a largely open\nproblem, especially when multiple errors affecting both\nthe data sources and the stochastic circuits can occur in the course of\na computation. This paper attempts to analyze stochastic\ncircuits under various error conditions, and to compare\ntheir behavior to that of conventional circuits under similar error\nconditions. We use probabilistic transfer matrices for\nthis analysis, complemented by circuit\nsimulation. Our results indicate that stochastic\ncircuits provide significantly better error tolerance under severe error\nconditions.<\/jats:p>","DOI":"10.1515\/itit-2013-1042","type":"journal-article","created":{"date-parts":[[2014,5,27]],"date-time":"2014-05-27T12:06:20Z","timestamp":1401192380000},"page":"182-191","source":"Crossref","is-referenced-by-count":8,"title":["Behavior of stochastic circuits under severe error conditions"],"prefix":"10.1515","volume":"56","author":[{"given":"Te-Hsuan","family":"Chen","sequence":"first","affiliation":[{"name":"Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Armin","family":"Alaghi","sequence":"additional","affiliation":[{"name":"Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John P.","family":"Hayes","sequence":"additional","affiliation":[{"name":"Advanced Computer Architecture Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan , Ann Arbor , USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"374","published-online":{"date-parts":[[2014,7,21]]},"container-title":["it - Information Technology"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.degruyter.com\/document\/doi\/10.1515\/itit-2013-1042\/xml","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/www.degruyter.com\/document\/doi\/10.1515\/itit-2013-1042\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,6,23]],"date-time":"2021-06-23T11:43:06Z","timestamp":1624448586000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.degruyter.com\/document\/doi\/10.1515\/itit-2013-1042\/html"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7,21]]},"references-count":0,"journal-issue":{"issue":"4","published-online":{"date-parts":[[2014,7,21]]},"published-print":{"date-parts":[[2014,8,28]]}},"alternative-id":["10.1515\/itit-2013-1042"],"URL":"https:\/\/doi.org\/10.1515\/itit-2013-1042","relation":{},"ISSN":["2196-7032","1611-2776"],"issn-type":[{"value":"2196-7032","type":"electronic"},{"value":"1611-2776","type":"print"}],"subject":[],"published":{"date-parts":[[2014,7,21]]}}}