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In this work an Abstraction NBTI model is introduced reducing the state space of trap-based NBTI models using two abstraction parameters, applying a state transformation to incorporate variable stress conditions. This transformation is faster than traditional approaches. Currently the conversion into estimated threshold voltage damages is a very time consuming process.<\/jats:p>","DOI":"10.1515\/itit-2021-0005","type":"journal-article","created":{"date-parts":[[2021,9,16]],"date-time":"2021-09-16T23:37:31Z","timestamp":1631835451000},"page":"299-310","source":"Crossref","is-referenced-by-count":1,"title":["Abstraction NBTI model"],"prefix":"10.1515","volume":"63","author":[{"given":"Stephan","family":"Adolf","sequence":"first","affiliation":[{"name":"Carl von Ossietzky University of Oldenburg , Department of Computer Science, Division of Embedded Hardware\/Software Systems , Oldenburg , Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wolfgang","family":"Nebel","sequence":"additional","affiliation":[{"name":"Carl von Ossietzky University of Oldenburg , Department of Computer Science, Division of Embedded Hardware\/Software Systems , Oldenburg , Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"374","published-online":{"date-parts":[[2021,9,17]]},"reference":[{"key":"2023033120083238020_j_itit-2021-0005_ref_001","doi-asserted-by":"crossref","unstructured":"H. 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