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For decades, a power-law has been used to describe the dependence of material-specific critical electrical field (<jats:inline-formula><jats:alternatives><jats:tex-math>$${\\mathcal{E}}_{\\text{crit}}$$<\/jats:tex-math><mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\">\n                  <mml:msub>\n                    <mml:mi>E<\/mml:mi>\n                    <mml:mtext>crit<\/mml:mtext>\n                  <\/mml:msub>\n                <\/mml:math><\/jats:alternatives><\/jats:inline-formula>) at which the material breaks down and bandgap (<jats:italic>E<\/jats:italic><jats:sub><jats:italic>g<\/jats:italic><\/jats:sub>)<jats:italic>.<\/jats:italic> The relationship is often used to gauge tradeoffs of emerging materials whose properties haven\u2019t yet been determined. Unfortunately, the reported dependencies of <jats:inline-formula><jats:alternatives><jats:tex-math>$${\\mathcal{E}}_{\\text{crit}}$$<\/jats:tex-math><mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\">\n                  <mml:msub>\n                    <mml:mi>E<\/mml:mi>\n                    <mml:mtext>crit<\/mml:mtext>\n                  <\/mml:msub>\n                <\/mml:math><\/jats:alternatives><\/jats:inline-formula> on <jats:italic>E<\/jats:italic><jats:sub><jats:italic>g<\/jats:italic><\/jats:sub> cover a surprisingly wide range in the literature. Moreover, <jats:inline-formula><jats:alternatives><jats:tex-math>$${\\mathcal{E}}_{\\text{crit}}$$<\/jats:tex-math><mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\">\n                  <mml:msub>\n                    <mml:mi>E<\/mml:mi>\n                    <mml:mtext>crit<\/mml:mtext>\n                  <\/mml:msub>\n                <\/mml:math><\/jats:alternatives><\/jats:inline-formula> is a function of material doping. Further, discrepancies arise in <jats:inline-formula><jats:alternatives><jats:tex-math>$${\\mathcal{E}}_{\\text{crit}}$$<\/jats:tex-math><mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\">\n                  <mml:msub>\n                    <mml:mi>E<\/mml:mi>\n                    <mml:mtext>crit<\/mml:mtext>\n                  <\/mml:msub>\n                <\/mml:math><\/jats:alternatives><\/jats:inline-formula> values owing to differences between punch-through and non-punch-through device structures. We report a new normalization procedure that enables comparison of critical electric field values across materials, doping, and different device types. An extensive examination of numerous references reveals that the dependence <jats:inline-formula><jats:alternatives><jats:tex-math>$${\\mathcal{E}}_{\\text{crit}}$$<\/jats:tex-math><mml:math xmlns:mml=\"http:\/\/www.w3.org\/1998\/Math\/MathML\">\n                  <mml:msub>\n                    <mml:mi>E<\/mml:mi>\n                    <mml:mtext>crit<\/mml:mtext>\n                  <\/mml:msub>\n                <\/mml:math><\/jats:alternatives><\/jats:inline-formula> \u221d <jats:italic>E<\/jats:italic><jats:sub><jats:italic>g<\/jats:italic><\/jats:sub><jats:sup>1.83<\/jats:sup> best fits the most reliable and newest data for both direct and indirect semiconductors.<\/jats:p>\n                <jats:p><jats:bold>Graphical abstract<\/jats:bold><\/jats:p>","DOI":"10.1557\/s43578-021-00465-2","type":"journal-article","created":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T18:22:25Z","timestamp":1643739745000},"page":"849-865","update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":81,"title":["Analysis of the dependence of critical electric field on semiconductor bandgap"],"prefix":"10.1557","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9882-407X","authenticated-orcid":false,"given":"Oleksiy","family":"Slobodyan","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jack","family":"Flicker","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jeramy","family":"Dickerson","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jonah","family":"Shoemaker","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Andrew","family":"Binder","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Trevor","family":"Smith","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Stephen","family":"Goodnick","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Robert","family":"Kaplar","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mark","family":"Hollis","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2022,2,1]]},"reference":[{"issue":"2","key":"465_CR1","doi-asserted-by":"publisher","first-page":"287","DOI":"10.1109\/jproc.2007.911060","volume":"96","author":"UK Mishra","year":"2008","unstructured":"U.K. Mishra, L. 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