{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T16:51:02Z","timestamp":1648659062084},"reference-count":5,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"11","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2013]]},"DOI":"10.1587\/elex.10.20130328","type":"journal-article","created":{"date-parts":[[2013,5,27]],"date-time":"2013-05-27T22:55:37Z","timestamp":1369695337000},"page":"20130328-20130328","source":"Crossref","is-referenced-by-count":1,"title":["A 6-bit 1GS\/s DAC using an area efficient switching scheme for gradient-error tolerance"],"prefix":"10.1587","volume":"10","author":[{"given":"Haonan","family":"Wang","sequence":"first","affiliation":[{"name":"Shanghai Research Institute of Microelectronics (SHRIME), Peking University"},{"name":"School of Information Science and Technology, Peking University"}]},{"given":"Yufeng","family":"Yao","sequence":"additional","affiliation":[{"name":"Shanghai Research Institute of Microelectronics (SHRIME), Peking University"}]},{"given":"Tao","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Research Institute of Microelectronics (SHRIME), Peking University"}]},{"given":"Hui","family":"Wang","sequence":"additional","affiliation":[{"name":"Shanghai Research Institute of Microelectronics (SHRIME), Peking University"}]},{"given":"Yuhua","family":"Cheng","sequence":"additional","affiliation":[{"name":"Shanghai Research Institute of Microelectronics (SHRIME), Peking University"},{"name":"School of Information Science and Technology, Peking University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] M. Onabajo and J. Silva-Martinesz: <i>Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip <\/i>(Springer, New York, 2012).","DOI":"10.1007\/978-1-4614-2296-9"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/4.736651"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] Y. Cong and R. Geiger: IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process. <b>47<\/b> [7] (2000) 585.","DOI":"10.1109\/82.850417"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] J. Deveugele, G. Van der Plas, M. Steyaert, G. Gielen and W. Sansen: IEEE Trans. Circuits Syst. <b>51<\/b> [1] (2004) 191.","DOI":"10.1109\/TCSI.2003.821307"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] M. J. M. Pelgrom, A. C. J. Duinmaijer and A. P. G. Welber: IEEE J. Solid-State Circuits <b>24<\/b> [5] (1989) 1433.","DOI":"10.1109\/JSSC.1989.572629"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/10\/11\/10_10.20130328\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T17:34:43Z","timestamp":1619199283000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/10\/11\/10_10.20130328\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013]]},"references-count":5,"journal-issue":{"issue":"11","published-print":{"date-parts":[[2013]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.10.20130328","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013]]}}}