{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,2]],"date-time":"2025-05-02T04:10:17Z","timestamp":1746159017572,"version":"3.40.4"},"reference-count":7,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"3","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2014]]},"DOI":"10.1587\/elex.11.20131011","type":"journal-article","created":{"date-parts":[[2014,1,13]],"date-time":"2014-01-13T23:08:27Z","timestamp":1389654507000},"page":"20131011-20131011","source":"Crossref","is-referenced-by-count":0,"title":["High-resolution and all-digital on-chip delay measurement with low supply sensitivity for SoC applications"],"prefix":"10.1587","volume":"11","author":[{"given":"Duo","family":"Sheng","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Fu Jen Catholic University"}]},{"given":"Ching-Che","family":"Chung","sequence":"additional","affiliation":[{"name":"Department of Computer Science & Information Engineering, National Chung-Cheng University"}]},{"given":"Hsiu-Fan","family":"Lai","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Fu Jen Catholic University"}]},{"given":"Shu-Syun","family":"Jhao","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Fu Jen Catholic University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2161353"},{"key":"2","unstructured":"[2] A. Jain, A. Veggetti, D. Crippa and P. Rolandi: ETS Tech. Dig. Papers (2012) 1."},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1587\/transele.E95.C.627"},{"key":"4","unstructured":"[4] K. Katoh, K. Namba and H. Ito: ATS Tech. Dig. Papers (2010) 343."},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2024699"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1049\/el.2012.0371"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1159\/000323397"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/11\/3\/11_11.20131011\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T19:09:21Z","timestamp":1619204961000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/11\/3\/11_11.20131011\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014]]},"references-count":7,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2014]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.11.20131011","relation":{},"ISSN":["1349-2543"],"issn-type":[{"type":"electronic","value":"1349-2543"}],"subject":[],"published":{"date-parts":[[2014]]}}}