{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,2]],"date-time":"2022-04-02T22:20:40Z","timestamp":1648938040930},"reference-count":5,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"23","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2014]]},"DOI":"10.1587\/elex.11.20140995","type":"journal-article","created":{"date-parts":[[2014,11,18]],"date-time":"2014-11-18T23:18:02Z","timestamp":1416352682000},"page":"20140995-20140995","source":"Crossref","is-referenced-by-count":1,"title":["Nonlinear inter-stage gain calibration for pipelined ADCs employing double dithering modes"],"prefix":"10.1587","volume":"11","author":[{"given":"Fan","family":"Chaojie","sequence":"first","affiliation":[{"name":"School of Microelectronics, Shanghai Jiaotong University"}]},{"given":"Wang","family":"Ke","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Shanghai Jiaotong University"}]},{"given":"Pan","family":"Wenjie","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Shanghai Jiaotong University"}]},{"given":"Zhou","family":"Jianjun","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Shanghai Jiaotong University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] L. X. Shi, W. Zhao, J. H. Wu and C. Chen: IEEE Trans. Circuits Syst. II, Exp. Briefs <b>59<\/b> (2012) 239. DOI:10.1109\/TCSII.2012.2188461","DOI":"10.1109\/TCSII.2012.2188461"},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] A. Panigada and I. Galton: IEEE Trans. Circuits Syst. I, Reg. Papers <b>53<\/b> (2006) 1885. DOI:10.1109\/TCSI.2006.880034","DOI":"10.1109\/TCSI.2006.880034"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] C. J. Fan, Y. X. Lu, K. Wang and J. J. Zhou: IEICE Electron. Express <b>11<\/b> (2014) 20140442. DOI:10.1587\/elex.11.20140442","DOI":"10.1587\/elex.11.20140442"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] Y. S. Shu and B. S. Song: IEEE J. Solid-State Circuits <b>43<\/b> (2008) 342. DOI:10.1109\/JSSC.2007.914260","DOI":"10.1109\/JSSC.2007.914260"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] H. van der Ploeg, G. Hoogzaad, H. A. H. Termeer, M. Vertregt and R. L. J. Roover: IEEE J. Solid-State Circuits <b>36<\/b> (2001) 1859. DOI:10.1109\/4.972136","DOI":"10.1109\/4.972136"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/11\/23\/11_11.20140995\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T19:25:29Z","timestamp":1619205929000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/11\/23\/11_11.20140995\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014]]},"references-count":5,"journal-issue":{"issue":"23","published-print":{"date-parts":[[2014]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.11.20140995","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014]]}}}