{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T13:37:42Z","timestamp":1774964262536,"version":"3.50.1"},"reference-count":6,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"23","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2014]]},"DOI":"10.1587\/elex.11.20141000","type":"journal-article","created":{"date-parts":[[2014,11,6]],"date-time":"2014-11-06T23:46:29Z","timestamp":1415317589000},"page":"20141000-20141000","source":"Crossref","is-referenced-by-count":19,"title":["A hybrid threshold self-compensation rectifier for RF energy harvesting"],"prefix":"10.1587","volume":"11","author":[{"given":"Lianxi","family":"Liu","sequence":"first","affiliation":[{"name":"School of Microelectronics, Xidian University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junchao","family":"Mu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ning","family":"Ma","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhangming","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Xidian University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] T. Umeda, H. Yoshida, S. Sekine, Y. Fujita, T. Suzuki and S. Otaka: IEEE J. Solid-State Circuits <b>41<\/b> (2006) 35. DOI:10.1109\/JSSC.2005.858620","DOI":"10.1109\/JSSC.2005.858620"},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] B. Li, X. Shao, N. Shahshahan, N. Goldsman, T. Salter and G. M. Metze: IEEE Trans. Circuits Syst. I, Reg. Papers <b>60<\/b> (2013) 3256. DOI:10.1109\/TCSI.2013.2264712","DOI":"10.1109\/TCSI.2013.2264712"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] A. Shameli, A. Safarian, A. Rofougaran, M. Rofougaran and F. De Flaviis: IEEE Trans. Microw. Theory Techn. <b>55<\/b> (2007) 1089. DOI:10.1109\/TMTT.2007.896819","DOI":"10.1109\/TMTT.2007.896819"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] G. Papotto, F. Carrara and G. Palmisano: IEEE J. Solid-State Circuits <b>46<\/b> (2011) 1985. DOI:10.1109\/JSSC.2011.2157010","DOI":"10.1109\/JSSC.2011.2157010"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] Y. Osaki, T. Hirose, N. Kuroki and M. Numa: IEEE J. Solid-State Circuits <b>48<\/b> (2013) 1530. DOI:10.1109\/JSSC.2013.2252523","DOI":"10.1109\/JSSC.2013.2252523"},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] J. Cui, J. Akita and A. Kitagawa: IEICE Electron. Express <b>7<\/b> (2010) 1086. DOI:10.1587\/elex.7.1086","DOI":"10.1587\/elex.7.1086"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/11\/23\/11_11.20141000\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,4,23]],"date-time":"2021-04-23T19:25:30Z","timestamp":1619205930000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/11\/23\/11_11.20141000\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014]]},"references-count":6,"journal-issue":{"issue":"23","published-print":{"date-parts":[[2014]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.11.20141000","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014]]}}}