{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T02:40:02Z","timestamp":1747708802058,"version":"3.40.5"},"reference-count":7,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"5","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2015]]},"DOI":"10.1587\/elex.12.20150023","type":"journal-article","created":{"date-parts":[[2015,2,26]],"date-time":"2015-02-26T07:55:39Z","timestamp":1424937339000},"page":"20150023-20150023","source":"Crossref","is-referenced-by-count":1,"title":["Complex permittivity extraction from PCB stripline measurement using recessed probe launch"],"prefix":"10.1587","volume":"12","author":[{"given":"Chulsoon","family":"Hwang","sequence":"first","affiliation":[{"name":"Global Technology Center, Samsung Electronics"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Woocheon","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Ajou University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dong Gun","family":"Kam","sequence":"additional","affiliation":[{"name":"Department of Electronics Engineering, Ajou University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] J. Song, F. Ling, G. Flynn, W. Blood and E. Demircan: Proc. EPEP (2001) 129. DOI:10.1109\/EPEP.2001.967628","DOI":"10.1109\/EPEP.2001.967628"},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] A. Mangan, S. P. Voinigescu, M. Yang and M. Tazlauanu: IEEE Trans. Electron Dev. <b>53<\/b> (2006) 235. DOI:10.1109\/TED.2005.861726","DOI":"10.1109\/TED.2005.861726"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] N. Erickson, K. Shringarpure, J. Fan, B. Achkir, S. Pan and C. Hwang: Proc. EMCS (2013) 840.","DOI":"10.1109\/ISEMC.2013.6670527"},{"key":"4","unstructured":"[4] Y. Kwark, C. Schuster, L. Shan, C. Baks and J. Trewhella: Proc. DesignCon (2005) 6-TA3."},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] M. Kotzev, R. Rimolo-Donadio, Y. H. Kwark, C. W. Baks, X. Gu and C. Schuster: IEEE Trans. Instrum. Meas. <b>61<\/b> (2012) 3198. DOI:10.1109\/TIM.2012.2211471","DOI":"10.1109\/TIM.2012.2211471"},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] Y. Eo and W. R. Eisenstadt: IEEE Trans. Microw. Theory Techn. <b>16<\/b> (1993) 555. DOI:10.1109\/33.239889","DOI":"10.1109\/33.239889"},{"key":"7","doi-asserted-by":"crossref","unstructured":"[7] T. K. Sarkar and O. Pereira: IEEE Antennas Propag. Mag. <b>37<\/b> [1] (1995) 48. DOI:10.1109\/74.370583","DOI":"10.1109\/74.370583"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/12\/5\/12_12.20150023\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T01:58:07Z","timestamp":1747706287000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/12\/5\/12_12.20150023\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015]]},"references-count":7,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2015]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.12.20150023","relation":{},"ISSN":["1349-2543"],"issn-type":[{"type":"electronic","value":"1349-2543"}],"subject":[],"published":{"date-parts":[[2015]]}}}