{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,3]],"date-time":"2022-04-03T21:27:21Z","timestamp":1649021241305},"reference-count":12,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.12.20150938","type":"journal-article","created":{"date-parts":[[2015,12,17]],"date-time":"2015-12-17T22:13:44Z","timestamp":1450390424000},"page":"20150938-20150938","source":"Crossref","is-referenced-by-count":0,"title":["Baseband signal processing of digital phosphor technology with high accuracy"],"prefix":"10.1587","volume":"13","author":[{"given":"Jinguang","family":"Hao","sequence":"first","affiliation":[{"name":"School of Information and Electrical Engineering, Ludong University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kai","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Southeast University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenjiang","family":"Pei","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Southeast University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yili","family":"Xia","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Southeast University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","unstructured":"[1] Tektronix: DPX Acquisition Technology for Spectrum Analyzers Fundamentals Primer (2009)."},{"key":"2","unstructured":"[2] Rohde and Schwarz: Implementation of Real-Time Spectrum Analysis (2011)."},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] S. Guo, J. Su, G. Sun and Z. Zhao: IEICE Electron. Express <b>10<\/b> (2013) 20130657. DOI:10.1587\/elex.10.20130657","DOI":"10.1587\/elex.10.20130657"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] C. J. Kief, M. S. Pattichis, L. H. Pollard, G. A. Vera and J. E. Parra: Comput. Appl. Eng. Educ. <b>17<\/b> [2] (2009) 232. DOI:10.1002\/cae.20192","DOI":"10.1002\/cae.20192"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] J. Palmer and B. Nelson: Lect. Notes Comput. Sci. <b>3203<\/b> (2004) 948. DOI:10.1007\/978-3-540-30117-2_105","DOI":"10.1007\/978-3-540-30117-2_105"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] M. Ayinala, M. Brown and K. K. Parhi: IEEE Trans. Very Large Scale Integr. (VLSI) Syst. <b>20<\/b> (2012) 1068. DOI:10.1109\/TVLSI.2011.2147338","DOI":"10.1109\/TVLSI.2011.2147338"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] Y. C. Lim and B. Farhang-Boroujeny: IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process. <b>39<\/b> (1992) 316. DOI:10.1109\/82.142033","DOI":"10.1109\/82.142033"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] F. C. Diniz, I. Kothe, S. L. Netto and L. W. Biscainho: EURASIP J. Appl. Signal Process. <b>1<\/b> (2007) 164. DOI:10.1155\/2007\/94704","DOI":"10.1155\/2007\/94704"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] K. G. Smitha and A. P. Vinod: IEEE Trans. Very Large Scale Integr. (VLSI) Syst. <b>20<\/b> (2012) 1323. DOI:10.1109\/TVLSI.2011.2151214","DOI":"10.1109\/TVLSI.2011.2151214"},{"key":"10","doi-asserted-by":"publisher","unstructured":"[10] S. J. Darak, S. K. P. Gopi, V. Prasad and E. K. Lai: IEEE Trans. Very Large Scale Integr. (VLSI) Syst. <b>22<\/b> (2014) 1202. DOI:10.1109\/TVLSI.2013.2263813","DOI":"10.1109\/TVLSI.2013.2263813"},{"key":"11","unstructured":"[11] National Instruments Corporation: National Instruments products http:\/\/www.ni.com\/modularinstruments\/."},{"key":"12","doi-asserted-by":"crossref","unstructured":"[12] Y. C. Lim and B. Farhang-Boroujeny: ISCAS (1994) 509. DOI:10.1109\/ISCAS.1994.409037","DOI":"10.1109\/ISCAS.1994.409037"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/2\/13_12.20150938\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T01:57:13Z","timestamp":1498269433000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/2\/13_12.20150938\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":12,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.12.20150938","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}