{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T19:02:49Z","timestamp":1649098969732},"reference-count":11,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"1","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.12.20150984","type":"journal-article","created":{"date-parts":[[2015,12,16]],"date-time":"2015-12-16T00:06:55Z","timestamp":1450224415000},"page":"20150984-20150984","source":"Crossref","is-referenced-by-count":1,"title":["Clustering data according to update frequency to reduce garbage-collection overhead in solid-state drives"],"prefix":"10.1587","volume":"13","author":[{"given":"Jaehyun","family":"Kim","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Seoul National University of Science & Technology"}]},{"given":"Ilhoon","family":"Shin","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Seoul National University of Science & Technology"}]}],"member":"532","reference":[{"key":"1","unstructured":"[1] N. Agrawal, V. Prabhakaran, T. Wobber, J. Davis, M. Manasse and R. Panigrahy: Proc. of USENIX Annual Technical Conference (2008) 57."},{"key":"2","unstructured":"[2] A. Kawaguchi, S. Nishioka and H. Motoda: Proc. of USENIX Annual Technical Conference (1995) 155."},{"key":"3","unstructured":"[3] A. Ban: United States Patent, No. 5,404,485 (1995)."},{"key":"4","unstructured":"[4] A. Ban: United States Patent, No. 5,937,425 (1999)."},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] J. Kim, J. M. Kim, S. Noh, S. L. Min and Y. Cho: IEEE Trans. Consum. Electron. <b>48<\/b> (2002) 366. DOI:10.1109\/TCE.2002.1010143","DOI":"10.1109\/TCE.2002.1010143"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] S. W. Lee, D. J. Park, T. S. Chung, D. H. Lee, S. W. Park and H. J. Song: ACM Trans. Embed. Comput. Syst. <b>6<\/b> (2007) 18. DOI:10.1145\/1275986.1275990","DOI":"10.1145\/1275986.1275990"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] I. Shin and Y. Shin: IEICE Electron. Express <b>11<\/b> (2014) 20130942. DOI:10.1587\/elex.10.20130942","DOI":"10.1587\/elex.10.20130942"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] I. Shin: IEICE Trans. Inf. &amp; Syst. <b>E97-D<\/b> (2014) 2844. DOI:10.1587\/transinf.2014EDP7075","DOI":"10.1587\/transinf.2014EDP7075"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] I. Shin: IEEE Trans. Consum. Electron. <b>57<\/b> (2011) 1728. DOI:10.1109\/TCE.2011.6131147","DOI":"10.1109\/TCE.2011.6131147"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] T. Jung, Y. Lee, J. Woo and I. Shin: Lecture Notes in Electrical Engineering <b>279<\/b> (2014) 141. DOI:10.1007\/978-3-642-41674-3_21","DOI":"10.1007\/978-3-642-41674-3_21"},{"key":"11","unstructured":"[11] The OpenSSD Project: http:\/\/www.openssd-project.org\/wiki\/The_OpenSSD_Project."}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/1\/13_12.20150984\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T01:41:56Z","timestamp":1498268516000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/1\/13_12.20150984\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":11,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.12.20150984","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}