{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,6,15]],"date-time":"2024-06-15T04:37:41Z","timestamp":1718426261388},"reference-count":19,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.12.20151006","type":"journal-article","created":{"date-parts":[[2015,12,17]],"date-time":"2015-12-17T22:13:44Z","timestamp":1450390424000},"page":"20151006-20151006","source":"Crossref","is-referenced-by-count":2,"title":["A novel progressive trigger method of di\/dt control for MOSFET"],"prefix":"10.1587","volume":"13","author":[{"given":"Jiangping","family":"He","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bo","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gao","family":"Pan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qing","family":"Hua","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] L. Feng and D. Y. Chen: IEEE Trans. Power Electron. <b>9<\/b> (1994) 132. DOI:10.1109\/63.285504","DOI":"10.1109\/63.285504"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] A. Consoli, S. Musumeci, G. Oriti and A. Testa: IEEE Trans. Electromagn. Compat. <b>38<\/b> (1996) 567. DOI:10.1109\/15.544311","DOI":"10.1109\/15.544311"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] K. Mainali and R. Oruganti: IEEE Trans. Power Electron. <b>25<\/b> (2010) 2344. DOI:10.1109\/TPEL.2010.2047734","DOI":"10.1109\/TPEL.2010.2047734"},{"key":"4","unstructured":"[4] J. P. Berry: Power Electron. Appl. Symp. Mater. Devices Power Electron (1991) 131."},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] S. Takizawa, S. Igarashi and K. Kuroki: IEEE PESC\u201902 (1998) 1442. DOI:10.1109\/PESC.1998.703241","DOI":"10.1109\/PESC.1998.703241"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] C. Licitra, S. Musumeci, A. Raciti, A. U. Galluzzo, R. Letor and M. Melito: IEEE Trans. Power Electron. <b>10<\/b> (1995) 373. DOI:10.1109\/63.388004","DOI":"10.1109\/63.388004"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] B. Wittig and F. W. Fuchs: IEEE Trans. Power Electron. <b>27<\/b> (2012) 1632. DOI:10.1109\/TPEL.2011.2162531","DOI":"10.1109\/TPEL.2011.2162531"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] S. Park and T. M. Jahns: IEEE Trans. Ind. Appl. <b>39<\/b> (2003) 657. DOI:10.1109\/TIA.2003.810654","DOI":"10.1109\/TIA.2003.810654"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] N. Idir, R. Bausiere and J. J. Franchaud: IEEE Trans. Power Electron. <b>21<\/b> (2006) 849. DOI:10.1109\/TPEL.2007.876895","DOI":"10.1109\/TPEL.2007.876895"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] M. Rose, J. Krupar and H. Hauswald: IEEE ECCE (2010) 927. DOI:10.1109\/ECCE.2010.5617892","DOI":"10.1109\/ECCE.2010.5617892"},{"key":"11","doi-asserted-by":"crossref","unstructured":"[11] C. Gerster, P. Hofer and N. Karrer: IEEE PESC\u201902 (1996) 1739. DOI:10.1109\/PESC.1996.548815","DOI":"10.1109\/PESC.1996.548815"},{"key":"12","doi-asserted-by":"publisher","unstructured":"[12] L. Yanick and W. K. Johann: IEEE Trans. Power Electron. <b>30<\/b> (2015) 3402. DOI:10.1109\/TPEL.2014.2332811","DOI":"10.1109\/TPEL.2014.2332811"},{"key":"13","doi-asserted-by":"publisher","unstructured":"[13] Q. Hua, L. Zehong, Q. Xi, Z. Bo and F. Yexiang: IEICE Electron. Express <b>12<\/b> (2015) 20150189. DOI:10.1587\/elex.12.20150189","DOI":"10.1587\/elex.12.20150189"},{"key":"14","doi-asserted-by":"crossref","unstructured":"[14] W. Zhiqiang, S. Xiaojie, L. M. Tolbert and B. J. Blalock: IEEE APEC <b>21<\/b> (2013) 1266. DOI:10.1109\/APEC.2013.6520462","DOI":"10.1109\/APEC.2013.6520462"},{"key":"15","doi-asserted-by":"publisher","unstructured":"[15] J. E. Makaran: IEEE Trans. Power Electron. <b>25<\/b> (2010) 1339. DOI:10.1109\/TPEL.2009.2037905","DOI":"10.1109\/TPEL.2009.2037905"},{"key":"16","doi-asserted-by":"crossref","unstructured":"[16] T. Shimizu and K. Wada: IEEE ICPE\u201907 (2007) 857. DOI:10.1109\/ICPE.2007.4692507","DOI":"10.1109\/ICPE.2007.4692507"},{"key":"17","doi-asserted-by":"publisher","unstructured":"[17] H. Riazmontazer and S. K. Mazumder: IEEE Trans. Power Electron. <b>30<\/b> (2015) 2338. DOI:10.1109\/TPEL.2014.2327014","DOI":"10.1109\/TPEL.2014.2327014"},{"key":"18","doi-asserted-by":"crossref","unstructured":"[18] Z. Ivanovic, B. Blanusa and M. Knezic: ICAT\u201911 XXIII Int. Symp. (2011) 6. DOI:10.1109\/ICAT.2011.6102129","DOI":"10.1109\/ICAT.2011.6102129"},{"key":"19","unstructured":"[19] W. Eberle: Ph.D thesis Queen\u2019s University Kingston, Ontario, Canada (2008)."}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/2\/13_12.20151006\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T01:57:13Z","timestamp":1498269433000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/2\/13_12.20151006\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":19,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.12.20151006","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}