{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T11:02:07Z","timestamp":1648810927922},"reference-count":10,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"7","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.13.20150951","type":"journal-article","created":{"date-parts":[[2016,1,17]],"date-time":"2016-01-17T22:05:13Z","timestamp":1453068313000},"page":"20150951-20150951","source":"Crossref","is-referenced-by-count":3,"title":["Variation-resilient pipelined timing tracking circuit for SRAM sense amplifier"],"prefix":"10.1587","volume":"13","author":[{"given":"Zhengping","family":"Li","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Anhui University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunyu","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Anhui University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wenjuan","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Anhui University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijun","family":"Guan","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Anhui University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Youwu","family":"Tao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Anhui University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xincun","family":"Ji","sequence":"additional","affiliation":[{"name":"College of Electronic Science and Engineering, Nanjing University of Posts and Telecommunications"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Junning","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Anhui University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] Y.-C. Lai and S.-Y. Huang: IEEE J. Solid-State Circuits <b>44<\/b> (2009) 642. DOI:10.1109\/JSSC.2008.2011042","DOI":"10.1109\/JSSC.2008.2011042"},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] A. Kawasumi, Y. Takeyama, O. Hirabayashi, K. Kushida, F. Tachibana, Y. Niki, S. Sasaki and T. Yabe: Proc. Symp. VLSI Circuits Dig. (2012) 100. DOI:10.1109\/VLSIC.2012.6243809","DOI":"10.1109\/VLSIC.2012.6243809"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] B. Amrutur and M. A. Horowitz: IEEE J. Solid-State Circuits <b>33<\/b> (1998) 1208. DOI:10.1109\/4.705359","DOI":"10.1109\/4.705359"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] U. Arslan, M. P. McCartney, M. Bhargava, X. Li, K. Mai and L. T. Pileggi: Proc. IEEE Custom Integr. Circuits Conf. (CICC2008) (2008) 415. DOI:10.1109\/CICC.2008.4672108","DOI":"10.1109\/CICC.2008.4672108"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] W. Lu, C. Peng, Y. Tao and Z. Li: Electron. Lett. <b>51<\/b> (2015) 742. DOI:10.1049\/el.2015.0574","DOI":"10.1049\/el.2015.0574"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] Y. Li, L. Wen, Y. Zhang, X. Cheng, J. Han, Z. Yu and X. Zeng: IEICE Electron. Express <b>11<\/b> (2014) 20130992. DOI:10.1587\/elex.11.20130992","DOI":"10.1587\/elex.11.20130992"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] C. Peng, Y. Tao, W. Lu, Z. Li, X. Ji, J. Yan and J. Chen: IEICE Electron. Express <b>12<\/b> (2015) 20150102. DOI:10.1587\/elex.12.20150102","DOI":"10.1587\/elex.12.20150102"},{"key":"8","doi-asserted-by":"crossref","unstructured":"[8] S. Komatsu, M. Yamaoka, M. Morimoto, N. Maeda, Y. Shimazaki and K. Osada: Proc. IEEE Custom Integr. Circuits Conf. (CICC2009) (2009) 701. DOI:10.1109\/CICC.2009.5280731","DOI":"10.1109\/CICC.2009.5280731"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] Y. Niki, A. Kawasumi, A. Suzuki, Y. Takeyama, O. Hirabayashi, K. Kushida, F. Tachibana, Y. Fujimura and T. Yabe: IEEE J. Solid-State Circuits <b>46<\/b> (2011) 2545. DOI:10.1109\/JSSC.2011.2164294","DOI":"10.1109\/JSSC.2011.2164294"},{"key":"10","doi-asserted-by":"publisher","unstructured":"[10] J. Wu, J. Zhu, Y. Xia and N. Bai: IEEE Trans. Circuits Syst. II, Exp. Briefs <b>61<\/b> (2014) 264. DOI:10.1109\/TCSII.2014.2304893","DOI":"10.1109\/TCSII.2014.2304893"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/7\/13_13.20150951\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T03:55:32Z","timestamp":1498276532000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/7\/13_13.20150951\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":10,"journal-issue":{"issue":"7","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.13.20150951","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}