{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,30]],"date-time":"2022-03-30T04:33:33Z","timestamp":1648614813406},"reference-count":10,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"8","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.13.20160020","type":"journal-article","created":{"date-parts":[[2016,3,15]],"date-time":"2016-03-15T22:05:53Z","timestamp":1458079553000},"page":"20160020-20160020","source":"Crossref","is-referenced-by-count":0,"title":["Subthreshold 8T SRAM sizing utilizing short-channel V&lt;sub&gt;t&lt;\/sub&gt; roll-off and inverse narrow-width effect"],"prefix":"10.1587","volume":"13","author":[{"given":"Ik Joon","family":"Chang","sequence":"first","affiliation":[{"name":"Department of Electronic and Radio Engineering, Kyunghee University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Joon-Sung","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Systems Engineering, SungKyunKwan University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] H. Soeleman, B. C. Paul and K. Roy: IEEE Trans. Very Large Scale Integr. (VLSI) Syst. <b>9<\/b> (2001) 90. DOI:10.1109\/92.920822","DOI":"10.1109\/92.920822"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] J. Kim and K. Roy: IEEE Trans. Electron Devices <b>51<\/b> (2004) 1468. DOI:10.1109\/TED.2004.833965","DOI":"10.1109\/TED.2004.833965"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] I. J. Chang, S. P. Park and K. Roy: IEEE J. Solid-State Circuits <b>45<\/b> (2010) 401. DOI:10.1109\/JSSC.2009.2036764","DOI":"10.1109\/JSSC.2009.2036764"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] N. Verma and A. Chandrakasan: IEEE J. Solid-State Circuits <b>43<\/b> (2008) 141. DOI:10.1109\/JSSC.2007.908005","DOI":"10.1109\/JSSC.2007.908005"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] I. J. Chang, J. Kim, S. P. Park and K. Roy: IEEE J. Solid-State Circuits <b>44<\/b> (2009) 650. DOI:10.1109\/JSSC.2008.2011972","DOI":"10.1109\/JSSC.2008.2011972"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] B. H. Calhoun and A. Chandrakasan: IEEE J. Solid-State Circuits <b>42<\/b> (2007) 680. DOI:10.1109\/JSSC.2006.891726","DOI":"10.1109\/JSSC.2006.891726"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] T. Kim, J. Liu, J. Keane and C. H. Kim: IEEE J. Solid-State Circuits <b>43<\/b> (2008) 518. DOI:10.1109\/JSSC.2007.914328","DOI":"10.1109\/JSSC.2007.914328"},{"key":"8","doi-asserted-by":"crossref","unstructured":"[8] Y. Taur and T. H. Ning: <i>Fundamentals of Modern VLSI Devices<\/i> (Cambridge Univ. Press, 2009) 2nd ed.","DOI":"10.1017\/CBO9781139195065"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] A. Asenov, S. Kaya and A. R. Brown: IEEE Trans. Electron Devices <b>50<\/b> (2003) 1254. DOI:10.1109\/TED.2003.813457","DOI":"10.1109\/TED.2003.813457"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] K. Nii, Y. Tsukamoto, T. Yoshizawa, S. Imaolka and H. Makino: ISSCC Dig. Tech. Papers (2004) 508. DOI:10.1109\/ISSCC.2004.1332817","DOI":"10.1109\/ISSCC.2004.1332817"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/8\/13_13.20160020\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,5]],"date-time":"2019-09-05T15:27:58Z","timestamp":1567697278000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/8\/13_13.20160020\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":10,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.13.20160020","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}