{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,3,28]],"date-time":"2022-03-28T23:37:09Z","timestamp":1648510629397},"reference-count":10,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"8","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.13.20160095","type":"journal-article","created":{"date-parts":[[2016,3,28]],"date-time":"2016-03-28T22:04:58Z","timestamp":1459202698000},"page":"20160095-20160095","source":"Crossref","is-referenced-by-count":6,"title":["Timing monitoring paths selection for wide voltage IC"],"prefix":"10.1587","volume":"13","author":[{"given":"Weiwei","family":"Shan","sequence":"first","affiliation":[{"name":"National ASIC System and Research Engineering Center, Southeast University"}]},{"given":"Wentao","family":"Dai","sequence":"additional","affiliation":[{"name":"National ASIC System and Research Engineering Center, Southeast University"}]},{"given":"Youhua","family":"Shi","sequence":"additional","affiliation":[{"name":"Waseda University"}]},{"given":"Peng","family":"Cao","sequence":"additional","affiliation":[{"name":"National ASIC System and Research Engineering Center, Southeast University"}]},{"given":"Xiaoyan","family":"Xiang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and System, Fudan University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] S. Das, D. Roberts, S. Lee, S. Pant, D. Blaauw, T. Austin, K. Flautner and T. Mudge: IEEE J. Solid-State Circuits <b>41<\/b> (2006) 792. DOI:10.1109\/JSSC.2006.870912","DOI":"10.1109\/JSSC.2006.870912"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] D. Bull, S. Das, K. Shivashankar, G. S. Dasika, K. Flautner and D. Blaauw: IEEE J. Solid-State Circuits <b>46<\/b> (2011) 18. DOI:10.1109\/JSSC.2010.2079410","DOI":"10.1109\/JSSC.2010.2079410"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] S. Kim, I. Kwon, D. Fick, M. Kim, Y. P. Chen and D. Sylvester: ISSCC Dig. Tech. Papers (2013) 264. DOI:10.1109\/ISSCC.2013.6487728","DOI":"10.1109\/ISSCC.2013.6487728"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] M. Fojtik, D. Fick, Y. Kim, N. Pinckney, D. M. Harris, D. Blaauw and D. Sylvester: IEEE J. Solid-State Circuits <b>48<\/b> (2013) 66. DOI:10.1109\/JSSC.2012.2220912","DOI":"10.1109\/JSSC.2012.2220912"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] M. Eireiner and S. Henzler: IEEE J. Solid-State Circuits <b>42<\/b> (2007) 1583. DOI:10.1109\/JSSC.2007.896695","DOI":"10.1109\/JSSC.2007.896695"},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] J. Zhou, X. Liu, Y. H. Lam, C. Wang, K. H. Chang, J. Lan and M. Je: IEEE Asian Solid-State Circuits Conference (2013) 129. DOI:10.1109\/ASSCC.2013.6690999","DOI":"10.1109\/ASSCC.2013.6690999"},{"key":"7","doi-asserted-by":"crossref","unstructured":"[7] S. Jain, S. Khare, S. Yada, V. Ambili, P. Salihundam, S. Ramani, S. Muthukumar, M. Srinivasan, A. Kumar, S. K. Gb, R. Ramanarayanan, V. Erraguntla, J. Howard, S. Vangal, S. Dighe, G. Ruhl, P. Aseron, H. Wilson, N. Borkar, V. De and S. Borkar: International Solid-State Circuits Conference Digest of Technical Papers (ISSCC) (2012) 66. DOI:10.1109\/ISSCC.2012.6176932","DOI":"10.1109\/ISSCC.2012.6176932"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] W. Shan, H. Gu, B. Li, X. Wu, H. Jin, Y. Guo and P. Cao: IEICE Electron. Express <b>10<\/b> (2013) 20130089. DOI:10.1587\/elex.10.20130089","DOI":"10.1587\/elex.10.20130089"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] D. Alnajjar, Y. Mitsuyama, M. Hashimoto and T. Onoye: IEICE Electron. Express <b>10<\/b> (2013) 20130081. DOI:10.1587\/elex.10.20130081","DOI":"10.1587\/elex.10.20130081"},{"key":"10","doi-asserted-by":"publisher","unstructured":"[10] S. Das, C. Tokunaga, S. Pant, W. H. Ma, S. Kalaiselvan, K. Lai, D. M. Bull and D. T. Blaauw: IEEE J. Solid-State Circuits <b>44<\/b> (2009) 32. DOI:10.1109\/JSSC.2008.2007145","DOI":"10.1109\/JSSC.2008.2007145"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/8\/13_13.20160095\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T09:27:08Z","timestamp":1498296428000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/8\/13_13.20160095\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":10,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.13.20160095","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}