{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,5]],"date-time":"2023-10-05T04:53:51Z","timestamp":1696481631287},"reference-count":16,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"6","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.13.20160115","type":"journal-article","created":{"date-parts":[[2016,3,9]],"date-time":"2016-03-09T22:07:10Z","timestamp":1457561230000},"page":"20160115-20160115","source":"Crossref","is-referenced-by-count":7,"title":["An offset distribution modification technique of stochastic flash ADC"],"prefix":"10.1587","volume":"13","author":[{"given":"Tomohiro","family":"Asano","sequence":"first","affiliation":[{"name":"Graduate School of Engineering, Osaka University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yusaku","family":"Hirai","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering, Osaka University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sadahiro","family":"Tani","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering, Osaka University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shinya","family":"Yano","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering, Osaka University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ikkyun","family":"Jo","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering, Osaka University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshimasa","family":"Matsuoka","sequence":"additional","affiliation":[{"name":"Graduate School of Engineering, Osaka University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] S. C. Wong, K. H. Pan and D. J. Ma: IEEE Electron Device Lett. <b>18<\/b> (1997) 261. DOI:10.1109\/55.585349","DOI":"10.1109\/55.585349"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] Y. Shimizu, M. Nakamura, T. Matsuoka and K. Taniguchi: Electron. Commun. Jpn. Pt. II <b>87<\/b> (2004) 21. DOI:10.1002\/ecjb.10178","DOI":"10.1002\/ecjb.10178"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] T. Matsuoka, J. Wang, T. Kihara, H. Ham and K. Taniguchi: IEICE Trans. Fundamentals <b>E93-A<\/b> (2010) 356. DOI:10.1587\/transfun.E93.A.356","DOI":"10.1587\/transfun.E93.A.356"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] K. Uyttenhove and M. S. J. Steyaert: IEEE Trans. Circuits Syst. II, Exp. Briefs <b>49<\/b> (2002) 280. DOI:10.1109\/TCSII.2002.801191","DOI":"10.1109\/TCSII.2002.801191"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] K. Bult and A. Buchwald: IEEE J. Solid-State Circuits <b>32<\/b> (1997) 1887. DOI:10.1109\/4.643647","DOI":"10.1109\/4.643647"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] C. Y. Chen, M. Q. Le and K. Y. Kim: IEEE J. Solid-State Circuits <b>44<\/b> (2009) 1041. DOI:10.1109\/JSSC.2009.2014701","DOI":"10.1109\/JSSC.2009.2014701"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] D. C. Daly and A. P. Chandrakasan: IEEE J. Solid-State Circuits <b>44<\/b> (2009) 3030. DOI:10.1109\/JSSC.2009.2032699","DOI":"10.1109\/JSSC.2009.2032699"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] S. Weaver, B. Hershberg, P. Kurahashi, D. Knierim and U.-K. Moon: IEEE Trans. Circuits Syst. I, Fundam. Theory Appl. <b>57<\/b> (2010) 2825. DOI:10.1109\/TCSI.2010.2050225","DOI":"10.1109\/TCSI.2010.2050225"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] H. Ham, T. Matsuoka, J. Wang and K. Taniguchi: Electron. Commun. Jpn. <b>96<\/b> (2013) 51. DOI:10.1002\/ecj.11411","DOI":"10.1002\/ecj.11411"},{"key":"10","doi-asserted-by":"publisher","unstructured":"[10] S. Weaver, B. Hershberg, and U.-K. Moon: IEEE Trans. Circuits Syst. I, Fundam. Theory Appl. <b>61<\/b> (2014) 84. DOI:10.1109\/TCSI.2013.2268571","DOI":"10.1109\/TCSI.2013.2268571"},{"key":"11","doi-asserted-by":"crossref","unstructured":"[11] J. J. Collins, C. C. Chow and T. T. Imhoff: Nature <b>376<\/b> (1995) 236. DOI:10.1038\/376236a0","DOI":"10.1038\/376236a0"},{"key":"12","doi-asserted-by":"publisher","unstructured":"[12] P. C. Gailey, A. Neiman, J. J. Collins and F. Moss: Phys. Rev. Lett. <b>79<\/b> (1997) 4701. DOI:10.1103\/PhysRevLett.79.4701","DOI":"10.1103\/PhysRevLett.79.4701"},{"key":"13","doi-asserted-by":"publisher","unstructured":"[13] P. Carbone and M. Caciotta: IEEE Trans. Instrum. Meas. <b>47<\/b> (1998) 65. DOI:10.1109\/19.728791","DOI":"10.1109\/19.728791"},{"key":"14","doi-asserted-by":"crossref","unstructured":"[14] H. Ham, T. Matsuoka and K. Taniguchi: IEICE Trans. Fundamentals <b>E92-A<\/b> (2009) 1012. DOI:10.1587\/transfun.E92.A.1012","DOI":"10.1587\/transfun.E92.A.1012"},{"key":"15","doi-asserted-by":"publisher","unstructured":"[15] H. Ham, T. Matsuoka, J. Wang and K. Taniguchi: IEICE Electron. Express <b>8<\/b> (2011) 353. DOI:10.1587\/elex.8.353","DOI":"10.1587\/elex.8.353"},{"key":"16","doi-asserted-by":"publisher","unstructured":"[16] Y. Hirai, S. Yano and T. Matsuoka: IPSJ Trans. System LSI Design Methodology <b>8<\/b> (2015) 123. DOI:10.2197\/ipsjtsldm.8.123","DOI":"10.2197\/ipsjtsldm.8.123"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/6\/13_13.20160115\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T08:00:38Z","timestamp":1498291238000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/6\/13_13.20160115\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":16,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.13.20160115","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}