{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,15]],"date-time":"2024-07-15T02:54:58Z","timestamp":1721012098505},"reference-count":12,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"13","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.13.20160457","type":"journal-article","created":{"date-parts":[[2016,6,17]],"date-time":"2016-06-17T00:46:36Z","timestamp":1466124396000},"page":"20160457-20160457","source":"Crossref","is-referenced-by-count":2,"title":["A high performance with low harmonic distortion interface circuit of sigma-delta accelerometer"],"prefix":"10.1587","volume":"13","author":[{"given":"Xinpeng","family":"Di","sequence":"first","affiliation":[{"name":"MEMS Center, Harbin Institute of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weiping","family":"Chen","sequence":"additional","affiliation":[{"name":"MEMS Center, Harbin Institute of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaowei","family":"Liu","sequence":"additional","affiliation":[{"name":"MEMS Center, Harbin Institute of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liang","family":"Yin","sequence":"additional","affiliation":[{"name":"MEMS Center, Harbin Institute of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qiang","family":"Fu","sequence":"additional","affiliation":[{"name":"MEMS Center, Harbin Institute of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] H. K\u00fclahet al.: IEEE J. Solid-State Circuits <b>41<\/b> (2006) 352 (DOI: 10.1109\/JSSC.2005.863148).","DOI":"10.1109\/JSSC.2005.863148"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] B. V. Aminiet al.: IEEE J. Solid-State Circuits <b>41<\/b> (2006) 2983 (DOI: 10.1109\/JSSC.2006.884864).","DOI":"10.1109\/JSSC.2006.884864"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] V. F. Diaset al.: IEEE Trans. Circuits Syst. I, Fundam. Theory Appl. <b>41<\/b> (1994) 326 (DOI: 10.1109\/81.285690).","DOI":"10.1109\/81.285690"},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] X. Y. Liet al.: IEICE Electron. Express <b>12<\/b> (2015) 20141035 (DOI: 10.1587\/elex.12.20141035).","DOI":"10.1587\/elex.12.20141035"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] O. Oliaei: IEEE Trans. Circuits Syst. <b>50<\/b> (2003) 1198 (DOI: 10.1109\/TCSI.2003.816314).","DOI":"10.1109\/TCSI.2003.816314"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] H. L. Xuet al.: IEEE J. Solid-State Circuits <b>50<\/b> (2015) 2101 (DOI: 10.1109\/JSSC.2015.2428278).","DOI":"10.1109\/JSSC.2015.2428278"},{"key":"7","unstructured":"[7] F. C. Chen and C. L. Hsieh: IEEE Trans. Circuits Syst. II, Exp. Briefs <b>56<\/b> (2009) 9."},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] Y. F. Donget al.: IEEE Trans. Instrum. Meas. <b>56<\/b> (2007) 1666 (DOI: 10.1109\/TIM.2007.904477).","DOI":"10.1109\/TIM.2007.904477"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] H. Zare-Hoseiniet al.: IEEE Trans. Instrum. Meas. <b>54<\/b> (2005) 1646 (DOI: 10.1109\/TIM.2005.851085).","DOI":"10.1109\/TIM.2005.851085"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] M. Pastre and M. Kayal: Proc. Eur. Solid-State Circuits Conf. (2009) 288 (DOI: 10.1109\/ESSCIRC.2009.5326033).","DOI":"10.1109\/ESSCIRC.2009.5326033"},{"key":"11","doi-asserted-by":"publisher","unstructured":"[11] H. L. Xuet al.: IEEE Sensors J. <b>15<\/b> (2015) 4826 (DOI: 10.1109\/JSEN.2015.2427391).","DOI":"10.1109\/JSEN.2015.2427391"},{"key":"12","doi-asserted-by":"publisher","unstructured":"[12] M. Y\u00fcceta\u015fet al.: IEEE J. Solid-State Circuits <b>47<\/b> (2012) 1721 (DOI: 10.1109\/JSSC.2012.2191675).","DOI":"10.1109\/JSSC.2012.2191675"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/13\/13_13.20160457\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T16:31:57Z","timestamp":1498321917000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/13\/13_13.20160457\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":12,"journal-issue":{"issue":"13","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.13.20160457","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}