{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,7,25]],"date-time":"2024-07-25T13:18:23Z","timestamp":1721913503930},"reference-count":12,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"21","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2016]]},"DOI":"10.1587\/elex.13.20160872","type":"journal-article","created":{"date-parts":[[2016,10,16]],"date-time":"2016-10-16T22:07:16Z","timestamp":1476655636000},"page":"20160872-20160872","source":"Crossref","is-referenced-by-count":6,"title":["Against fault attacks based on random infection mechanism"],"prefix":"10.1587","volume":"13","author":[{"given":"Jinbao","family":"Zhang","sequence":"first","affiliation":[{"name":"College of Electrical and Information Engineering, Nanjing University of Aeronautics and Astronautics"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ning","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Nanjing University of Aeronautics and Astronautics"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaoqiang","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Nanjing University of Aeronautics and Astronautics"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fang","family":"Zhou","sequence":"additional","affiliation":[{"name":"College of Electrical and Information Engineering, Nanjing University of Aeronautics and Astronautics"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","unstructured":"[1] E. Biham and A. Shamir: \u201cDifferential fault analysis of secret key cryptosystems,\u201d in <i>CRYPTO, ser. Lecture Notes in Computer Science<\/i>, ed. B. S. K. Jr., vol. 1294 (Springer, 1997) 513\u2013525."},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] N. F. Ghalaty, <i>et al.<\/i>: \u201cDifferential fault intensity analysis,\u201d Proc. of 11th Workshop on Fault Diagnosis and Tolerance in Cryptography (2014) 49 (DOI: 10.1109\/FDTC.2014.15).","DOI":"10.1109\/FDTC.2014.15"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] A. Barenghiet al.: \u201cFault injection attacks on cryptographic devices: Theory, practice, and countermeasures,\u201d Proc. IEEE <b>100<\/b> (2012) 3056 (DOI: 10.1109\/JPROC.2012.2188769).","DOI":"10.1109\/JPROC.2012.2188769"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] M. Doulcier-Verdier, <i>et al.<\/i>: \u201cA side-channel and fault-attack resistant AES circuit working on duplicated complemented values,\u201d IEEE International Solid-State Circuits Conference (2011) 274 (DOI: 10.1109\/ISSCC.2011.5746316).","DOI":"10.1109\/ISSCC.2011.5746316"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] H. Tupsamudre, <i>et al.<\/i>: \u201cDestroying fault invariant with randomization a countermeasure for AES against differential fault attacks,\u201d Workshop on Cryptographic Hardware and Embedded Systems (2014) 93 (DOI: 10.1007\/978-3-662-44709-3_6).","DOI":"10.1007\/978-3-662-44709-3_6"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] M. Joyeet al.: \u201cStrengthening hardware AES implementations against fault attack,\u201d IET Inf. Security <b>1<\/b> (2007) 106 (DOI: 10.1049\/iet-ifs:20060163).","DOI":"10.1049\/iet-ifs:20060163"},{"key":"7","doi-asserted-by":"crossref","unstructured":"[7] V. Lomne, <i>et al.<\/i>: \u201cOn the need of randomness in fault attack countermeasures \u2013 Application to AES,\u201d 2012 Workshop on Fault Diagnosis and Tolerance in Cryptography. IEEE (2012) 85 (DOI: 10.1109\/FDTC.2012.19).","DOI":"10.1109\/FDTC.2012.19"},{"key":"8","unstructured":"[8] B. Gierlichs, <i>et al.<\/i>: \u201cInfective computation and dummy rounds: Fault protection for block ciphers without check-before-output,\u201d Progress in Cryptology \u2013 LATINCRYPT (2012) 305 (DOI: 10.1007\/978-3-642-33481-8_17)."},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] B. Wanget al.: \u201cAgainst double fault attacks: Injection effort model, space and time randomization based countermeasures for reconfigurable array architecture,\u201d IEEE Trans. Inf. Forensics Security <b>11<\/b> (2016) (DOI: 10.1109\/TIFS.2016.2518130).","DOI":"10.1109\/TIFS.2016.2518130"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] J. G. J. van Woudenberg, <i>et al.<\/i>: \u201cPractical optical fault injection on secure microcontrollers,\u201d Proc. Workshop Fault Diagnosis Tolerance Cryptogr. (FDTC) (2011) 91 (DOI: 10.1109\/FDTC.2011.12).","DOI":"10.1109\/FDTC.2011.12"},{"key":"11","doi-asserted-by":"publisher","unstructured":"[11] P. Derbez, <i>et al.<\/i>: \u201cMeet-in-the-middle and impossible differential fault analysis on AES,\u201d 2011 Workshop on Cryptographic Hardware and Embedded Systems <b>6917<\/b> (2011) 274 (DOI: 10.1007\/978-3-642-23951-9_19).","DOI":"10.1007\/978-3-642-23951-9_19"},{"key":"12","doi-asserted-by":"publisher","unstructured":"[12] J. Fournieret al.: \u201cDesign and characterisation of an AES chip embedding countermeasures,\u201d Int. J. Intelligent Eng. Informatics <b>1<\/b> (2011) 328 (DOI: 10.1504\/IJIEI.2011.044101).","DOI":"10.1504\/IJIEI.2011.044101"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/21\/13_13.20160872\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,25]],"date-time":"2017-06-25T01:17:31Z","timestamp":1498353451000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/13\/21\/13_13.20160872\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016]]},"references-count":12,"journal-issue":{"issue":"21","published-print":{"date-parts":[[2016]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.13.20160872","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016]]}}}