{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T05:31:28Z","timestamp":1648791088948},"reference-count":15,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2017]]},"DOI":"10.1587\/elex.14.20161199","type":"journal-article","created":{"date-parts":[[2017,1,12]],"date-time":"2017-01-12T22:10:59Z","timestamp":1484259059000},"page":"20161199-20161199","source":"Crossref","is-referenced-by-count":2,"title":["A 19-bit column-parallel folding-integration\/cyclic cascaded ADC with a pre-charging technique for CMOS image sensors"],"prefix":"10.1587","volume":"14","author":[{"given":"Tongxi","family":"Wang","sequence":"first","affiliation":[{"name":"Research Institute of Electronics, Shizuoka University"}]},{"given":"Min-Woong","family":"Seo","sequence":"additional","affiliation":[{"name":"Research Institute of Electronics, Shizuoka University"}]},{"given":"Keita","family":"Yasutomi","sequence":"additional","affiliation":[{"name":"Research Institute of Electronics, Shizuoka University"}]},{"given":"Shoji","family":"Kawahito","sequence":"additional","affiliation":[{"name":"Research Institute of Electronics, Shizuoka University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"publisher","unstructured":"[1] S. Yoshiharaet al.: \u201cA 1\/1.8-inch 6.4 Mpixel 60 frame\/s CMOS image sensor with seamless mode change,\u201d IEEE J. Solid-State Circuits <b>41<\/b> (2006) 2998 (DOI: 10.1109\/JSSC.2006.884868).","DOI":"10.1109\/JSSC.2006.884868"},{"key":"2","doi-asserted-by":"publisher","unstructured":"[2] S. Okuraet al.: \u201cA 3.7 M-Pixel 1300-fps CMOS image sensor with 5.0 G-Pixel\/s high-speed readout circuit,\u201d IEEE J. Solid-State Circuits <b>50<\/b> (2015) 1016 (DOI: 10.1109\/JSSC.2014.2387201).","DOI":"10.1109\/JSSC.2014.2387201"},{"key":"3","doi-asserted-by":"publisher","unstructured":"[3] S. Matsuoet al.: \u201c8.9-Megapixel video image sensor with 14-b column-parallel SA-ADC,\u201d IEEE Trans. Electron Devices <b>56<\/b> (2009) 2380 (DOI: 10.1109\/TED.2009.2030649).","DOI":"10.1109\/TED.2009.2030649"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] R. Funatsu, <i>et al.<\/i>: \u201c133 Mpixel 60 fps CMOS image sensor with 32-column shared high-speed column-parallel SAR ADCs,\u201d ISSCC Dig. Tech. Papers (2015) 112 (DOI: 10.1109\/ISSCC.2015.7062951).","DOI":"10.1109\/ISSCC.2015.7062951"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] J. H. Parket al.: \u201cA high-speed low-noise CMOS image sensor with 13-b column-parallel single-ended cyclic ADCs,\u201d IEEE Trans. Electron Devices <b>56<\/b> (2009) 2414 (DOI: 10.1109\/TED.2009.2030635).","DOI":"10.1109\/TED.2009.2030635"},{"key":"6","doi-asserted-by":"publisher","unstructured":"[6] K. Kitamuraet al.: \u201cA 33-Megapixel 120-frame-per-second 2.5-Watt CMOS image sensor with column-parallel two-stage cyclic analog-to-digital converters,\u201d IEEE Trans. Electron Devices <b>59<\/b> (2012) 3426 (DOI: 10.1109\/TED.2012.2220364).","DOI":"10.1109\/TED.2012.2220364"},{"key":"7","doi-asserted-by":"publisher","unstructured":"[7] Y. Chaeet al.: \u201cA 2.1 M Pixels, 120 Frame\/s CMOS image sensor with column-parallel \u0394\u03a3 ADC architecture,\u201d IEEE J. Solid-State Circuits <b>46<\/b> (2011) 236 (DOI: 10.1109\/JSSC.2010.2085910).","DOI":"10.1109\/JSSC.2010.2085910"},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] Y. Oike and A. E. Gamal: \u201cCMOS image sensor with per-column \u03a3\u0394 ADC and programmable compressed sensing,\u201d IEEE J. Solid-State Circuits <b>48<\/b> (2013) 318 (DOI: 10.1109\/JSSC.2012.2214851).","DOI":"10.1109\/JSSC.2012.2214851"},{"key":"9","doi-asserted-by":"publisher","unstructured":"[9] M. W. Seoet al.: \u201cA low-noise high intrascene dynamic range CMOS image sensor with a 13 to 19 b variable-resolution column-parallel folding-integration\/cyclic ADC,\u201d IEEE J. Solid-State Circuits <b>47<\/b> (2012) 272 (DOI: 10.1109\/JSSC.2011.2164298).","DOI":"10.1109\/JSSC.2011.2164298"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] J. Kim, <i>et al.<\/i>: \u201cA 14 b extended counting ADC implemented in a 24 MPixel APS-C CMOS image sensor,\u201d ISSCC Dig. Tech. Papers (2012) 390 (DOI: 10.1109\/ISSCC.2012.6177060).","DOI":"10.1109\/ISSCC.2012.6177060"},{"key":"11","doi-asserted-by":"publisher","unstructured":"[11] F. Tanget al.: \u201cLow-power CMOS image sensor based on column-parallel single-slope\/SAR quantization scheme,\u201d IEEE Trans. Electron Devices <b>60<\/b> (2013) 2561 (DOI: 10.1109\/TED.2013.2268207).","DOI":"10.1109\/TED.2013.2268207"},{"key":"12","doi-asserted-by":"crossref","unstructured":"[12] T. Arai, <i>et al.<\/i>: \u201cA 1.1 \u00b5m 33 Mpixel 240 fps 3D-stacked CMOS image sensor with 3-stage cyclic-based analog-to-digital converters,\u201d ISSCC Dig. Tech. Papers (2016) 126 (DOI: 10.1109\/ISSCC.2016.7417939).","DOI":"10.1109\/ISSCC.2016.7417939"},{"key":"13","doi-asserted-by":"publisher","unstructured":"[13] P. Romboutset al.: \u201cA 13.5-b 1.2-V micropower extended counting A\/D converter,\u201d IEEE J. Solid-State Circuits <b>36<\/b> (2001) 176 (DOI: 10.1109\/4.902758).","DOI":"10.1109\/4.902758"},{"key":"14","doi-asserted-by":"crossref","unstructured":"[14] T. Wang, <i>et al.<\/i>: \u201cA digital calibration technique for folding-integration\/cyclic cascaded ADCs,\u201d IEEE proc. MWSCAS (2015) 41 (DOI: 10.1109\/MWSCAS.2015.7282020).","DOI":"10.1109\/MWSCAS.2015.7282020"},{"key":"15","doi-asserted-by":"publisher","unstructured":"[15] M. W. Seoet al.: \u201cA 0.27e-rms read noise 220-\u00b5V\/e-conversion gain reset-gate-less CMOS image sensor with 0.11-\u00b5m CIS process,\u201d IEEE Electron Device Lett. <b>36<\/b> (2015) 1344 (DOI: 10.1109\/LED.2015.2496359).","DOI":"10.1109\/LED.2015.2496359"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/14\/2\/14_14.20161199\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,25]],"date-time":"2017-06-25T08:06:58Z","timestamp":1498378018000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/14\/2\/14_14.20161199\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017]]},"references-count":15,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2017]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.14.20161199","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017]]}}}