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Marshall: \u201cMicroelectronic devices for application in transient nuclear radiation environments,\u201d Tenth Annual East Coast Conference on Aerospace and Navigational Electronics Papers (1963) (DOI: 10.1109\/TANE.1963.4502234)."},{"key":"2","unstructured":"[2] J.L. Wirth and S.C. Rogers: \u201cThe transient response of transistors and diodes to ionizing radiation,\u201d IEEE Trans. Nucl. Sci. <b>11<\/b> (1964) 24 (DOI: 10.1109\/TNS2.1964.4315472)."},{"key":"3","unstructured":"[3] C.W. Gwyn, <i>et al.<\/i>: \u201cThe analysis of radiation effects in semiconductor junction devices,\u201d IEEE Trans. Nucl. Sci. <b>14<\/b> (1967) 153 (DOI: 10.1109\/TNS.1967.4324787)."},{"key":"4","unstructured":"[4] C.W. Gwyn: \u201cAn analysis of ionizing radiation effects in four-layer semiconductor devices,\u201d IEEE Trans. Nucl. Sci. <b>16<\/b> (1969) 104 (DOI: 10.1109\/tns.1969.4325511)."},{"key":"5","unstructured":"[5] D.C. 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Olson, <i>et al.<\/i>: \u201cAnalysis of parasitic PNP bipolar transistor mitigation using well contacts in 130nm and 90nm CMOS technology,\u201d IEEE Trans. Nucl. Sci. <b>54<\/b> (2007) 894 (DOI: 10.1109\/TNS.2007.895243)."},{"key":"30","unstructured":"[30] O.A. Amusan, <i>et al.<\/i>: \u201cCharge collection and charge sharing in a 130nm CMOS technology,\u201d IEEE Trans. Nucl. Sci. <b>53<\/b> (2006) 3253 (DOI: 10.1109\/TNS.2006.884788)."},{"key":"31","unstructured":"[31] H. Dussault, <i>et al.<\/i>: \u201cNumerical simulation of heavy ion charge generation and collection dynamics,\u201d IEEE Trans. Nucl. Sci. <b>40<\/b> (1993) 1926 (DOI: 10.1109\/23.273462)."},{"key":"32","unstructured":"[32] C.M. Hsieh, <i>et al.<\/i>: \u201cA field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices,\u201d IEEE Electron Device Lett. <b>2<\/b> (1981) 103 (DOI: 10.1109\/EDL.1981.25357)."}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/17\/14\/17_17.20200205\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,7,25]],"date-time":"2020-07-25T03:31:48Z","timestamp":1595647908000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/17\/14\/17_17.20200205\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7,25]]},"references-count":32,"journal-issue":{"issue":"14","published-print":{"date-parts":[[2020]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.17.20200205","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,7,25]]}}}