{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,16]],"date-time":"2025-12-16T12:33:29Z","timestamp":1765888409778},"reference-count":30,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"18","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2020,9,25]]},"DOI":"10.1587\/elex.17.20200250","type":"journal-article","created":{"date-parts":[[2020,8,20]],"date-time":"2020-08-20T22:07:51Z","timestamp":1597961271000},"page":"20200250-20200250","source":"Crossref","is-referenced-by-count":9,"title":["Hybrid methodology based on extension theory for partial discharge fault diagnosis of power capacitors"],"prefix":"10.1587","volume":"17","author":[{"given":"Meng-Hui","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, National Chin-Yi University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shiue-Der","family":"Lu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Chin-Yi University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mei-Ling","family":"Huang","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering and Management, National Chin-Yi University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hong-Wei","family":"Sian","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Taiwan University of Science and Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cheng-Che","family":"Hsieh","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Chin-Yi University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shao-En","family":"Wei","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, National Chin-Yi University of Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","unstructured":"[1] S. Santoso, <i>et al.<\/i>: \u201cPower quality event processing and analysis modules: capacitors and their circuit switchers,\u201d 2011 IEEE Power and Energy Society General Meeting, Detroit, MI, USA, (2011) 1 (DOI: 10.1109\/PES.2011.6039434)."},{"key":"2","unstructured":"[2] Y. Omagari, <i>et al.<\/i>: \u201cExperimental validation of an equivalent mechanical model for understanding power system stability,\u201d IEICE Electron. Express <b>7<\/b> (2010) 1578 (DOI: 10.1587\/elex.7.1578)."},{"key":"3","unstructured":"[3] Y. Dejun, <i>et al.<\/i>: \u201cExperience of condition based maintenance for power equipment insulation,\u201d Proc. 2001 International Symposium on Electrical Insulating Materials (ISEIM 2001). 2001 Asian Conference on Electrical Insulating Diagnosis (ACEID 2001). 33rd Symposium on Electrical and Ele. (2001) 198 (DOI: 10.1109\/ISEIM.2001.973613)."},{"key":"4","unstructured":"[4] A.S. 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Cai: \u201cThe extension set and non-compatible problem,\u201d Advances Mathematics and Mechanics in China (in Chinese) <b>2<\/b> (1990) 1."},{"key":"28","unstructured":"[28] M.-H. Wang, <i>et al.<\/i>: \u201cApplication of extension theory to vibration fault diagnosis of generator sets,\u201d IEEE Proceedings -- Generation, Transmission and Distribution <b>151<\/b> (2004) 503 (DOI: 10.1049\/ip-gtd:20040538)."},{"key":"29","unstructured":"[29] M.H. Wang, <i>et al.<\/i>: \u201cApplication of extension theory to fault diagnosis of automotive engine,\u201d ICIC Express Lett. <b>5<\/b> (2011) 1293"},{"key":"30","doi-asserted-by":"crossref","unstructured":"[30] M.H. Wang, <i>et al.<\/i>: \u201cThe fault diagnosis of analog circuits based on extension theory,\u201d ICIC Lecture Notes in Computer Science (2009) 735","DOI":"10.1007\/978-3-642-04070-2_79"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/17\/18\/17_17.20200250\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,9,26]],"date-time":"2020-09-26T03:31:10Z","timestamp":1601091070000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/17\/18\/17_17.20200250\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9,25]]},"references-count":30,"journal-issue":{"issue":"18","published-print":{"date-parts":[[2020]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.17.20200250","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,9,25]]}}}