{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2022,4,4]],"date-time":"2022-04-04T04:28:09Z","timestamp":1649046489132},"reference-count":31,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2022,1,25]]},"DOI":"10.1587\/elex.18.20210502","type":"journal-article","created":{"date-parts":[[2021,12,20]],"date-time":"2021-12-20T23:25:23Z","timestamp":1640042723000},"page":"20210502-20210502","source":"Crossref","is-referenced-by-count":0,"title":["Characterization of programmable integrated quantum voltage noise source with variable power spectral density"],"prefix":"10.1587","volume":"19","author":[{"given":"Tomoya","family":"Irimatsugawa","sequence":"first","affiliation":[{"name":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chiharu","family":"Urano","sequence":"additional","affiliation":[{"name":"National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takahiro","family":"Yamada","sequence":"additional","affiliation":[{"name":"Research Center for Emerging Computing Technologies, National Institute of Advanced Industrial Science and Technology"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] D.R. White, <i>et al.<\/i>: \u201cThe status of Johnson noise thermometry,\u201d Metrologia <b>33<\/b> (1996) 325 (DOI: 10.1088\/0026-1394\/33\/4\/6).","DOI":"10.1088\/0026-1394\/33\/4\/6"},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] N.E. Flowers-Jacobs, <i>et al.<\/i>: \u201cA Boltzmann constant determination based on Johnson noise thermometry,\u201d Metrologia <b>54<\/b> (2017) 730 (DOI: 10.1088\/1681-7575\/aa7b3f).","DOI":"10.1088\/1681-7575\/aa7b3f"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] J. Qu, <i>et al.<\/i>: \u201cAn improved electronic determination of the Boltzmann constant by Johnson noise thermometry,\u201d Metrologia <b>54<\/b> (2017) 549 (DOI: 10.1088\/1681-7575\/aa781e).","DOI":"10.1088\/1681-7575\/aa781e"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] C. Urano, <i>et al<\/i>.: \u201cMeasurement of the Boltzmann constant by Johnson noise thermometry using a superconducting integrated circuit,\u201d Metrologia <b>54<\/b> (2017) 847 (DOI: 10.1088\/1681-7575\/aa7cdd).","DOI":"10.1088\/1681-7575\/aa7cdd"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] J. Johnson: \u201cThermal agitation of electricity in conductors,\u201d Phys. Rev. <b>32<\/b> (1928) 97 (DOI: 10.1103\/PhysRev.32.97).","DOI":"10.1103\/PhysRev.32.97"},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] H. Nyquist: \u201cThermal agitation of electric charge in conductors,\u201d Phys. Rev. <b>32<\/b> (1928) 110 (DOI: 10.1103\/PhysRev.32.110).","DOI":"10.1103\/PhysRev.32.110"},{"key":"7","unstructured":"[7] S.P. Benz, <i>et al.<\/i>: \u201cA new approach to Johnson noise thermometry using a Josephson quantized voltage source for calibration,\u201d Proc. 8th International Symposium on Temperature and Thermal Measurements in Industry and Science (2002) 37."},{"key":"8","doi-asserted-by":"crossref","unstructured":"[8] S.W. Nam, <i>et al<\/i>.: \u201cJohnson noise thermometry measurements using a quantum voltage noise source for calibration,\u201d IEEE Trans. Instrum. Meas. <b>52<\/b> (2003) 550 (DOI: 10.1109\/TIM.2003.811686).","DOI":"10.1109\/TIM.2003.811686"},{"key":"9","doi-asserted-by":"crossref","unstructured":"[9] J. Qu, <i>et al<\/i>.: \u201cImproved electronic measurement of the Boltzmann constant by Johnson noise thermometry,\u201d Metrologia <b>52<\/b> (2015) S242 (DOI: 10.1088\/0026-1394\/52\/5\/S242).","DOI":"10.1088\/0026-1394\/52\/5\/S242"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] W.L. Tew, <i>et al.<\/i>: \u201cProgress in noise thermometry at 505K and 693K using quantized voltage noise ratio spectra,\u201d Int. J. Thermophys. <b>31<\/b> (2010) 1719 (DOI: 10.1007\/s10765-010-0830-9).","DOI":"10.1007\/s10765-010-0830-9"},{"key":"11","doi-asserted-by":"crossref","unstructured":"[11] K.K. Likharev and V.K. Semenov: \u201cRSFQ logic\/memory family: a new Josephson-junction technology for sub-terahertz-clock-frequency digital systems,\u201d IEEE Trans. Appl. Supercond. <b>1<\/b> (1991) 3 (DOI: 10.1109\/77.80745).","DOI":"10.1109\/77.80745"},{"key":"12","unstructured":"[12] M. Maezawa, <i>et al.<\/i>: \u201cNew quantum voltage noise source for Johnson noise thermometry,\u201d Proc. 5th Superconducting SFQ VLSI Workshop (2012) 67."},{"key":"13","doi-asserted-by":"crossref","unstructured":"[13] M. Maezawa, <i>et al.<\/i>: \u201cIntegrated quantum voltage noise source for Johnson noise thermometry,\u201d J. Phys.: Conf. Ser. <b>507<\/b> (2014) 042023 (DOI: 10.1088\/1742-6596\/507\/4\/042023).","DOI":"10.1088\/1742-6596\/507\/4\/042023"},{"key":"14","doi-asserted-by":"crossref","unstructured":"[14] T. Yamada, <i>et al.<\/i>: \u201cDesign and test of component circuits of an integrated quantum voltage noise source for Johnson noise thermometry,\u201d Physica C <b>518<\/b> (2015) 85 (DOI: 10.1016\/j.physc.2015.02.046).","DOI":"10.1016\/j.physc.2015.02.046"},{"key":"15","doi-asserted-by":"crossref","unstructured":"[15] M. Maezawa, <i>et al.<\/i>: \u201cImproved design of integrated quantum voltage noise source,\u201d IEEE Trans. Appl. Supercond. <b>26<\/b> (2016) 1800504 (DOI: 10.1109\/TASC.2016.2525990).","DOI":"10.1109\/TASC.2016.2525990"},{"key":"16","doi-asserted-by":"crossref","unstructured":"[16] T. Yamada, <i>et al.<\/i>: \u201cDemonstration of Johnson noise thermometry with all-superconducting quantum voltage noise source,\u201d Appl. Phys. Lett. <b>108<\/b> (2016) 042605 (DOI: 10.1063\/1.4940926).","DOI":"10.1063\/1.4940926"},{"key":"17","doi-asserted-by":"crossref","unstructured":"[17] C. Urano, <i>et al.<\/i>: \u201cJohnson noise thermometry based on integrated quantum voltage noise source,\u201d IEEE Trans. Appl. Supercond. <b>26<\/b> (2016) 800305 (DOI: 10.1109\/TASC.2016.2524472).","DOI":"10.1109\/TASC.2016.2524472"},{"key":"18","doi-asserted-by":"crossref","unstructured":"[18] C. Urano, <i>et al.<\/i>: \u201cMeasuring the Boltzmann\u2019s constant using superconducting integrated circuit,\u201d IEEE Trans. Instrum. Meas. <b>66<\/b> (2017) 1323 (DOI: 10.1109\/TIM.2016.2637598).","DOI":"10.1109\/TIM.2016.2637598"},{"key":"19","doi-asserted-by":"crossref","unstructured":"[19] M. Stock, <i>et al.<\/i>: \u201cThe revision of the SI--the result of three decades of progress in metrology,\u201d Metrologia <b>56<\/b> (2019) 022001 (DOI: 10.1088\/1681-7575\/ab0013).","DOI":"10.1088\/1681-7575\/ab0013"},{"key":"20","doi-asserted-by":"crossref","unstructured":"[20] G. Machin: \u201cThe Kelvin redefined,\u201d Meas. Sci. Technol. <b>29<\/b> (2018) 022001 (DOI: 10.1088\/1361-6501\/aa9ddb).","DOI":"10.1088\/1361-6501\/aa9ddb"},{"key":"21","doi-asserted-by":"crossref","unstructured":"[21] A. Peruzzi: \u201cOn the redefinition of the Kelvin,\u201d J. Phys.: Conf. Ser. <b>1065<\/b> (2018) 122011 (DOI: 10.1088\/1742-6596\/1065\/12\/122011).","DOI":"10.1088\/1742-6596\/1065\/12\/122011"},{"key":"22","doi-asserted-by":"crossref","unstructured":"[22] P.J. Mohr, <i>et al<\/i>: \u201cData and analysis for the CODATA 2017 special fundamental constant adjustment,\u201d Metrologia <b>55<\/b> (2018) 125 (DOI: 10.1088\/1681-7575\/aa99bc).","DOI":"10.1088\/1681-7575\/aa99bc"},{"key":"23","doi-asserted-by":"crossref","unstructured":"[23] D.B. Newell, <i>et al.<\/i>: \u201cThe CODATA 2017 values of <i>h<\/i>, <i>e<\/i>, <i>k<\/i> and <i>N<\/i><sub>A<\/sub> for the revision of the SI,\u201d Metrologia <b>55<\/b> (2018) L13 (DOI: 10.1088\/1681-7575\/aa950a).","DOI":"10.1088\/1681-7575\/aa950a"},{"key":"24","doi-asserted-by":"crossref","unstructured":"[24] H. Preston-Thomas, <i>et al.<\/i>: \u201cThe international temperature scale of 1990 (ITS-90),\u201d Metrologia <b>27<\/b> (1990) 3 (DOI: 10.1088\/00261394\/27\/1\/002).","DOI":"10.1088\/0026-1394\/27\/1\/002"},{"key":"25","doi-asserted-by":"crossref","unstructured":"[25] J. Fischer, <i>et al.<\/i>: \u201cPresent estimates of the differences between thermodynamic temperatures and the ITS-90,\u201d Int. J. Thermophys. <b>32<\/b> (2011) 12 (DOI: 10.1007\/s10765-011-0922-1).","DOI":"10.1007\/s10765-011-0922-1"},{"key":"26","doi-asserted-by":"crossref","unstructured":"[26] L. Pitre, <i>et al.<\/i>: \u201cNew measurement of the Boltzmann constant <i>k<\/i> by acoustic thermometry of helium-4 gas,\u201d Metrologia <b>54<\/b> (2017) 856 (DOI: 10.1088\/1681-7575\/aa7bf5).","DOI":"10.1088\/1681-7575\/aa7bf5"},{"key":"27","doi-asserted-by":"crossref","unstructured":"[27] C. Gaiser, <i>et al.<\/i>: \u201cFinal determination of the Boltzmann constant by dielectric-constant gas thermometry,\u201d Metrologia <b>54<\/b> (2017) 280 (DOI: 10.1088\/1681-7575\/aa62e3).","DOI":"10.1088\/1681-7575\/aa62e3"},{"key":"28","doi-asserted-by":"crossref","unstructured":"[28] R.L. Fagaly, <i>et al.<\/i>: \u201cSuperconducting quantum interference device instruments and applications,\u201d Rev. Sci. Instrum. <b>77<\/b> (2006) 101101 (DOI: 10.1063\/1.2354545).","DOI":"10.1063\/1.2354545"},{"key":"29","doi-asserted-by":"crossref","unstructured":"[29] S.B. Kaplan and O.A. Mukhanov: \u201cOperation of a superconductive demultiplexer using rapid single flux quantum (RSFQ) technology,\u201d IEEE Trans. Appl. Supercond. <b>5<\/b> (1995) 2853 (DOI: 10.1109\/77.403186).","DOI":"10.1109\/77.403186"},{"key":"30","doi-asserted-by":"crossref","unstructured":"[30] S. Yorozu, <i>et al<\/i>.: \u201cA single flux quantum standard logic cell library,\u201d Physica C <b>378-381<\/b> (2002) 1471 (DOI: 10.1016\/0921-4534(02)01759-8)","DOI":"10.1016\/S0921-4534(02)01759-8"},{"key":"31","doi-asserted-by":"crossref","unstructured":"[31] S. Nagasawa, <i>et al<\/i>.: \u201cA 380ps, 9.5mW Josephson 4-kbit RAM operated at a high bit yield,\u201d IEEE Trans. Appl. Supercond. <b>5<\/b> (1995) 2447 (DOI: 10.1109\/77.403086).","DOI":"10.1109\/77.403086"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/19\/2\/19_18.20210502\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,29]],"date-time":"2022-01-29T04:07:23Z","timestamp":1643429243000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/19\/2\/19_18.20210502\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1,25]]},"references-count":31,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2022]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.18.20210502","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,1,25]]},"article-number":"18.20210502"}}