{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,25]],"date-time":"2026-02-25T18:12:16Z","timestamp":1772043136774,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electronics, Information and Communications Engineers (IEICE)","issue":"17","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Electron. Express"],"published-print":{"date-parts":[[2022,9,10]]},"DOI":"10.1587\/elex.19.20220113","type":"journal-article","created":{"date-parts":[[2022,5,15]],"date-time":"2022-05-15T22:09:56Z","timestamp":1652652596000},"page":"20220113-20220113","source":"Crossref","is-referenced-by-count":4,"title":["Cable fault and assessment using multiple frequency autoencoder regression-based reflectometry"],"prefix":"10.1587","volume":"19","author":[{"given":"Si-Shik","family":"Jeon","sequence":"first","affiliation":[{"name":"Distribution Department, Korea Electric Power Corporation"}]},{"given":"Jong Man","family":"Joung","sequence":"additional","affiliation":[{"name":"Smart Distribution Laboratory, Korea Electric Power Corporation Research Institute"}]},{"given":"Chun-Kwon","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Control and Instrumentation Engineering, Pukyong National Univesrity"}]},{"given":"Young-Dal","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Hanbat National University"}]}],"member":"532","reference":[{"key":"1","doi-asserted-by":"crossref","unstructured":"[1] D.-H. Oh, <i>et al<\/i>.: \u201cA novel diagnosis method for void defects in HVDC mass-impregnated PPLP cable based on partial discharge measurement,\u201d MDPI Energies <b>14<\/b> (2021) 1 (DOI: 10.3390\/en14082052).","DOI":"10.3390\/en14082052"},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] M. Shafiq, <i>et al.<\/i>: \u201cPerformance comparison of PD data acquisition techniques for condition monitoring of medium voltage cables,\u201d MDPI Energies <b>13<\/b> (2020) 1 (DOI: 10.3390\/en13164272).","DOI":"10.3390\/en13164272"},{"key":"3","doi-asserted-by":"crossref","unstructured":"[3] E. Gulski, <i>et al.<\/i>: \u201cOffshore wind farms on-site submarine cable testing and diagnosis with damped AC,\u201d MDPI Energies <b>12<\/b> (2019) 1 (DOI: 10.3390\/en12193703).","DOI":"10.3390\/en12193703"},{"key":"4","doi-asserted-by":"crossref","unstructured":"[4] D. Chen, <i>et al.<\/i>: \u201cStudy of analysis and experiment for ability to withstand DC bias in power transformers,\u201d IEEE Trans. Magn. <b>54<\/b> (2018) 1 (DOI: 10.1109\/TMAG.2018.2844208).","DOI":"10.1109\/TMAG.2018.2844208"},{"key":"5","doi-asserted-by":"crossref","unstructured":"[5] Y. Li, <i>et al.<\/i>: \u201cDC withstand test with partial discharge measurement of convertor transformers: problems and suggestions for improvement,\u201d IEEE Trans. Dielectr. Electr. Insul. <b>24<\/b> (2017) 1105 (DOI: 10.1109\/TDEI.2017.006104).","DOI":"10.1109\/TDEI.2017.006104"},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] B.H. Finke: \u201cRecommendations in HV DC testing of MV cable insulation,\u201d IEEE Ind. Appl. Mag. <b>3<\/b> (1997) 85 (DOI: 10.1109\/2943.612242).","DOI":"10.1109\/2943.612242"},{"key":"7","doi-asserted-by":"crossref","unstructured":"[7] J.C. Hernandez-Mejia, <i>et al.<\/i>: \u201cCorrelation between tan <i>\u03b4<\/i> diagnostic measurements and breakdown performance at VLF for MV Xlpe cables,\u201d IEEE Trans. Dielectr. Electr. Insul. <b>16<\/b> (2009) 162 (DOI: 10.1109\/TDEI.2009.4784564).","DOI":"10.1109\/TDEI.2009.4784564"},{"key":"8","doi-asserted-by":"crossref","unstructured":"[8] J. Perkel, <i>et al.<\/i>: \u201cInterpretation of dielectric loss data on service aged polyethylene based power cable systems using VLF test methods,\u201d IEEE Trans. Dielectr. Electr. Insul. <b>20<\/b> (2013) 1699 (DOI: 10.1109\/TDEI.2013.6633700).","DOI":"10.1109\/TDEI.2013.6633700"},{"key":"9","doi-asserted-by":"crossref","unstructured":"[9] J.C. Hernandez-Mejia, <i>et al.<\/i>: \u201cCharacterization of ageing for MV power cables using low frequency tan <i>\u03b4<\/i> diagnostic measurements,\u201d IEEE Trans. Dielectr. Electr. Insul. <b>16<\/b> (2009) 862 (DOI: 10.1109\/TDEI.2009.5128527).","DOI":"10.1109\/TDEI.2009.5128527"},{"key":"10","doi-asserted-by":"crossref","unstructured":"[10] F.-C. Gu, <i>et al<\/i>.: \u201cApplication of chaos synchronization technique and pattern clustering for diagnosis analysis of partial discharge in power cables,\u201d IEEE Access <b>7<\/b> (2019) 76185 (DOI: 10.1109\/ACCESS.2019.2921813).","DOI":"10.1109\/ACCESS.2019.2921813"},{"key":"11","doi-asserted-by":"crossref","unstructured":"[11] M. Shafiq, <i>et al.<\/i>: \u201cIdentification and location of PD defects in medium voltage underground power cables using high frequency current transformer,\u201d IEEE Access <b>7<\/b> (2019) 103608 (DOI: 10.1109\/ACCESS.2019.2930704).","DOI":"10.1109\/ACCESS.2019.2930704"},{"key":"12","doi-asserted-by":"crossref","unstructured":"[12] F. Zhou and P.F. Wang: \u201cStudy on cable fault location based on fast identification of starting point of reflection wave,\u201d J. Instr. <b>15<\/b> (2020) 02012 (DOI: 10.1088\/1748-0221\/15\/02\/P02012).","DOI":"10.1088\/1748-0221\/15\/02\/P02012"},{"key":"13","doi-asserted-by":"crossref","unstructured":"[13] Y. Huo, <i>et al.<\/i>: \u201cCable diagnostics with power line modems for smart grid monitoring,\u201d IEEE Access <b>7<\/b> (2019) 60206 (DOI: 10.1109\/ACCESS.2019.2914580).","DOI":"10.1109\/ACCESS.2019.2914580"},{"key":"14","doi-asserted-by":"crossref","unstructured":"[14] J. Wang, <i>et al.<\/i>: \u201cHealth monitoring of power cable via joint time-frequency domain reflectometry,\u201d IEEE Trans. Instrum. Meas. <b>60<\/b> (2010) 1047 (DOI: 10.1109\/TIM.2010.2058730).","DOI":"10.1109\/TIM.2010.2058730"},{"key":"15","doi-asserted-by":"crossref","unstructured":"[15] C. Furse: <i>Reflectometry for Structural Health Monitoring in New Developments in Sensing Technology for Structural Health Monitoring<\/i> (Springer-Verlag, New York, 2011).","DOI":"10.1007\/978-3-642-21099-0_8"},{"key":"16","doi-asserted-by":"crossref","unstructured":"[16] C. Buccella, <i>et al<\/i>.: \u201cDetection and localization of defects in shielded cables by time-domain measurements with UWB pulse injection and clean algorithm postprocessing,\u201d IEEE Trans. Electromagn. Compat. <b>46<\/b> (2004) 597 (DOI: 10.1109\/TEMC.2004.837842).","DOI":"10.1109\/TEMC.2004.837842"},{"key":"17","unstructured":"[17] K.R. Jones, <i>et al.<\/i>: U.S. Patent 20020169585 (2002)."},{"key":"18","doi-asserted-by":"crossref","unstructured":"[18] P. Smith, <i>et al<\/i>.: \u201cAnalysis of spread spectrum time domain reflectometry for wire fault location,\u201d IEEE Sensors J. <b>5<\/b> (2005) 1469 (DOI: 10.1109\/JSEN.2005.858964).","DOI":"10.1109\/JSEN.2005.858964"},{"key":"19","doi-asserted-by":"crossref","unstructured":"[19] C. Furse, <i>et al.<\/i>: \u201cFrequency domain reflectometry for on board testing of aging aircraft wiring,\u201d IEEE Trans. Electromagn. Compat. <b>45<\/b> (2003) 306 (DOI: 10.1109\/TEMC.2003.811305).","DOI":"10.1109\/TEMC.2003.811305"},{"key":"20","unstructured":"[20] P.J. Medelius and H.J. Simpson: U.S. Patent 5977773 (1999)."},{"key":"21","doi-asserted-by":"crossref","unstructured":"[21] C.K. Lee, <i>et al.<\/i>: \u201cConcentric neutrals corrosion localization and its impedance analysis in the underground power cable system based on the reflectometry,\u201d Proc. IEEE Int. Instr. Meas. Tech. Conf. (2012) 1148 (DOI: 10.1109\/I2MTC.2012.6229399).","DOI":"10.1109\/I2MTC.2012.6229399"},{"key":"22","doi-asserted-by":"crossref","unstructured":"[22] Y.-J. Shin, <i>et al.<\/i>: \u201cApplication of time-frequency domain reflectometry for detection and localization of a fault on a coaxial cable,\u201d IEEE Trans. Instrum. Meas. <b>54<\/b> (2005) 2493 (DOI: 10.1109\/TIM.2005.858115).","DOI":"10.1109\/TIM.2005.858115"},{"key":"23","doi-asserted-by":"crossref","unstructured":"[23] C.K. Lee, <i>et al.<\/i>: \u201cHigh resolution LFMCW radar system using model-based beat frequency estimation in cable fault localization,\u201d IEICE Electron. Express <b>11<\/b> (2014) 20130768 (DOI: 10.1587\/elex.10.20130768).","DOI":"10.1587\/elex.10.20130768"},{"key":"24","doi-asserted-by":"crossref","unstructured":"[24] S.H. Lee, <i>et al.<\/i>: \u201cImpedance change localization for live underground cable using time-frequency domain reflectometry,\u201d IEICE Electron. Express <b>9<\/b> (2012) 359 (DOI: 10.1587\/elex.9.359).","DOI":"10.1587\/elex.9.359"},{"key":"25","doi-asserted-by":"crossref","unstructured":"[25] K.S. Kwak, <i>et al.<\/i>: \u201cReduction of the blind spot in the time-frequency domain reflectometry,\u201d IEICE Electron. Express <b>5<\/b> (2008) 265 (DOI: 10.1587\/elex.5.265).","DOI":"10.1587\/elex.5.265"},{"key":"26","doi-asserted-by":"crossref","unstructured":"[26] C.-K. Lee, <i>et al<\/i>.: \u201cCondition assessment of I&amp;C cables in nuclear power plants via stepped-frequency waveform reflectometry,\u201d IEEE Trans. Instrum. Meas. <b>68<\/b> (2018) 215 (DOI: 10.1109\/TIM.2018.2834179).","DOI":"10.1109\/TIM.2018.2834179"},{"key":"27","doi-asserted-by":"crossref","unstructured":"[27] N. Giaquinto, <i>et al<\/i>.: \u201cAlgorithms for locating and characterizing cable faults via stepped-frequency waveform reflectometry,\u201d IEEE Trans. Instrum. Meas. <b>69<\/b> (2020) 7271 (DOI: 10.1109\/TIM.2020.2974110).","DOI":"10.1109\/TIM.2020.2974110"},{"key":"28","unstructured":"[28] S.J. Orfanidis: <i>Electromagnetic Waves and Antennas<\/i> (Rutgers University, NJ, 2002)."},{"key":"29","doi-asserted-by":"crossref","unstructured":"[29] H.M. Lee, <i>et al.<\/i>: \u201cIndustrial applications of cable diagnostics and monitoring cables via time-frequency domain reflectometry,\u201d IEEE Sensors J. <b>21<\/b> (2021) 1082 (DOI: 10.1109\/JSEN.2020.2997696).","DOI":"10.1109\/JSEN.2020.2997696"},{"key":"30","doi-asserted-by":"crossref","unstructured":"[30] P. Han, <i>et al.<\/i>: \u201cFault detection with LSTM-based variational autoencoder for maritime components,\u201d IEEE Sensors J. <b>21<\/b> (2021) 21903 (DOI: 10.1109\/JSEN.2021.3105226).","DOI":"10.1109\/JSEN.2021.3105226"},{"key":"31","doi-asserted-by":"crossref","unstructured":"[31] J. Nocedal and S.J. Wright: <i>Numerical Optimization<\/i> (Springer, New York, 1999) (DOI: 10.1007\/b98874).","DOI":"10.1007\/b98874"}],"container-title":["IEICE Electronics Express"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/19\/17\/19_19.20220113\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,9,10]],"date-time":"2022-09-10T05:10:10Z","timestamp":1662786610000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/elex\/19\/17\/19_19.20220113\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,10]]},"references-count":31,"journal-issue":{"issue":"17","published-print":{"date-parts":[[2022]]}},"URL":"https:\/\/doi.org\/10.1587\/elex.19.20220113","relation":{},"ISSN":["1349-2543"],"issn-type":[{"value":"1349-2543","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9,10]]},"article-number":"19.20220113"}}