{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T00:12:43Z","timestamp":1704931963534},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEICE Trans. Commun."],"published-print":{"date-parts":[[2020,12,1]]},"DOI":"10.1587\/transcom.2019ebp3191","type":"journal-article","created":{"date-parts":[[2020,6,7]],"date-time":"2020-06-07T22:04:35Z","timestamp":1591567475000},"page":"1432-1437","source":"Crossref","is-referenced-by-count":1,"title":["Combined Effects of Test Voltages and Climatic Conditions on Air Discharge Currents from ESD Generator with Two Different Approach Speeds"],"prefix":"10.23919","volume":"E103.B","author":[{"given":"Takeshi","family":"ISHIDA","sequence":"first","affiliation":[{"name":"Noise Laboratory Co. LTD."}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Osamu","family":"FUJIWARA","sequence":"additional","affiliation":[{"name":"Noise Laboratory Co. LTD."},{"name":"Center for Industrial and Governmental relations, The University of Electro-Communications"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"1","unstructured":"[1] IEC 61000-4-2: Electromagnetic compatibility (EMC)-Part 4-2: Testing and measurement techniques-Electrostatic discharge immunity test,\u201d Edition 2.0, Dec. 2008."},{"key":"2","doi-asserted-by":"crossref","unstructured":"[2] D. Pommerenke, \u201cESD: Transient fields, arc simulation and rise time limit,\u201d J. Electrostat., vol.36, no.1, pp.31-54, 1995. 10.1016\/0304-3886(95)00033-7","DOI":"10.1016\/0304-3886(95)00033-7"},{"key":"3","unstructured":"[3] S. Frei, M. Senghaas, R. Jobava, and W. Kalkner, \u201cThe influence of speed of approach and humidity on the intensity of ESD,\u201d Proc. 13th international Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 1999."},{"key":"4","doi-asserted-by":"publisher","unstructured":"[4] I. Mori and O. Fujiwara, \u201cSevrity evaluation of the IEC immunity test against ESD based on wideband measurement of discharge current waveforms,\u201d IEEJ Trans. Fundamentals and Materials, vol.130, no.5 pp.457-461, May 2010 (in Japanese). 10.1541\/ieejfms.130.457","DOI":"10.1541\/ieejfms.130.457"},{"key":"5","doi-asserted-by":"publisher","unstructured":"[5] Q. Yuan, S. Liu, X. Zhang, Z. Wu, and M. Wei, \u201cThe effect of approach speed and charge voltage on an air discharge,\u201d IEEE Trans. Electromagn. Compat., vol.52, no.4, pp.985-993, Nov. 2010. 10.1109\/temc.2010.2060489","DOI":"10.1109\/TEMC.2010.2060489"},{"key":"6","doi-asserted-by":"crossref","unstructured":"[6] T. Ishida, H. Okajima, K. Endo, M. Kinoshita, O. Fujiwara, and S. Nitta, \u201cCombined effects of relative humidity and temperature on air discharges of electrostatic discharge generator,\u201d Proc. 2017 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, Washington, DC, Abstract Reviewed, pp.135-139, Aug. 2017. 10.1109\/isemc.2017.8078009","DOI":"10.1109\/ISEMC.2017.8078009"},{"key":"7","unstructured":"[7] http:\/\/biomet.ucdavis.edu\/conversions\/HumCon.pdf (accessed Aug. 1, 2018)."},{"key":"8","doi-asserted-by":"publisher","unstructured":"[8] T. Ishida, F. Xiao, Y. Kami, O. Fujiwara, and S. Nitta, \u201cAn alternative air discharge test method using ESD generator in contact discharge mode,\u201d IEEJ Trans. Fundamentals and Materials, vol.138, no.11, pp.555-561, Nov. 2018. 10.1541\/ieejfms.138.555","DOI":"10.1541\/ieejfms.138.555"}],"container-title":["IEICE Transactions on Communications"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transcom\/E103.B\/12\/E103.B_2019EBP3191\/_pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,10]],"date-time":"2024-01-10T14:58:22Z","timestamp":1704898702000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.jstage.jst.go.jp\/article\/transcom\/E103.B\/12\/E103.B_2019EBP3191\/_article"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12,1]]},"references-count":8,"journal-issue":{"issue":"12","published-print":{"date-parts":[[2020]]}},"URL":"https:\/\/doi.org\/10.1587\/transcom.2019ebp3191","relation":{},"ISSN":["0916-8516","1745-1345"],"issn-type":[{"value":"0916-8516","type":"print"},{"value":"1745-1345","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,12,1]]}}}